Kazuyuki TSUNOKUNI

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Secondary battery
- Patent number 12,170,374
- Issue date Dec 17, 2024
- Kabushiki Kaisha Nihon Micronics
- Daisuke Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Secondary battery
- Patent number 11,245,113
- Issue date Feb 8, 2022
- Kabushiki Kaisha Nihon Micronics
- Takashi Tonokawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Intermediate structure unit for secondary cell and method for manuf...
- Patent number 10,705,151
- Issue date Jul 7, 2020
- Kabushiki Kaisha Nihon Micronics
- Yuki Sato
- G01 - MEASURING TESTING
Information Patent Grant
Secondary battery mounted chip manufacturing method
- Patent number 10,686,210
- Issue date Jun 16, 2020
- Kabushiki Kaisha Nihon Micronics
- Kazuyuki Tsunokuni
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Secondary battery-mounted circuit chip and manufacturing method the...
- Patent number 10,090,507
- Issue date Oct 2, 2018
- Kabushiki Kaisha Nihon Micronics
- Kazuyuki Tsunokuni
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charging/discharging device
- Patent number 9,735,594
- Issue date Aug 15, 2017
- Kabushiki Kaisha Nihon Micronics
- Harutada Dewa
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Defective-ratio predicting method, defective-ratio predicting progr...
- Patent number 8,612,811
- Issue date Dec 17, 2013
- Renesas Electronics Corporation
- Chizu Matsumoto
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for test conditions
- Patent number 6,895,346
- Issue date May 17, 2005
- Hitachi, Ltd.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Grant
Photomask for test wafers
- Patent number 6,841,405
- Issue date Jan 11, 2005
- Hitachi, Ltd.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Grant
System for testing electronic devices
- Patent number 6,780,660
- Issue date Aug 24, 2004
- Hitachi, Ltd.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing electronic devices indicating short-circuit
- Patent number 6,771,077
- Issue date Aug 3, 2004
- Hitachi, Ltd.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing electronic devices
- Patent number 6,770,496
- Issue date Aug 3, 2004
- Hitachi, Ltd.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Grant
Ion current density measuring method and instrument, and semiconduc...
- Patent number 6,656,752
- Issue date Dec 2, 2003
- Hitachi, Ltd.
- Nobuyuki Mise
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for fabricating a semiconductor integrated circuit device h...
- Patent number 5,661,061
- Issue date Aug 26, 1997
- Hitachi, Ltd.
- Hirohisa Usuami
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SECONDARY BATTERY
- Publication number 20210351412
- Publication date Nov 11, 2021
- Kabushiki Kaisha Nihon Micronics
- Daisuke HASEGAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POWER STORAGE DEVICE
- Publication number 20210193924
- Publication date Jun 24, 2021
- Kabushiki Kaisha Nihon Micronics
- Takuo KUDOH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING SECONDARY BATTERY
- Publication number 20210091400
- Publication date Mar 25, 2021
- Kabushiki Kaisha Nihon Micronics
- Kazuyuki TSUNOKUNI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SECONDARY BATTERY
- Publication number 20200373575
- Publication date Nov 26, 2020
- Kabushiki Kaisha Nihon Micronics
- Kazuyuki TSUNOKUNI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRICITY STORAGE DEVICE AND METHOD FOR MANUFACTURING SOLID ELECT...
- Publication number 20200006009
- Publication date Jan 2, 2020
- Kabushiki Kaisha Nihon Micronics
- Takashi TONOKAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SECONDARY BATTERY
- Publication number 20200006764
- Publication date Jan 2, 2020
- Kabushiki Kaisha Nihon Micronics
- Tomokazu SAITO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRICITY STORAGE DEVICE
- Publication number 20200006763
- Publication date Jan 2, 2020
- Kabushiki Kaisha Nihon Micronics
- Takashi TONOKAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING SECONDARY BATTERY
- Publication number 20190273278
- Publication date Sep 5, 2019
- Kabushiki Kaisha Nihon Micronics
- Kazuyuki TSUNOKUNI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SECONDARY BATTERY
- Publication number 20190190024
- Publication date Jun 20, 2019
- Kabushiki Kaisha Nihon Micronics
- Takashi TONOKAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SECONDARY BATTERY MOUNTED CHIP MANUFACTURING METHOD
- Publication number 20180226674
- Publication date Aug 9, 2018
- Kabushiki Kaisha Nihon Micronics
- Kazuyuki TSUNOKUNI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTERMEDIATE STRUCTURE UNIT FOR SECONDARY CELL AND METHOD FOR MANUF...
- Publication number 20180210033
- Publication date Jul 26, 2018
- Kabushiki Kaisha Nihon Micronics
- Yuki SATO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING DEVICE AND TESTING METHOD FOR SHEET-SHAPED CELL
- Publication number 20170131361
- Publication date May 11, 2017
- Kabushiki Kaisha Nihon Micronics
- Tomokazu SAITO
- G01 - MEASURING TESTING
Information Patent Application
SECONDARY BATTERY-MOUNTED CIRCUIT CHIP AND MANUFACTURING METHOD THE...
- Publication number 20160181588
- Publication date Jun 23, 2016
- Kabushiki Kaisha Nihon Micronics
- Kazuyuki TSUNOKUNI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGING/DISCHARGING DEVICE
- Publication number 20150188337
- Publication date Jul 2, 2015
- Harutada Dewa
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
DEFECTIVE-RATIO PREDICTING METHOD, DEFECTIVE-RATIO PREDICTING PROGR...
- Publication number 20110172806
- Publication date Jul 14, 2011
- RENESAS ELECTRONICS CORPORATION
- Chizu Matsumoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Ion current density measuring method and instrument, and semiconduc...
- Publication number 20040092044
- Publication date May 13, 2004
- Nobuyuki Mise
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Method of testing electronic devices
- Publication number 20030197523
- Publication date Oct 23, 2003
- HITACHI, LTD.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Application
Method for test conditions
- Publication number 20030199110
- Publication date Oct 23, 2003
- HITACHI, LTD.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Application
Method of manufacturing electronic devices
- Publication number 20030199107
- Publication date Oct 23, 2003
- Hitachi, Ltd
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Application
System for testing electronic devices
- Publication number 20030199111
- Publication date Oct 23, 2003
- HITACHI, LTD.
- Yuichi Hamamura
- G01 - MEASURING TESTING
Information Patent Application
Photomask for test wafers
- Publication number 20030197522
- Publication date Oct 23, 2003
- HITACHI, LTD.
- Yuichi Hamamura
- G01 - MEASURING TESTING

