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Kei Masunishi

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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    SENSOR, SENSOR SYSTEM, AND ELECTRONIC DEVICE
    • Publication number 20250076047
    • Publication date Mar 6, 2025
    • Kabushiki Kaisha Toshiba
    • Daiki ONO
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR, SENSOR SYSTEM, AND ELECTRONIC DEVICE
    • Publication number 20250076049
    • Publication date Mar 6, 2025
    • Kabushiki Kaisha Toshiba
    • Fumito MIYAZAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR, SENSOR SYSTEM, AND ELECTRONIC DEVICE
    • Publication number 20250076054
    • Publication date Mar 6, 2025
    • Kabushiki Kaisha Toshiba
    • Fumito MIYAZAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR, SENSOR SYSTEM, AND ELECTRONIC DEVICE
    • Publication number 20250076089
    • Publication date Mar 6, 2025
    • Kabushiki Kaisha Toshiba
    • Yasushi TOMIZAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR, SENSOR SYSTEM, AND ELECTRONIC DEVICE
    • Publication number 20250076046
    • Publication date Mar 6, 2025
    • Kabushiki Kaisha Toshiba
    • Hideaki MURASE
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR, SENSOR SYSTEM, AND ELECTRONIC DEVICE
    • Publication number 20250076050
    • Publication date Mar 6, 2025
    • Kabushiki Kaisha Toshiba
    • Hideaki MURASE
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20240401949
    • Publication date Dec 5, 2024
    • Kabushiki Kaisha Toshiba
    • Hideaki MURASE
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20240310406
    • Publication date Sep 19, 2024
    • Kabushiki Kaisha Toshiba
    • Kei MASUNISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20240310404
    • Publication date Sep 19, 2024
    • Kabushiki Kaisha Toshiba
    • Kei MASUNISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20240219178
    • Publication date Jul 4, 2024
    • Kabushiki Kaisha Toshiba
    • Hiroki HIRAGA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20240085181
    • Publication date Mar 14, 2024
    • Kabushiki Kaisha Toshiba
    • Kei MASUNISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20240085451
    • Publication date Mar 14, 2024
    • Kabushiki Kaisha Toshiba
    • Kei MASUNISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20240060777
    • Publication date Feb 22, 2024
    • Kabushiki Kaisha Toshiba
    • Fumito MIYAZAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20240019248
    • Publication date Jan 18, 2024
    • Kabushiki Kaisha Toshiba
    • Hiroki HIRAGA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20230288202
    • Publication date Sep 14, 2023
    • Kabushiki Kaisha Toshiba
    • Kei MASUNISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND MOVABLE BODY
    • Publication number 20230288445
    • Publication date Sep 14, 2023
    • Kabushiki Kaisha Toshiba
    • Kei MASUNISHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    RESONANCE FREQUENCY DETECTOR AND SENSING DEVICE
    • Publication number 20230253972
    • Publication date Aug 10, 2023
    • Kabushiki Kaisha Toshiba
    • Tetsuro ITAKURA
    • H03 - BASIC ELECTRONIC CIRCUITRY
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20230152099
    • Publication date May 18, 2023
    • Kabushiki Kaisha Toshiba
    • Ryunosuke GANDO
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20230062441
    • Publication date Mar 2, 2023
    • Kabushiki Kaisha Toshiba
    • Kei MASUNISHI
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20220326013
    • Publication date Oct 13, 2022
    • Kabushiki Kaisha Toshiba
    • Fumito MIYAZAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20220276052
    • Publication date Sep 1, 2022
    • Kabushiki Kaisha Toshiba
    • Hiroki HIRAGA
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20220268583
    • Publication date Aug 25, 2022
    • Kabushiki Kaisha Toshiba
    • Ryunosuke GANDO
    • G01 - MEASURING TESTING
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20220259035
    • Publication date Aug 18, 2022
    • Kabushiki Kaisha Toshiba
    • Kei MASUNISHI
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20220137085
    • Publication date May 5, 2022
    • Kabushiki Kaisha Toshiba
    • Kei Masunishi
    • G01 - MEASURING TESTING
  • Information Patent Application

    MEMS ELEMENT AND ELECTRICAL CIRCUIT
    • Publication number 20220084767
    • Publication date Mar 17, 2022
    • Kabushiki Kaisha Toshiba
    • Hiroaki YAMAZAKI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20210396780
    • Publication date Dec 23, 2021
    • Kabushiki Kaisha Toshiba
    • Kei MASUNISHI
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Application

    SENSOR AND ELECTRONIC DEVICE
    • Publication number 20210381831
    • Publication date Dec 9, 2021
    • Kabushiki Kaisha Toshiba
    • Ryunosuke GANDO
    • G01 - MEASURING TESTING
  • Information Patent Application

    MEMS ELEMENT AND ELECTRICAL CIRCUIT
    • Publication number 20210175035
    • Publication date Jun 10, 2021
    • Kabushiki Kaisha Toshiba
    • Hiroaki YAMAZAKI
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    MEMS ELEMENT
    • Publication number 20210047171
    • Publication date Feb 18, 2021
    • Kabushiki Kaisha Toshiba
    • Fumitaka ISHIBASHI
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Application

    PRESSURE SENSOR
    • Publication number 20210041311
    • Publication date Feb 11, 2021
    • Kabushiki Kaisha Toshiba
    • Kei Masunishi
    • G01 - MEASURING TESTING