Kenichi Fujisaki

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Test apparatus
- Patent number 8,677,197
- Issue date Mar 18, 2014
- Advantest Corporation
- Kenichi Fujisaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Test apparatus and repair analysis method
- Patent number 8,325,547
- Issue date Dec 4, 2012
- Advantest Corporation
- Kenichi Fujisaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Clear instruction information to indicate whether memory test failu...
- Patent number 8,261,139
- Issue date Sep 4, 2012
- Advantest Corporation
- Kenichi Fujisaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Test apparatus having a pattern memory and test method for testing...
- Patent number 7,636,877
- Issue date Dec 22, 2009
- Advantest Corporation
- Kenichi Fujisaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Testing apparatus and testing method
- Patent number 7,529,989
- Issue date May 5, 2009
- Advantest Corporation
- Kenichi Fujisaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory tester having defect analysis memory with two storage sections
- Patent number 7,337,381
- Issue date Feb 26, 2008
- Advantest Corporation
- Kenichi Fujisaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory testing apparatus
- Patent number 6,173,238
- Issue date Jan 9, 2001
- Advantest Corporation
- Kenichi Fujisaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory testing apparatus
- Patent number 6,115,833
- Issue date Sep 5, 2000
- Advantest Corporation
- Shinya Sato
- G11 - INFORMATION STORAGE
Information Patent Grant
Test pattern generator for memories having a block write function
- Patent number 6,032,281
- Issue date Feb 29, 2000
- Advantest Corp.
- Kenichi Fujisaki
- G11 - INFORMATION STORAGE
Information Patent Grant
High speed pattern generating method and high speed pattern generat...
- Patent number 6,006,349
- Issue date Dec 21, 1999
- Advantest Corporation
- Kenichi Fujisaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Address pattern generator for burst address access of an SDRAM
- Patent number 5,940,875
- Issue date Aug 17, 1999
- Advantest Corp.
- Toru Inagaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test pattern generator
- Patent number 5,856,985
- Issue date Jan 5, 1999
- Advantest Corp.
- Kenichi Fujisaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Multiple bit test pattern generator
- Patent number 5,852,618
- Issue date Dec 22, 1998
- Advantest Corp.
- Kenichi Fujisaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Address test pattern generator for burst transfer operation of a SDRAM
- Patent number 5,835,969
- Issue date Nov 10, 1998
- Advantest Corp.
- Toru Inagaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory testing apparatus
- Patent number 5,831,989
- Issue date Nov 3, 1998
- Advantest Coporation
- Kenichi Fujisaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory testing device for multiported DRAMs
- Patent number 5,481,671
- Issue date Jan 2, 1996
- Advantest Corporation
- Kenichi Fujisaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Analyzing device for saving semiconductor memory failures
- Patent number 5,410,687
- Issue date Apr 25, 1995
- Advantest Corporation
- Kenichi Fujisaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory testing device
- Patent number 4,958,346
- Issue date Sep 18, 1990
- Advantest Corporation
- Kenichi Fujisaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory testing device
- Patent number 4,958,345
- Issue date Sep 18, 1990
- Advantest Corporation
- Kenichi Fujisaki
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
TEST APPARATUS
- Publication number 20120216086
- Publication date Aug 23, 2012
- Advantest Corporation
- Kenichi FUJISAKI
- G11 - INFORMATION STORAGE
Information Patent Application
TEST APPARATUS AND REPAIR ANALYSIS METHOD
- Publication number 20120120748
- Publication date May 17, 2012
- Advantest Corporation
- Kenichi FUJISAKI
- G11 - INFORMATION STORAGE
Information Patent Application
TEST APPARATUS
- Publication number 20120117432
- Publication date May 10, 2012
- Advantest Corporation
- Kenichi FUJISAKI
- G11 - INFORMATION STORAGE
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20100235694
- Publication date Sep 16, 2010
- Advantest Corporation
- Kenichi FUJISAKI
- G11 - INFORMATION STORAGE
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20070271045
- Publication date Nov 22, 2007
- Advantest Corporation
- Kenichi Fujisaki
- G01 - MEASURING TESTING
Information Patent Application
Testing apparatus and testing method
- Publication number 20070208969
- Publication date Sep 6, 2007
- Advantest Corporation
- Kenichi Fujisaki
- G11 - INFORMATION STORAGE
Information Patent Application
Test apparatus
- Publication number 20060026482
- Publication date Feb 2, 2006
- Advantest Corporation
- Kenichi Fujisaki
- G01 - MEASURING TESTING

Kenichi Fujisaki

Person

Patents Grantslast 30 patents

Test apparatus

Test apparatus and repair analysis method

Clear instruction information to indicate whether memory test failu...

Test apparatus having a pattern memory and test method for testing...

Testing apparatus and testing method

Memory tester having defect analysis memory with two storage sections

Memory testing apparatus

Semiconductor memory testing apparatus

Test pattern generator for memories having a block write function

High speed pattern generating method and high speed pattern generat...

Address pattern generator for burst address access of an SDRAM

Test pattern generator

Multiple bit test pattern generator

Address test pattern generator for burst transfer operation of a SDRAM

Memory testing apparatus

Memory testing device for multiported DRAMs

Analyzing device for saving semiconductor memory failures

Memory testing device

Memory testing device

Patents Applicationslast 30 patents

TEST APPARATUS

TEST APPARATUS AND REPAIR ANALYSIS METHOD

TEST APPARATUS

TEST APPARATUS AND TEST METHOD

TEST APPARATUS AND TEST METHOD

Testing apparatus and testing method

Test apparatus