Kazuyuki TSUNOKUNI

Person

Patents Grantslast 30 patents

Secondary battery

Secondary battery

Intermediate structure unit for secondary cell and method for manuf...

Secondary battery mounted chip manufacturing method

Secondary battery-mounted circuit chip and manufacturing method the...

Charging/discharging device

Defective-ratio predicting method, defective-ratio predicting progr...

Method for test conditions

Photomask for test wafers

System for testing electronic devices

Method of testing electronic devices indicating short-circuit

Method of testing electronic devices

Ion current density measuring method and instrument, and semiconduc...

Process for fabricating a semiconductor integrated circuit device h...

Patents Applicationslast 30 patents

SECONDARY BATTERY

POWER STORAGE DEVICE

METHOD FOR MANUFACTURING SECONDARY BATTERY

SECONDARY BATTERY

ELECTRICITY STORAGE DEVICE AND METHOD FOR MANUFACTURING SOLID ELECT...

SECONDARY BATTERY

ELECTRICITY STORAGE DEVICE

METHOD FOR MANUFACTURING SECONDARY BATTERY

SECONDARY BATTERY

SECONDARY BATTERY MOUNTED CHIP MANUFACTURING METHOD

INTERMEDIATE STRUCTURE UNIT FOR SECONDARY CELL AND METHOD FOR MANUF...

TESTING DEVICE AND TESTING METHOD FOR SHEET-SHAPED CELL

SECONDARY BATTERY-MOUNTED CIRCUIT CHIP AND MANUFACTURING METHOD THE...

CHARGING/DISCHARGING DEVICE

DEFECTIVE-RATIO PREDICTING METHOD, DEFECTIVE-RATIO PREDICTING PROGR...

Ion current density measuring method and instrument, and semiconduc...

Method of testing electronic devices

Method for test conditions

Method of manufacturing electronic devices

System for testing electronic devices

Photomask for test wafers