Kenichi Anzou

Person

Kawasaki-Shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit including a memory macro
- Patent number 10,706,951
- Issue date Jul 7, 2020
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor integrated circuit and test method thereof
- Patent number 10,359,470
- Issue date Jul 23, 2019
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit
- Patent number 10,261,127
- Issue date Apr 16, 2019
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor integrated circuit and test method thereof
- Patent number 10,001,524
- Issue date Jun 19, 2018
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit
- Patent number 9,557,379
- Issue date Jan 31, 2017
- Kabushiki Kaisha Toshiba
- Chikako Tokunaga
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit with bist circuit
- Patent number 9,443,611
- Issue date Sep 13, 2016
- Kabushiki Kaisha Toshiba
- Chikako Tokunaga
- G11 - INFORMATION STORAGE
Information Patent Grant
BIST circuit
- Patent number 9,355,745
- Issue date May 31, 2016
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit capable of performing self-test
- Patent number 9,330,788
- Issue date May 3, 2016
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device
- Patent number 9,159,456
- Issue date Oct 13, 2015
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in self test circuit and designing apparatus
- Patent number 8,671,317
- Issue date Mar 11, 2014
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit
- Patent number 8,599,632
- Issue date Dec 3, 2013
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit and method for controlling semicon...
- Patent number 8,201,037
- Issue date Jun 12, 2012
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit
- Patent number 8,176,372
- Issue date May 8, 2012
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit
- Patent number 8,134,880
- Issue date Mar 13, 2012
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G11 - INFORMATION STORAGE
Information Patent Grant
On-chip failure analysis circuit and on-chip failure analysis method
- Patent number 8,037,376
- Issue date Oct 11, 2011
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit and test system thereof
- Patent number 8,032,803
- Issue date Oct 4, 2011
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G11 - INFORMATION STORAGE
Information Patent Grant
Built-in self testing circuit with fault diagnostic capability
- Patent number 7,962,821
- Issue date Jun 14, 2011
- Kabushiki Kaisha Toshiba
- Chikako Tokunaga
- G11 - INFORMATION STORAGE
Information Patent Grant
Nonvolatile semiconductor memory system
- Patent number 7,890,823
- Issue date Feb 15, 2011
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit device with built-in self test (BIST) circuit
- Patent number 7,783,942
- Issue date Aug 24, 2010
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit having built-n self test circuit o...
- Patent number 7,734,975
- Issue date Jun 8, 2010
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit having a (BIST) built-in self test...
- Patent number 7,653,854
- Issue date Jan 26, 2010
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit
- Patent number 7,254,762
- Issue date Aug 7, 2007
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit verification system
- Patent number 7,228,262
- Issue date Jun 5, 2007
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Built-in self test circuit and test method for storage device
- Patent number 7,206,984
- Issue date Apr 17, 2007
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus for delay fault testing of integrated circuits
- Patent number 7,120,890
- Issue date Oct 10, 2006
- Kabushiki Kaisha Toshiba
- Koji Urata
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit, design support apparatus, and tes...
- Patent number 7,099,783
- Issue date Aug 29, 2006
- Kabushiki Kaisha Toshiba
- Tetsu Hasegawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT
- Publication number 20190295680
- Publication date Sep 26, 2019
- KABUSHIKI KAISHA TOSHIBA
- Kenichi ANZOU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT
- Publication number 20190295678
- Publication date Sep 26, 2019
- KABUSHIKI KAISHA TOSHIBA
- Kenichi ANZOU
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT AND TEST METHOD THEREOF
- Publication number 20180275196
- Publication date Sep 27, 2018
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT
- Publication number 20180238965
- Publication date Aug 23, 2018
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT AND TEST METHOD THEREOF
- Publication number 20170074939
- Publication date Mar 16, 2017
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT
- Publication number 20160216331
- Publication date Jul 28, 2016
- Kabushiki Kaisha Toshiba
- Chikako Tokunaga
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT
- Publication number 20150262709
- Publication date Sep 17, 2015
- Kabushiki Kaisha Toshiba
- Kenichi ANZOU
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20150124537
- Publication date May 7, 2015
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G11 - INFORMATION STORAGE
Information Patent Application
BIST CIRCUIT
- Publication number 20150074475
- Publication date Mar 12, 2015
- Kabushiki Kaisha Toshiba
- Kenichi ANZOU
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor Integrated Circuit with Bist Circuit
- Publication number 20140245087
- Publication date Aug 28, 2014
- Kabushiki Kaisha Toshiba
- Chikako TOKUNAGA
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT
- Publication number 20130070545
- Publication date Mar 21, 2013
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G11 - INFORMATION STORAGE
Information Patent Application
BUILT-IN SELF TEST CIRCUIT AND DESIGNING APPARATUS
- Publication number 20120246527
- Publication date Sep 27, 2012
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT, FAILURE DIAGNOSIS SYSTEM AND FAIL...
- Publication number 20120229155
- Publication date Sep 13, 2012
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT, DESIGN APPARATUS AND DESIGN METHOD
- Publication number 20120226953
- Publication date Sep 6, 2012
- Kabushiki Kaisha Toshiba
- Masato NAKAZATO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT
- Publication number 20110058434
- Publication date Mar 10, 2011
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT, CIRCUIT FUNCTION VERYFICATION DEV...
- Publication number 20100251043
- Publication date Sep 30, 2010
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD FOR CONTROLLING SEMICON...
- Publication number 20100125766
- Publication date May 20, 2010
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT
- Publication number 20090245000
- Publication date Oct 1, 2009
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G11 - INFORMATION STORAGE
Information Patent Application
ON-CHIP FAILURE ANALYSIS CIRCUIT AND ON-CHIP FAILURE ANALYSIS METHOD
- Publication number 20090172483
- Publication date Jul 2, 2009
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT
- Publication number 20090063917
- Publication date Mar 5, 2009
- Kabushiki Kaisha Toshiba
- Chikako Tokunaga
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT AND TEST SYSTEM THEREOF
- Publication number 20090024885
- Publication date Jan 22, 2009
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G11 - INFORMATION STORAGE
Information Patent Application
NONVOLATILE SEMICONDUCTOR MEMORY SYSTEM
- Publication number 20080288838
- Publication date Nov 20, 2008
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G11 - INFORMATION STORAGE
Information Patent Application
INTEGRATED CIRCUIT DEVICE
- Publication number 20080112241
- Publication date May 15, 2008
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT
- Publication number 20080022176
- Publication date Jan 24, 2008
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT AND DESIGN APPARATUS THEREOF
- Publication number 20070226568
- Publication date Sep 27, 2007
- Kabushiki Kaisha Toshiba
- Kenichi Anzou
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor integrated circuit
- Publication number 20070011535
- Publication date Jan 11, 2007
- Kenichi Anzou
- G11 - INFORMATION STORAGE
Information Patent Application
Built-in self test circuit and test method for storage device
- Publication number 20050278595
- Publication date Dec 15, 2005
- Kenichi Anzou
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor integrated circuit
- Publication number 20050097418
- Publication date May 5, 2005
- Kenichi Anzou
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor integrated circuit verification system
- Publication number 20050015693
- Publication date Jan 20, 2005
- Kenichi Anzou
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus for generating test vector of semiconductor integrated ci...
- Publication number 20050010886
- Publication date Jan 13, 2005
- Koji Urata
- G01 - MEASURING TESTING

