Ken-Hsien Hsieh

Person

Taipei, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Method for forming semiconductor device
- Patent number 12,189,284
- Issue date Jan 7, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Sheng-Min Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lithography process monitoring method
- Patent number 12,085,867
- Issue date Sep 10, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chih-Jie Lee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Two-dimensional (2D) metal structure
- Patent number 11,923,300
- Issue date Mar 5, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Shih-Wei Peng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spacer etching process for integrated circuit design
- Patent number 11,854,820
- Issue date Dec 26, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ru-Gun Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical proximity correction and photomasks
- Patent number 11,789,370
- Issue date Oct 17, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Dong-Yo Jheng
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lithography process monitoring method
- Patent number 11,782,352
- Issue date Oct 10, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chih-Jie Lee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of manufacturing semiconductor devices
- Patent number 11,764,068
- Issue date Sep 19, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ru-Gun Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing photo masks
- Patent number 11,592,751
- Issue date Feb 28, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ken-Hsien Hsieh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Tunable illuminator for lithography systems
- Patent number 11,543,753
- Issue date Jan 3, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Ken-Hsien Hsieh
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Lithography process monitoring method
- Patent number 11,467,509
- Issue date Oct 11, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chih-Jie Lee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of manufacturing semiconductor devices
- Patent number 11,342,193
- Issue date May 24, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Ru-Gun Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern formation method using a photo mask for manufacturing a sem...
- Patent number 11,294,286
- Issue date Apr 5, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Ru-Gun Liu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optical proximity correction and photomasks
- Patent number 11,243,472
- Issue date Feb 8, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Dong-Yo Jheng
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method of manufacturing photo masks
- Patent number 11,079,685
- Issue date Aug 3, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Ken-Hsien Hsieh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Lithography process monitoring method
- Patent number 10,962,892
- Issue date Mar 30, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chih-Jie Lee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Fin-like field effect transistor patterning methods for increasing...
- Patent number 10,957,551
- Issue date Mar 23, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Chin-Yuan Tseng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for integrated circuit design and fabrication
- Patent number 10,930,505
- Issue date Feb 23, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tsong-Hua Ou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multiple patterning method for semiconductor devices
- Patent number 10,817,635
- Issue date Oct 27, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ken-Hsien Hsieh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of manufacturing semiconductor devices
- Patent number 10,790,155
- Issue date Sep 29, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Ru-Gun Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hybrid double patterning method for semiconductor manufacture
- Patent number 10,770,304
- Issue date Sep 8, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Ken-Hsien Hsieh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Lithographic technique for feature cut by line-end shrink
- Patent number 10,763,113
- Issue date Sep 1, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yung-Sung Yen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for forming conductive lines
- Patent number 10,748,767
- Issue date Aug 18, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yung-Sung Yen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Optical proximity correction and photomasks
- Patent number 10,678,142
- Issue date Jun 9, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Dong-Yo Jheng
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Spacer etching process for integrated circuit design
- Patent number 10,665,467
- Issue date May 26, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ru-Gun Liu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hybrid double patterning method for semiconductor manufacture
- Patent number 10,483,120
- Issue date Nov 19, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Ken-Hsien Hsieh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fin-like field effect transistor patterning methods for increasing...
- Patent number 10,418,252
- Issue date Sep 17, 2019
- Taiwan Semiconductor Manufacturing Co, Ltd.
- Chin-Yuan Tseng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for integrated circuit design and fabrication
- Patent number 10,410,863
- Issue date Sep 10, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tsong-Hua Ou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-layer metal contacts
- Patent number 10,410,913
- Issue date Sep 10, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ming-Feng Shieh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lithographic technique for feature cut by line-end shrink
- Patent number 10,388,523
- Issue date Aug 20, 2019
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yung-Sung Yen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for patterning interconnects
- Patent number 10,276,377
- Issue date Apr 30, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yung-Sung Yen
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR FORMING SEMICONDUCTOR DEVICE
- Publication number 20240393677
