Kenji TERAO

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Inspection device
- Patent number 10,002,740
- Issue date Jun 19, 2018
- Ebara Corporation
- Masahiro Hatakeyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen observation method and device using secondary emission ele...
- Patent number 9,966,227
- Issue date May 8, 2018
- Ebara Corporation
- Masahiro Hatakeyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface processing apparatus
- Patent number 9,852,878
- Issue date Dec 26, 2017
- Ebara Corporation
- Masahiro Hatakeyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam apparatus and sample observation method using the same
- Patent number 9,194,826
- Issue date Nov 24, 2015
- Ebara Corporation
- Toru Kaga
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optical inspection apparatus and method with dust or partic...
- Patent number 9,105,444
- Issue date Aug 11, 2015
- Ebara Corporation
- Kenji Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Specimen observation method and device using secondary emission ele...
- Patent number 8,937,283
- Issue date Jan 20, 2015
- Ebara Corporation
- Masahiro Hatakeyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for inspecting sample surface
- Patent number 8,859,984
- Issue date Oct 14, 2014
- Ebara Corporation
- Nobuharu Noji
- G01 - MEASURING TESTING
Information Patent Grant
Electro-optical inspection apparatus and method with dust or partic...
- Patent number 8,624,182
- Issue date Jan 7, 2014
- Ebara Corporation
- Kenji Watanabe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for inspecting sample surface
- Patent number 8,525,127
- Issue date Sep 3, 2013
- Ebara Corporation
- Nobuharu Noji
- G01 - MEASURING TESTING
Information Patent Grant
Substrate surface inspection method and inspection apparatus
- Patent number 8,274,047
- Issue date Sep 25, 2012
- Ebara Corporation
- Yoshihiko Naito
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspecting sample surface
- Patent number 7,952,071
- Issue date May 31, 2011
- Ebara Corporation
- Nobuharu Noji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample surface observation method
- Patent number 7,829,853
- Issue date Nov 9, 2010
- Ebara Corporation
- Kenji Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
AGC system, AGC method, and receiver using the AGC system
- Patent number 7,496,163
- Issue date Feb 24, 2009
- NEC Corporation
- Kenji Terao
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Radio communication terminal and radio signal receiving method
- Patent number 7,366,263
- Issue date Apr 29, 2008
- NEC Corporation
- Kenji Terao
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Sample repairing apparatus, a sample repairing method and a device...
- Patent number 7,256,405
- Issue date Aug 14, 2007
- Ebara Corporation
- Mamoru Nakasuji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
CDMA receiver performing a path search, path search method, and pro...
- Patent number 7,254,162
- Issue date Aug 7, 2007
- NEC Corporation
- Kenji Terao
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
CDMA receiver, path search method and program
- Patent number 7,039,097
- Issue date May 2, 2006
- NEC Corporation
- Kenji Terao
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION DEVICE
- Publication number 20180040452
- Publication date Feb 8, 2018
- EBARA CORPORATION
- Masahiro HATAKEYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SURFACE PROCESSING APPARATUS
- Publication number 20150371813
- Publication date Dec 24, 2015
- EBARA CORPORATION
- Masahiro HATAKEYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECIMEN OBSERVATION METHOD AND DEVICE USING SECONDARY EMISSION ELE...
- Publication number 20150060666
- Publication date Mar 5, 2015
- EBARA CORPORATION
- Masahiro Hatakeyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRO-OPTICAL INSPECTION APPARATUS AND METHOD WITH DUST OR PARTIC...
- Publication number 20140091215
- Publication date Apr 3, 2014
- EBARA CORPORATION
- Kenji WATANABE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING SAMPLE SURFACE
- Publication number 20130313429
- Publication date Nov 28, 2013
- EBARA CORPORATION
- Nobuharu Noji
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING SAMPLE SURFACE
- Publication number 20120145921
- Publication date Jun 14, 2012
- EBARA CORPORATION
- Nobuharu Noji
- G01 - MEASURING TESTING
Information Patent Application
ELECTRO-OPTICAL INSPECTION APPARATUS AND METHOD WITH DUST OR PARTIC...
- Publication number 20120074316
- Publication date Mar 29, 2012
- Kenji WATANABE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SPECIMEN OBSERVATION METHOD AND DEVICE, AND INSPECTION METHOD AND D...
- Publication number 20110155905
- Publication date Jun 30, 2011
- EBARA CORPORATION
- Masahiro Hatakeyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBSTRATE SURFACE INSPECTION METHOD AND INSPECTION APPARATUS
- Publication number 20100032566
- Publication date Feb 11, 2010
- EBARA CORPORATION
- Yoshihiko Naito
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICES AND METHOD OF TESTING SAME
- Publication number 20090152595
- Publication date Jun 18, 2009
- EBARA CORPORATION
- Toru Kaga
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE SURFACE OBSERVATION METHOD
- Publication number 20090090863
- Publication date Apr 9, 2009
- EBARA CORPORATION
- Kenji WATANABE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR INSPECTING SAMPLE SURFACE
- Publication number 20090050802
- Publication date Feb 26, 2009
- EBARA CORPORATION
- Nobuharu Noji
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING SAMPLE SURFACE
- Publication number 20090026368
- Publication date Jan 29, 2009
- Ebara Corporation
- Nobuharu Noji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON BEAM APPARATUS AND SAMPLE OBSERVATION METHOD USING THE SAME
- Publication number 20080251718
- Publication date Oct 16, 2008
- EBARA CORPORATION
- Toru KAGA
- G01 - MEASURING TESTING
Information Patent Application
Sample repairing apparatus, a sample repairing method and a device...
- Publication number 20050211925
- Publication date Sep 29, 2005
- EBARA CORPORATION
- Mamoru Nakasuji
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AGC system, AGC method, and receiver using the AGC system
- Publication number 20050129150
- Publication date Jun 16, 2005
- NEC Corporation
- Kenji Terao
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Radio communication terminal and radio signal receiving method
- Publication number 20040214529
- Publication date Oct 28, 2004
- NEC Corporation
- Kenji Terao
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
CDMA receiver, path search method and program
- Publication number 20030039304
- Publication date Feb 27, 2003
- NEC Corporation
- Kenji Terao
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
CDMA receiver performing a path search, path search method, and pro...
- Publication number 20020094018
- Publication date Jul 18, 2002
- NEC Corporation
- Kenji Terao
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Kenji TERAO

