Keith L. Kraver

Person

Gilbert, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Sensor interface circuit, sensor system, and method of signal measu...
- Patent number 12,085,423
- Issue date Sep 10, 2024
- NXP USA, INC.
- Keith L. Kraver
- G01 - MEASURING TESTING
Information Patent Grant
System and method for continuous monitoring of a gyroscope
- Patent number 11,047,684
- Issue date Jun 29, 2021
- NXP USA, INC.
- Keith L. Kraver
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Capacitance-to-voltage interface circuit
- Patent number 10,715,096
- Issue date Jul 14, 2020
- NXP USA, INC.
- Keith Kraver
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Methods and systems for electrically calibrating transducers
- Patent number 10,578,641
- Issue date Mar 3, 2020
- NXP USA, INC.
- Margaret Leslie Kniffin
- G01 - MEASURING TESTING
Information Patent Grant
Pressure sensor device and method for testing the pressure sensor d...
- Patent number 10,436,659
- Issue date Oct 8, 2019
- NXP USA, INC.
- Chad Dawson
- G01 - MEASURING TESTING
Information Patent Grant
Sensor device and method for continuous fault monitoring of sensor...
- Patent number 9,983,032
- Issue date May 29, 2018
- NXP USA, INC.
- Keith L. Kraver
- G01 - MEASURING TESTING
Information Patent Grant
Vibration robust x-axis ring gyro transducer
- Patent number 9,759,563
- Issue date Sep 12, 2017
- NXP USA, INC.
- Heinz Loreck
- G01 - MEASURING TESTING
Information Patent Grant
System and method for monitoring an accelerometer
- Patent number 9,297,826
- Issue date Mar 29, 2016
- Freescale Semiconductor Inc.
- Deyou Fang
- G01 - MEASURING TESTING
Information Patent Grant
Electro-mechanical oscillator and common-mode detection circuit
- Patent number 9,157,945
- Issue date Oct 13, 2015
- Freescale Semiconductor Inc.
- Keith L. Kraver
- G01 - MEASURING TESTING
Information Patent Grant
System and method for improved MEMS oscillator startup
- Patent number 9,118,334
- Issue date Aug 25, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Mark E. Schlarmann
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
System and method for monitoring a gyroscope
- Patent number 9,109,901
- Issue date Aug 18, 2015
- Freescale Semiconductor Inc.
- Deyou Fang
- G01 - MEASURING TESTING
Information Patent Grant
System and method for reducing offset variation in multifunction se...
- Patent number 9,103,845
- Issue date Aug 11, 2015
- Freescale Semiconductor Inc.
- Mark E. Schlarmann
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
MEMS inertial sensor with frequency control and method
- Patent number 8,156,805
- Issue date Apr 17, 2012
- FREESCALE SEMICONDUCTOR, INC.
- David A. Hayner
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for closed loop offset cancellation
- Patent number 7,665,361
- Issue date Feb 23, 2010
- FREESCALE SEMICONDUCTOR, INC.
- Todd F. Miller
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SENSOR INTERFACE CIRCUIT, SENSOR SYSTEM, AND METHOD OF SIGNAL MEASU...
- Publication number 20210381854
- Publication date Dec 9, 2021
- NXP USA, Inc.
- Keith L. KRAVER
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR CONTINUOUS MONITORING OF A GYROSCOPE
- Publication number 20200278205
- Publication date Sep 3, 2020
- NXP USA, Inc.
- Keith L. Kraver
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
METHODS AND SYSTEMS FOR ELECTRICALLY CALIBRATING TRANSDUCERS
- Publication number 20180052185
- Publication date Feb 22, 2018
- Freescale Semiconductor Inc.
- MARGARET LESLIE KNIFFIN
- G01 - MEASURING TESTING
Information Patent Application
PRESSURE SENSOR DEVICE AND METHOD FOR TESTING THE PRESSURE SENSOR D...
- Publication number 20170322098
- Publication date Nov 9, 2017
- FREESCALE SEMICONDUCTOR, INC.
- Chad Dawson
- G01 - MEASURING TESTING
Information Patent Application
INERTIAL SENSOR WITH TRIM CAPACITANCE AND METHOD OF TRIMMING OFFSET
- Publication number 20150268268
- Publication date Sep 24, 2015
- FREESCALE SEMICONDUCTOR, INC.
- Lianjun Liu
- G01 - MEASURING TESTING
Information Patent Application
ELECTRO-MECHANICAL OSCILLATOR AND COMMON-MODE DETECTION CIRCUIT
- Publication number 20150061702
- Publication date Mar 5, 2015
- KEITH L. KRAVER
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR IMPROVED MEMS OSCILLATOR STARTUP
- Publication number 20140266474
- Publication date Sep 18, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Mark E. Schlarmann
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SYSTEM AND METHOD FOR MONITORING AN ACCELEROMETER
- Publication number 20140250971
- Publication date Sep 11, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Deyou FANG
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR REDUCING OFFSET VARIATION IN MULTIFUNCTION SE...
- Publication number 20140251009
- Publication date Sep 11, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Mark E. SCHLARMANN
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
SYSTEM AND METHOD FOR MONITORING A GYROSCOPE
- Publication number 20140250970
- Publication date Sep 11, 2014
- FREESCALE SEMICONDUCTOR, INC.
- Deyou FANG
- G01 - MEASURING TESTING
Information Patent Application
PRESSURE LEVEL ADJUSTMENT IN A CAVITY OF A SEMICONDUCTOR DIE
- Publication number 20140225206
- Publication date Aug 14, 2014
- Yizhen Lin
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Vibration Robust X-Axis Ring Gyro Transducer
- Publication number 20130192363
- Publication date Aug 1, 2013
- Heinz Loreck
- G01 - MEASURING TESTING
Information Patent Application
MEMS INERTIAL SENSOR WITH FREQUENCY CONTROL AND METHOD
- Publication number 20100263445
- Publication date Oct 21, 2010
- David A. Hayner
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR CLOSED LOOP OFFSET CANCELLATION
- Publication number 20080178671
- Publication date Jul 31, 2008
- Todd F. Miller
- G01 - MEASURING TESTING