- Publication date Nov 28, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sheng-Min WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD TO REDUCE LAYOUT DIMENSIONS USING NON-PERPENDICUL...
- Publication number 20240395708
- Publication date Nov 28, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yu-Tien SHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LITHOGRAPHY PROCESS MONITORING METHOD
- Publication number 20240385545
- Publication date Nov 21, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chih-Jie Lee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS FOR INTEGRATED CIRCUIT DESIGN AND FABRICATION
- Publication number 20240379358
- Publication date Nov 14, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tsong-Hua Ou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM TO INTRODUCE BRIGHT FIELD IMAGING AT STITCHING AR...
- Publication number 20240248387
- Publication date Jul 25, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Sheng-Min WANG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
TWO-DIMENSIONAL (2D) METAL STRUCTURE
- Publication number 20240063119
- Publication date Feb 22, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shih-Wei Peng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TOOL MISMATCH REDUCTION USING ABERRATION MAP OF THE TOOLS
- Publication number 20230408930
- Publication date Dec 21, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shih-Chuan HUANG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
OPTICAL PROXIMITY CORRECTION AND PHOTOMASKS
- Publication number 20230384691
- Publication date Nov 30, 2023
- Taiwan Semiconductor Manufacturing Co., LTD
- Dong-Yo Jheng
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICES
- Publication number 20230369062
- Publication date Nov 16, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ru-Gun LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LITHOGRAPHY PROCESS MONITORING METHOD
- Publication number 20230367234
- Publication date Nov 16, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chih-Jie LEE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
EUV PHOTO MASKS AND MANUFACTURING METHOD THEREOF
- Publication number 20230314927
- Publication date Oct 5, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sheng-Min WANG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
EUV PHOTO MASKS AND MANUFACTURING METHOD THEREOF
- Publication number 20230305381
- Publication date Sep 28, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wei-Shuo SU
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING THE SAME
- Publication number 20230260786
- Publication date Aug 17, 2023
- Taiwan Semiconductor Manufacturing company Ltd.
- JOHNNY CHIAHAO LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF MANUFACTURING PHOTO MASKS
- Publication number 20230205093
- Publication date Jun 29, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ken-Hsien HSIEH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TWO-DIMENSIONAL (2D) METAL STRUCTURE
- Publication number 20230008779
- Publication date Jan 12, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Shih-Wei Peng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD TO REDUCE LAYOUT DIMENSIONS USING NON-PERPENDICUL...
- Publication number 20220399272
- Publication date Dec 15, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yu-Tien SHEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LITHOGRAPHY PROCESS MONITORING METHOD
- Publication number 20220365452
- Publication date Nov 17, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chih-Jie LEE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
SYSTEM AND METHOD FOR SELECTING PHOTOLITHOGRAPHY PROCESSES
- Publication number 20220357669
- Publication date Nov 10, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Shih-Ming CHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICES
- Publication number 20220285168
- Publication date Sep 8, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ru-Gun LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FORMING SEMICONDUCTOR DEVICE
- Publication number 20220283494
- Publication date Sep 8, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sheng-Min WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Optical Proximity Correction and Photomasks
- Publication number 20220155692
- Publication date May 19, 2022
- Taiwan Semiconductor Manufacturing Co., LTD
- Dong-Yo Jheng
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF MANUFACTURING PHOTO MASKS
- Publication number 20210356872
- Publication date Nov 18, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ken-Hsien HSIEH
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LITHOGRAPHY PROCESS MONITORING METHOD
- Publication number 20210286274
- Publication date Sep 16, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chih-Jie LEE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Methods for Integrated Circuit Design and Fabrication
- Publication number 20210175081
- Publication date Jun 10, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Tsong-Hua Ou
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TUNABLE ILLUMINATOR FOR LITHOGRAPHY SYSTEMS
- Publication number 20210132504
- Publication date May 6, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ken-Hsien HSIEH
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICES
- Publication number 20210013048
- Publication date Jan 14, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ru-Gun LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Optical Proximity Correction and Photomasks
- Publication number 20200301289
- Publication date Sep 24, 2020
- Taiwan Semiconductor Manufacturing Co., LTD
- Dong-Yo Jheng
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Spacer Etching Process For Integrated Circuit Design
- Publication number 20200286738
- Publication date Sep 10, 2020
- Taiwan Semiconductor Manufacturing Company, Ltd.
- RU-GUN LIU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LITHOGRAPHY PROCESS MONITORING METHOD
- Publication number 20200103766
- Publication date Apr 2, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Chih-Jie LEE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Hybrid Double Patterning Method for Semiconductor Manufacture
- Publication number 20200083058
- Publication date Mar 12, 2020
- Taiwan Semiconductor Manufacturing Co., LTD
- Ken-Hsien Hsieh
- G06 - COMPUTING CALCULATING COUNTING

