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Keiko Kaneko

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  • Kikuchi, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Test socket having improved contact terminals, and method of formin...
    • Patent number 6,344,753
    • Issue date Feb 5, 2002
    • Mitsubishi Denki Kabushiki Kaisha
    • Shigeru Takada
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Semiconductor device socket
    • Patent number 5,936,418
    • Issue date Aug 10, 1999
    • Mitsubishi Denki Kabushiki Kaisha
    • Yasushi Ideta
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Grant

    Semiconductor device socket
    • Patent number 5,917,240
    • Issue date Jun 29, 1999
    • Mitsubishi Denki Kabushiki Kaisha
    • Yasushi Ideta
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Grant

    Semiconductor device socket
    • Patent number 5,693,982
    • Issue date Dec 2, 1997
    • Mitsubishi Denki Kabushiki Kaisha
    • Yasushi Ideta
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
  • Information Patent Grant

    Semiconductor device socket
    • Patent number 5,461,258
    • Issue date Oct 24, 1995
    • Mitsubishi Denki Kabushiki Kaisha
    • Yasushi Ideta
    • H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR