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TOKYO, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Test apparatus and test method
Patent number
10,935,599
Issue date
Mar 2, 2021
Advantest Corporation
Nagatani Kenichi
G01 - MEASURING TESTING
Information
Patent Grant
Jitter addition apparatus and test apparatus
Patent number
8,599,910
Issue date
Dec 3, 2013
Advantest Corporation
Kenichi Nagatani
G01 - MEASURING TESTING
Information
Patent Grant
Test apparatus for testing a device under test and device for recei...
Patent number
8,145,965
Issue date
Mar 27, 2012
Advantest Corporation
Kenichi Nagatani
G11 - INFORMATION STORAGE
Information
Patent Grant
Transmission characteristics measurement apparatus, transmission ch...
Patent number
8,140,290
Issue date
Mar 20, 2012
Advantest Corporation
Masahiro Ishida
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Test apparatus
Patent number
8,090,009
Issue date
Jan 3, 2012
Advantest Corporation
Kenichi Nagatani
G01 - MEASURING TESTING
Information
Patent Grant
Jitter injection circuit, electronics device, and test apparatus
Patent number
7,801,205
Issue date
Sep 21, 2010
Advantest Corporation
Kenichi Nagatani
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TEST APPARATUS AND TEST METHOD
Publication number
20190170823
Publication date
Jun 6, 2019
Advantest Corporation
NAGATANI KENICHI
G01 - MEASURING TESTING
Information
Patent Application
TEST APPARATUS, TEST METHOD, AND DEVICE
Publication number
20100283480
Publication date
Nov 11, 2010
Advantest Corporation
Kenichi NAGATANI
G01 - MEASURING TESTING
Information
Patent Application
TRANSMISSION CHARACTERISTICS MEASUREMENT APPARATUS, TRANSMISSION CH...
Publication number
20100244881
Publication date
Sep 30, 2010
Advantest Corporation
Masahiro ISHIDA
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
JITTER ADDITION APPARATUS AND TEST APPARATUS
Publication number
20100158092
Publication date
Jun 24, 2010
Advantest Corporation
Kenichi NAGATANI
G01 - MEASURING TESTING
Information
Patent Application
JITTER INJECTION CIRCUIT, ELECTRONICS DEVICE, AND TEST APPARATUS
Publication number
20090041102
Publication date
Feb 12, 2009
Advantest Corporation
KENICHI NAGATANI
G01 - MEASURING TESTING
Information
Patent Application
TEST APPARATUS
Publication number
20090041101
Publication date
Feb 12, 2009
Advantest Corporation
KENICHI NAGATANI
G01 - MEASURING TESTING
Information
Patent Application
TEST APPARATUS AND DEVICE
Publication number
20080294952
Publication date
Nov 27, 2008
Advantest Corporation
KENICHI NAGATANI
G01 - MEASURING TESTING