Ken-Hsien Hsieh

Person

Patents Grantslast 30 patents

Method for forming semiconductor device

Lithography process monitoring method

Two-dimensional (2D) metal structure

Spacer etching process for integrated circuit design

Optical proximity correction and photomasks

Lithography process monitoring method

Method of manufacturing semiconductor devices

Method of manufacturing photo masks

Tunable illuminator for lithography systems

Lithography process monitoring method

Method of manufacturing semiconductor devices

Pattern formation method using a photo mask for manufacturing a sem...

Optical proximity correction and photomasks

Method of manufacturing photo masks

Lithography process monitoring method

Fin-like field effect transistor patterning methods for increasing...

Methods for integrated circuit design and fabrication

Multiple patterning method for semiconductor devices

Method of manufacturing semiconductor devices

Hybrid double patterning method for semiconductor manufacture

Lithographic technique for feature cut by line-end shrink

Method for forming conductive lines

Optical proximity correction and photomasks

Spacer etching process for integrated circuit design

Hybrid double patterning method for semiconductor manufacture

Fin-like field effect transistor patterning methods for increasing...

Methods for integrated circuit design and fabrication

Multi-layer metal contacts

Lithographic technique for feature cut by line-end shrink

Method for patterning interconnects

Patents Applicationslast 30 patents

METHOD FOR FORMING SEMICONDUCTOR DEVICE

SYSTEM AND METHOD TO REDUCE LAYOUT DIMENSIONS USING NON-PERPENDICUL...

LITHOGRAPHY PROCESS MONITORING METHOD

METHODS FOR INTEGRATED CIRCUIT DESIGN AND FABRICATION

METHOD AND SYSTEM TO INTRODUCE BRIGHT FIELD IMAGING AT STITCHING AR...

TWO-DIMENSIONAL (2D) METAL STRUCTURE

TOOL MISMATCH REDUCTION USING ABERRATION MAP OF THE TOOLS

OPTICAL PROXIMITY CORRECTION AND PHOTOMASKS

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICES

LITHOGRAPHY PROCESS MONITORING METHOD

EUV PHOTO MASKS AND MANUFACTURING METHOD THEREOF

EUV PHOTO MASKS AND MANUFACTURING METHOD THEREOF

SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING THE SAME

METHOD OF MANUFACTURING PHOTO MASKS

TWO-DIMENSIONAL (2D) METAL STRUCTURE

SYSTEM AND METHOD TO REDUCE LAYOUT DIMENSIONS USING NON-PERPENDICUL...

LITHOGRAPHY PROCESS MONITORING METHOD

SYSTEM AND METHOD FOR SELECTING PHOTOLITHOGRAPHY PROCESSES

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICES

METHOD FOR FORMING SEMICONDUCTOR DEVICE

Optical Proximity Correction and Photomasks

METHOD OF MANUFACTURING PHOTO MASKS

LITHOGRAPHY PROCESS MONITORING METHOD

Methods for Integrated Circuit Design and Fabrication

TUNABLE ILLUMINATOR FOR LITHOGRAPHY SYSTEMS

METHOD OF MANUFACTURING SEMICONDUCTOR DEVICES

Optical Proximity Correction and Photomasks

Spacer Etching Process For Integrated Circuit Design

LITHOGRAPHY PROCESS MONITORING METHOD

Hybrid Double Patterning Method for Semiconductor Manufacture