Kenichi Anzou

Person

Patents Grantslast 30 patents

Semiconductor integrated circuit including a memory macro

Semiconductor integrated circuit and test method thereof

Semiconductor integrated circuit

Semiconductor integrated circuit and test method thereof

Semiconductor integrated circuit

Semiconductor integrated circuit with bist circuit

BIST circuit

Semiconductor integrated circuit capable of performing self-test

Semiconductor device

Built-in self test circuit and designing apparatus

Semiconductor integrated circuit

Semiconductor integrated circuit and method for controlling semicon...

Semiconductor integrated circuit

Semiconductor integrated circuit

On-chip failure analysis circuit and on-chip failure analysis method

Semiconductor integrated circuit and test system thereof

Built-in self testing circuit with fault diagnostic capability

Nonvolatile semiconductor memory system

Integrated circuit device with built-in self test (BIST) circuit

Semiconductor integrated circuit having built-n self test circuit o...

Semiconductor integrated circuit having a (BIST) built-in self test...

Semiconductor integrated circuit

Semiconductor integrated circuit verification system

Built-in self test circuit and test method for storage device

Apparatus for delay fault testing of integrated circuits

Semiconductor integrated circuit, design support apparatus, and tes...

Patents Applicationslast 30 patents

SEMICONDUCTOR INTEGRATED CIRCUIT

SEMICONDUCTOR INTEGRATED CIRCUIT

SEMICONDUCTOR INTEGRATED CIRCUIT AND TEST METHOD THEREOF

SEMICONDUCTOR INTEGRATED CIRCUIT

SEMICONDUCTOR INTEGRATED CIRCUIT AND TEST METHOD THEREOF

SEMICONDUCTOR INTEGRATED CIRCUIT

SEMICONDUCTOR INTEGRATED CIRCUIT

SEMICONDUCTOR DEVICE

BIST CIRCUIT

Semiconductor Integrated Circuit with Bist Circuit

SEMICONDUCTOR INTEGRATED CIRCUIT

BUILT-IN SELF TEST CIRCUIT AND DESIGNING APPARATUS

SEMICONDUCTOR INTEGRATED CIRCUIT, FAILURE DIAGNOSIS SYSTEM AND FAIL...

SEMICONDUCTOR INTEGRATED CIRCUIT, DESIGN APPARATUS AND DESIGN METHOD

SEMICONDUCTOR INTEGRATED CIRCUIT

SEMICONDUCTOR INTEGRATED CIRCUIT, CIRCUIT FUNCTION VERYFICATION DEV...

SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD FOR CONTROLLING SEMICON...

SEMICONDUCTOR INTEGRATED CIRCUIT

ON-CHIP FAILURE ANALYSIS CIRCUIT AND ON-CHIP FAILURE ANALYSIS METHOD

SEMICONDUCTOR INTEGRATED CIRCUIT

SEMICONDUCTOR INTEGRATED CIRCUIT AND TEST SYSTEM THEREOF

NONVOLATILE SEMICONDUCTOR MEMORY SYSTEM

INTEGRATED CIRCUIT DEVICE

SEMICONDUCTOR INTEGRATED CIRCUIT

SEMICONDUCTOR INTEGRATED CIRCUIT AND DESIGN APPARATUS THEREOF

Semiconductor integrated circuit

Built-in self test circuit and test method for storage device

Semiconductor integrated circuit

Semiconductor integrated circuit verification system

Apparatus for generating test vector of semiconductor integrated ci...