Kenji Emura

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Hyogo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor test system and relay driving test method therefor
- Patent number 8,456,171
- Issue date Jun 4, 2013
- Japan Electronic Materials Corp.
- Shingo Matsuno
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR TEST SYSTEM AND RELAY DRIVING TEST METHOD THEREFOR
- Publication number 20110193562
- Publication date Aug 11, 2011
- JAPAN ELECTRONIC MATERIALS CORP.
- Shingo Matsuno
- G01 - MEASURING TESTING