Keith L. Kraver

Person

Patents Grantslast 30 patents

Sensor interface circuit, sensor system, and method of signal measu...

System and method for continuous monitoring of a gyroscope

Capacitance-to-voltage interface circuit

Methods and systems for electrically calibrating transducers

Pressure sensor device and method for testing the pressure sensor d...

Sensor device and method for continuous fault monitoring of sensor...

Vibration robust x-axis ring gyro transducer

System and method for monitoring an accelerometer

Electro-mechanical oscillator and common-mode detection circuit

System and method for improved MEMS oscillator startup

System and method for monitoring a gyroscope

System and method for reducing offset variation in multifunction se...

MEMS inertial sensor with frequency control and method

Method and apparatus for closed loop offset cancellation

Patents Applicationslast 30 patents

SENSOR INTERFACE CIRCUIT, SENSOR SYSTEM, AND METHOD OF SIGNAL MEASU...

SYSTEM AND METHOD FOR CONTINUOUS MONITORING OF A GYROSCOPE

METHODS AND SYSTEMS FOR ELECTRICALLY CALIBRATING TRANSDUCERS

PRESSURE SENSOR DEVICE AND METHOD FOR TESTING THE PRESSURE SENSOR D...

INERTIAL SENSOR WITH TRIM CAPACITANCE AND METHOD OF TRIMMING OFFSET

ELECTRO-MECHANICAL OSCILLATOR AND COMMON-MODE DETECTION CIRCUIT

SYSTEM AND METHOD FOR IMPROVED MEMS OSCILLATOR STARTUP

SYSTEM AND METHOD FOR MONITORING AN ACCELEROMETER

SYSTEM AND METHOD FOR REDUCING OFFSET VARIATION IN MULTIFUNCTION SE...

SYSTEM AND METHOD FOR MONITORING A GYROSCOPE

PRESSURE LEVEL ADJUSTMENT IN A CAVITY OF A SEMICONDUCTOR DIE

Vibration Robust X-Axis Ring Gyro Transducer

MEMS INERTIAL SENSOR WITH FREQUENCY CONTROL AND METHOD

METHOD AND APPARATUS FOR CLOSED LOOP OFFSET CANCELLATION