Kenichi Matsumaru

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and method for testing semiconductor device
- Patent number 6,936,889
- Issue date Aug 30, 2005
- Fujitsu Limited
- Makoto Koga
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device and method for testing semiconductor device
- Patent number 6,740,929
- Issue date May 25, 2004
- Fujitsu Limited
- Makoto Koga
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device and method for testing semiconductor device
- Patent number 6,528,817
- Issue date Mar 4, 2003
- Fujitsu Limited
- Makoto Koga
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor device and method for testing semiconductor device
- Publication number 20040190355
- Publication date Sep 30, 2004
- FUJITSU LIMITED
- Makoto Koga
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor device and method for testing semiconductor device
- Publication number 20030067016
- Publication date Apr 10, 2003
- FUJITSU LIMITED
- Makoto Koga
- G11 - INFORMATION STORAGE