Kenichi Ohtsuka

Person

Shizuoka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Optical unit and film thickness measurement device
- Patent number 11,988,497
- Issue date May 21, 2024
- Hamamatsu Photonics K.K.
- Ikuo Arata
- G01 - MEASURING TESTING
Information Patent Grant
Film thickness measurement device, film thickness measurement metho...
- Patent number 11,280,604
- Issue date Mar 22, 2022
- Hamamatsu Photonics K.K.
- Kenichi Ohtsuka
- G01 - MEASURING TESTING
Information Patent Grant
Film thickness measurement method and film thickness measurement de...
- Patent number 9,846,028
- Issue date Dec 19, 2017
- Hamamatsu Photonics K.K.
- Kenichi Ohtsuka
- G01 - MEASURING TESTING
Information Patent Grant
Film thickness measurement device and film thickness measurement me...
- Patent number 8,885,173
- Issue date Nov 11, 2014
- Hamamatsu Photonics K.K.
- Kenichi Ohtsuka
- G01 - MEASURING TESTING
Information Patent Grant
Reflectivity measuring device, reflectivity measuring method, membr...
- Patent number 8,699,023
- Issue date Apr 15, 2014
- Hamamatsu Photonics K.K.
- Kenichi Ohtsuka
- G01 - MEASURING TESTING
Information Patent Grant
Film thickness measurement device and measurement method
- Patent number 8,649,023
- Issue date Feb 11, 2014
- Hamamatsu Photonics K.K.
- Kenichi Ohtsuka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FILM THICKNESS MEASUREMENT DEVICE AND FILM THICKNESS MEASUREMENT ME...
- Publication number 20240240933
- Publication date Jul 18, 2024
- Hamamatsu Photonics K.K.
- Kunihiko TSUCHIYA
- G01 - MEASURING TESTING
Information Patent Application
FILM THICKNESS MEASURING DEVICE AND FILM THICKNESS MEASURING METHOD
- Publication number 20240125589
- Publication date Apr 18, 2024
- Hamamatsu Photonics K.K.
- Kenichi OHTSUKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FILM THICKNESS MEASURING DEVICE AND FILM THICKNESS MEASURING METHOD
- Publication number 20230058064
- Publication date Feb 23, 2023
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL UNIT AND FILM THICKNESS MEASUREMENT DEVICE
- Publication number 20220333913
- Publication date Oct 20, 2022
- Hamamatsu Photonics K.K.
- Ikuo ARATA
- G01 - MEASURING TESTING
Information Patent Application
FILM THICKNESS MEASUREMENT DEVICE, FILM THICKNESS MEASUREMENT METHO...
- Publication number 20210080250
- Publication date Mar 18, 2021
- Hamamatsu Photonics K.K.
- Kenichi OHTSUKA
- G01 - MEASURING TESTING
Information Patent Application
FILM THICKNESS MEASUREMENT METHOD AND FILM THICKNESS MEASUREMENT DE...
- Publication number 20160349038
- Publication date Dec 1, 2016
- HAMAMATSU PHOTONICS K. K.
- Kenichi Ohtsuka
- G01 - MEASURING TESTING
Information Patent Application
REFLECTIVITY MEASURING DEVICE, REFLECTIVITY MEASURING METHOD, MEMBR...
- Publication number 20130169968
- Publication date Jul 4, 2013
- Hamamatsu Photonics K.K.
- Kenichi Ohtsuka
- G01 - MEASURING TESTING
Information Patent Application
FILM THICKNESS MEASUREMENT DEVICE AND FILM THICKNESS MEASUREMENT ME...
- Publication number 20120218561
- Publication date Aug 30, 2012
- HAMAMATSU PHOTONICS K. K.
- Kenichi Ohtsuka
- G01 - MEASURING TESTING
Information Patent Application
FILM THICKNESS MEASUREMENT DEVICE AND MEASUREMENT METHOD
- Publication number 20110299097
- Publication date Dec 8, 2011
- Hamamatsu Photonics K. K.
- Kenichi Ohtsuka
- G01 - MEASURING TESTING

Kenichi Ohtsuka

Person

Patents Grantslast 30 patents

Optical unit and film thickness measurement device

Film thickness measurement device, film thickness measurement metho...

Film thickness measurement method and film thickness measurement de...

Film thickness measurement device and film thickness measurement me...

Reflectivity measuring device, reflectivity measuring method, membr...

Film thickness measurement device and measurement method

Patents Applicationslast 30 patents

FILM THICKNESS MEASUREMENT DEVICE AND FILM THICKNESS MEASUREMENT ME...

FILM THICKNESS MEASURING DEVICE AND FILM THICKNESS MEASURING METHOD

FILM THICKNESS MEASURING DEVICE AND FILM THICKNESS MEASURING METHOD

OPTICAL UNIT AND FILM THICKNESS MEASUREMENT DEVICE

FILM THICKNESS MEASUREMENT DEVICE, FILM THICKNESS MEASUREMENT METHO...

FILM THICKNESS MEASUREMENT METHOD AND FILM THICKNESS MEASUREMENT DE...

REFLECTIVITY MEASURING DEVICE, REFLECTIVITY MEASURING METHOD, MEMBR...

FILM THICKNESS MEASUREMENT DEVICE AND FILM THICKNESS MEASUREMENT ME...

FILM THICKNESS MEASUREMENT DEVICE AND MEASUREMENT METHOD