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Kee Sup Kim
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El Dorado Hills, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Logic yield learning vehicle with phased design windows
Patent number
11,403,452
Issue date
Aug 2, 2022
Synopsys, Inc.
Kee Sup Kim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Hierarchical test response compaction for a plurality of logic blocks
Patent number
7,818,642
Issue date
Oct 19, 2010
Intel Corporation
Kee Sup Kim
G01 - MEASURING TESTING
Information
Patent Grant
Compacting circuit responses
Patent number
7,814,383
Issue date
Oct 12, 2010
Subhasish Mitra
G01 - MEASURING TESTING
Information
Patent Grant
Compacting circuit responses
Patent number
7,574,640
Issue date
Aug 11, 2009
Intel Corporation
Subhasish Mitra
G01 - MEASURING TESTING
Information
Patent Grant
System and shadow bistable circuits coupled to output joining circuit
Patent number
7,523,371
Issue date
Apr 21, 2009
Intel Corporation
Subhasish Mitra
G01 - MEASURING TESTING
Information
Patent Grant
System and shadow circuits with output joining circuit
Patent number
7,278,074
Issue date
Oct 2, 2007
Intel Corporation
Subhasish Mitra
G01 - MEASURING TESTING
Information
Patent Grant
Stimulus generation
Patent number
7,240,260
Issue date
Jul 3, 2007
Intel Corporation
Subhasish Mitra
G01 - MEASURING TESTING
Information
Patent Grant
Error detecting circuit
Patent number
7,188,284
Issue date
Mar 6, 2007
Intel Corporation
Subhasish Mitra
G11 - INFORMATION STORAGE
Information
Patent Grant
Compacting circuit responses
Patent number
7,185,253
Issue date
Feb 27, 2007
Intel Corporation
Subhasish Mitra
G01 - MEASURING TESTING
Information
Patent Grant
At speed testing asynchronous signals
Patent number
6,918,074
Issue date
Jul 12, 2005
Intel Corporation
Kee Sup Kim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Architectural coverage measure
Patent number
6,076,173
Issue date
Jun 13, 2000
Intel Corporation
Kee Sup Kim
G01 - MEASURING TESTING
Information
Patent Grant
Scan-based built-in self test (BIST) with automatic reseeding of pa...
Patent number
5,574,733
Issue date
Nov 12, 1996
Intel Corporation
Kee S. Kim
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for multi-frequency, multi-phase scan chain
Patent number
5,504,756
Issue date
Apr 2, 1996
Intel Corporation
Kee S. Kim
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
LOGIC YIELD LEARNING VEHICLE WITH PHASED DESIGN WINDOWS
Publication number
20170109470
Publication date
Apr 20, 2017
Synopsys, Inc.
Kee Sup Kim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Hierarchical test response compaction for a plurality of logic blocks
Publication number
20090083599
Publication date
Mar 26, 2009
Kee Sup Kim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
System and shadow circuits with output joining circuit
Publication number
20060168489
Publication date
Jul 27, 2006
Intel Corporation
Subhasish Mitra
G01 - MEASURING TESTING
Information
Patent Application
Compacting circuit responses
Publication number
20060036985
Publication date
Feb 16, 2006
Subhasish Mitra
G01 - MEASURING TESTING
Information
Patent Application
System and shadow bistable circuits coupled to output joining circuit
Publication number
20060015786
Publication date
Jan 19, 2006
Intel Corporation
Subhasish Mitra
G01 - MEASURING TESTING
Information
Patent Application
Error detecting circuit
Publication number
20060005091
Publication date
Jan 5, 2006
Subhasish Mitra
G01 - MEASURING TESTING
Information
Patent Application
Compacting circuit responses
Publication number
20050055613
Publication date
Mar 10, 2005
Subhasish Mitra
G01 - MEASURING TESTING
Information
Patent Application
Stimulus generation
Publication number
20040117703
Publication date
Jun 17, 2004
Subhasish Mitra
G01 - MEASURING TESTING
Information
Patent Application
At speed testing of asynchronous signals
Publication number
20040003332
Publication date
Jan 1, 2004
Kee Sup Kim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Compacting circuit responses
Publication number
20030188269
Publication date
Oct 2, 2003
Subhasish Mitra
G01 - MEASURING TESTING