Kei Matsumoto

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method of evaluating metal contamination in semiconductor wafer and...
- Patent number 9,842,779
- Issue date Dec 12, 2017
- Sumco Corporation
- Kei Matsumoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of evaluating metal contamination in semiconductor sample an...
- Patent number 9,372,223
- Issue date Jun 21, 2016
- Sumco Corporation
- Kei Matsumoto
- G01 - MEASURING TESTING
Information Patent Grant
Method of removing heavy metal in semiconductor substrate
- Patent number 8,173,523
- Issue date May 8, 2012
- Sumco Corporation
- Noritomo Mitsugi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ELECTRIC POWER CONVERSION APPARATUS
- Publication number 20230389240
- Publication date Nov 30, 2023
- TOSHIBA MITSUBISHI-ELECTRIC INDUSTRIAL SYSTEMS CORPORATION
- Kei MATSUMOTO
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
METHOD OF EVALUATING METAL CONTAMINATION IN SEMICONDUCTOR WAFER AND...
- Publication number 20150318222
- Publication date Nov 5, 2015
- SUMCO CORPORATION
- Kei MATSUMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF EVALUATING METAL CONTAMINATION IN SEMICONDUCTOR SAMPLE AN...
- Publication number 20140097866
- Publication date Apr 10, 2014
- SUMCO CORPORATION
- Kei Matsumoto
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF REMOVING HEAVY METAL IN SEMICONDUCTOR SUBSTRATE
- Publication number 20110086494
- Publication date Apr 14, 2011
- SUMCO CORPORATION
- Noritomo Mitsugi
- H01 - BASIC ELECTRIC ELEMENTS