Keijiro SUZUKI

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Kyoto-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Analysis system, analysis apparatus, server, and information proces...
- Patent number 11,536,673
- Issue date Dec 27, 2022
- Shimadzu Corporation
- Eisaku Terashita
- G01 - MEASURING TESTING
Information Patent Grant
X-ray detector monitoring device
- Patent number 10,837,925
- Issue date Nov 17, 2020
- Shimadzu Corporation
- Keijiro Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis device
- Patent number 10,180,404
- Issue date Jan 15, 2019
- Shimadzu Corporation
- Keijiro Suzuki
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING

Patents Applicationslast 30 patents

Information Patent Application
ANALYSIS SYSTEM, ANALYSIS DEVICE, AND CONTROL METHOD
- Publication number 20250067690
- Publication date Feb 27, 2025
- Shimadzu Corporation
- Keijiro SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYZER
- Publication number 20240361261
- Publication date Oct 31, 2024
- Shimadzu Corporation
- Keijiro SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYZER
- Publication number 20230236142
- Publication date Jul 27, 2023
- Shimadzu Corporation
- Yuji MORIHISA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE CATEGORY IDENTIFICATION DEVICE, ANALYSIS SYSTEM, AND ANALYSI...
- Publication number 20200201917
- Publication date Jun 25, 2020
- Shimadzu Corporation
- Keijiro SUZUKI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Analysis System, Analysis Apparatus, Server, and Information Proces...
- Publication number 20200174983
- Publication date Jun 4, 2020
- Shimadzu Corporation
- Eisaku TERASHITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY ANALYSIS DEVICE
- Publication number 20160320322
- Publication date Nov 3, 2016
- SHIMADZU CORPORATION
- Keijiro SUZUKI
- G01 - MEASURING TESTING