Kenji Numata

Person

Yamato-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit
- Patent number 7,058,863
- Issue date Jun 6, 2006
- Kabushiki Kaisha Toshiba
- Toshiyuki Kouchi
- G11 - INFORMATION STORAGE
Information Patent Grant
Dynamic random access memory device
- Patent number 6,295,241
- Issue date Sep 25, 2001
- Kabushiki Kaisha Toshiba
- Shigeyoshi Watanabe
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory and screening test method thereof
- Patent number RE37184
- Issue date May 22, 2001
- Kabushiki Kaisha Toshiba
- Natsuki Kushiyama
- 365 - Static information storage and retrieval
Information Patent Grant
Semiconductor memory device allowing change of refresh mode and add...
- Patent number 6,141,288
- Issue date Oct 31, 2000
- Kabushiki Kaisha Toshiba
- Kenji Numata
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit device allowing change of product...
- Patent number 5,970,015
- Issue date Oct 19, 1999
- Kabushiki Kaisha Toshiba
- Kenji Numata
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device having cell array divided into a plural...
- Patent number 5,970,006
- Issue date Oct 19, 1999
- Kabushiki Kaisha Toshiba
- Kenji Numata
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device having input protection circuit
- Patent number 5,949,109
- Issue date Sep 7, 1999
- Kabushiki Kaisha Toshiba
- Mitsuru Shimizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor memory device
- Patent number 5,881,006
- Issue date Mar 9, 1999
- Kabushiki Kaisha Toshiba
- Tomoaki Yabe
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device having cell array divided into a plural...
- Patent number 5,862,090
- Issue date Jan 19, 1999
- Kabushiki Kaisha Toshiba
- Kenji Numata
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit device allowing change of product...
- Patent number 5,812,481
- Issue date Sep 22, 1998
- Kabushiki Kaisha Toshiba
- Kenji Numata
- G11 - INFORMATION STORAGE
Information Patent Grant
Clock synchronous type DRAM with latch
- Patent number 5,754,481
- Issue date May 19, 1998
- Kabushiki Kaisha Toshiba
- Tomoaki Yabe
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device having cell array divided into a plural...
- Patent number 5,734,619
- Issue date Mar 31, 1998
- Kabushiki Kaisha Toshiba
- Kenji Numata
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 5,706,229
- Issue date Jan 6, 1998
- Kabushiki Kaisha Toshiba
- Tomoaki Yabe
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory standard cell macro for semiconductor device
- Patent number 5,698,876
- Issue date Dec 16, 1997
- Kabushiki Kaisha Toshiba
- Tomoaki Yabe
- G11 - INFORMATION STORAGE
Information Patent Grant
Clock synchronous type DRAM with data latch
- Patent number 5,659,507
- Issue date Aug 19, 1997
- Kabushiki Kaisha Toshiba
- Tomoaki Yabe
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory circuit having data buses common to a pluralit...
- Patent number 5,640,351
- Issue date Jun 17, 1997
- Kabushiki Kaisha Toshiba
- Tomoaki Yabe
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit device allowing change of product...
- Patent number 5,633,827
- Issue date May 27, 1997
- Kabushiki Kaisha Toshiba
- Kenji Numata
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 5,608,674
- Issue date Mar 4, 1997
- Kabushiki Kaisha Toshiba
- Tomoaki Yabe
- G11 - INFORMATION STORAGE
Information Patent Grant
Input protection circuit formed in a semiconductor substrate
- Patent number 5,594,265
- Issue date Jan 14, 1997
- Kabushiki Kaisha Toshiba
- Mitsuru Shimizu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit allowing change of product specifi...
- Patent number 5,559,748
- Issue date Sep 24, 1996
- Kabushiki Kaisha Toshiba
- Kenji Numata
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 5,555,523
- Issue date Sep 10, 1996
- Kabushiki Kaisha Toshiba
- Ryo Haga
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory and screening test method thereof
- Patent number 5,532,963
- Issue date Jul 2, 1996
- Kabushiki Kaisha Toshiba
- Natsuki Kushiyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory and screening test method thereof
- Patent number 5,377,152
- Issue date Dec 27, 1994
- Kabushiki Kaisha Toshiba
- Natsuki Kushiyama
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor integrated circuit
- Publication number 20020158271
- Publication date Oct 31, 2002
- Toshiyuki Kouchi
- H01 - BASIC ELECTRIC ELEMENTS

Kenji Numata

Person

Patents Grantslast 30 patents

Semiconductor integrated circuit

Dynamic random access memory device

Semiconductor memory and screening test method thereof

Semiconductor memory device allowing change of refresh mode and add...

Semiconductor integrated circuit device allowing change of product...

Semiconductor memory device having cell array divided into a plural...

Semiconductor device having input protection circuit

Semiconductor memory device

Semiconductor memory device having cell array divided into a plural...

Semiconductor integrated circuit device allowing change of product...

Clock synchronous type DRAM with latch

Semiconductor memory device having cell array divided into a plural...

Semiconductor memory device

Memory standard cell macro for semiconductor device

Clock synchronous type DRAM with data latch

Semiconductor memory circuit having data buses common to a pluralit...

Semiconductor integrated circuit device allowing change of product...

Semiconductor memory device

Input protection circuit formed in a semiconductor substrate

Semiconductor integrated circuit allowing change of product specifi...

Semiconductor memory device

Semiconductor memory and screening test method thereof

Semiconductor memory and screening test method thereof

Patents Applicationslast 30 patents

Semiconductor integrated circuit