Number | Name | Date | Kind |
---|---|---|---|
4389723 | Nigorikawa et al. | Jun 1983 | |
4959832 | Bardell, Jr. | Sep 1990 | |
5090035 | Murase | Feb 1992 | |
5101409 | Hack | Mar 1992 | |
5301199 | Ikenaga et al. | Apr 1994 | |
5369648 | Nelson | Nov 1994 | |
5383143 | Crouch et al. | Jan 1995 |
Entry |
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Pomeranz, et al.; A Learning-Based Method to Match a Test Pattern Generator to a Circuit-Under-Test; International Test Conference Proceedings, IEEE Computer Society, 1993. |
Nadeau-Dostie, et al.; ScanBist A Multi-frequency Scan-Based BIST Method; International Test Conference Proceedings; IEEE Computer Society, 1992. |