Person

Patents Grantslast 30 patents

Inspection device

Specimen observation method and device using secondary emission ele...

Surface processing apparatus

Electron beam apparatus and sample observation method using the same

Electro-optical inspection apparatus and method with dust or partic...

Specimen observation method and device using secondary emission ele...

Method and apparatus for inspecting sample surface

Electro-optical inspection apparatus and method with dust or partic...

Method and apparatus for inspecting sample surface

Substrate surface inspection method and inspection apparatus

Apparatus and method for inspecting sample surface

Sample surface observation method

AGC system, AGC method, and receiver using the AGC system

Radio communication terminal and radio signal receiving method

Sample repairing apparatus, a sample repairing method and a device...

CDMA receiver performing a path search, path search method, and pro...

CDMA receiver, path search method and program

Patents Applicationslast 30 patents

INSPECTION DEVICE

SURFACE PROCESSING APPARATUS

SPECIMEN OBSERVATION METHOD AND DEVICE USING SECONDARY EMISSION ELE...

ELECTRO-OPTICAL INSPECTION APPARATUS AND METHOD WITH DUST OR PARTIC...

METHOD AND APPARATUS FOR INSPECTING SAMPLE SURFACE

METHOD AND APPARATUS FOR INSPECTING SAMPLE SURFACE

ELECTRO-OPTICAL INSPECTION APPARATUS AND METHOD WITH DUST OR PARTIC...

SPECIMEN OBSERVATION METHOD AND DEVICE, AND INSPECTION METHOD AND D...

SUBSTRATE SURFACE INSPECTION METHOD AND INSPECTION APPARATUS

SEMICONDUCTOR DEVICES AND METHOD OF TESTING SAME

SAMPLE SURFACE OBSERVATION METHOD

METHOD AND APPARATUS FOR INSPECTING SAMPLE SURFACE

APPARATUS AND METHOD FOR INSPECTING SAMPLE SURFACE

ELECTRON BEAM APPARATUS AND SAMPLE OBSERVATION METHOD USING THE SAME

Sample repairing apparatus, a sample repairing method and a device...

AGC system, AGC method, and receiver using the AGC system

Radio communication terminal and radio signal receiving method

CDMA receiver, path search method and program

CDMA receiver performing a path search, path search method, and pro...