Kenji YASUI

Person

Kawasaki-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Image relay device and image projection system
- Patent number 12,038,620
- Issue date Jul 16, 2024
- QD Laser, Inc.
- Makoto Suzuki
- G02 - OPTICS
Information Patent Grant
Memory tester and test method that uses memory tester
- Patent number 11,933,846
- Issue date Mar 19, 2024
- Kioxia Coporation
- Kenji Yasui
- G01 - MEASURING TESTING
Information Patent Grant
Visual sense examination device
- Patent number 11,717,157
- Issue date Aug 8, 2023
- QD LASER, INC.
- Kenji Yasui
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Image projection device
- Patent number 11,586,038
- Issue date Feb 21, 2023
- QD LASER, INC.
- Makoto Suzuki
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Pattern cross-sectional shape estimation system and program
- Patent number 11,211,226
- Issue date Dec 28, 2021
- HITACHI HIGH-TECH CORPORATION
- Toshiyuki Yokosuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope and calculation method for three-dimen...
- Patent number 11,164,720
- Issue date Nov 2, 2021
- HITACHI HIGH-TECH CORPORATION
- Kenji Yasui
- G01 - MEASURING TESTING
Information Patent Grant
Retinal scanning type eye examination device, retinal scanning type...
- Patent number 11,019,995
- Issue date Jun 1, 2021
- QD Laser, Inc.
- Hironori Miyauchi
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

Information Patent Application
MEMORY TESTER AND TEST METHOD THAT USES MEMORY TESTER
- Publication number 20230296671
- Publication date Sep 21, 2023
- KIOXIA Corporation
- Kenji YASUI
- G01 - MEASURING TESTING
Information Patent Application
OBSERVATION SYSTEM, OBSERVATION METHOD, AND PROGRAM
- Publication number 20230238210
- Publication date Jul 27, 2023
- HITACHI HIGH-TECH CORPORATION
- Hiroaki KASAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROCESSOR SYSTEM, SEMICONDUCTOR INSPECTION SYSTEM, AND PROGRAM
- Publication number 20230230886
- Publication date Jul 20, 2023
- HITACHI HIGH-TECH CORPORATION
- Kenji YASUI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE RELAY DEVICE AND IMAGE PROJECTION SYSTEM
- Publication number 20220196961
- Publication date Jun 23, 2022
- QD Laser, Inc.
- Makoto SUZUKI
- G02 - OPTICS
Information Patent Application
PATTERN CROSS-SECTIONAL SHAPE ESTIMATION SYSTEM AND PROGRAM
- Publication number 20200321189
- Publication date Oct 8, 2020
- HITACHI HIGH-TECH CORPORATION
- Toshiyuki YOKOSUKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VISUAL SENSE EXAMINATION DEVICE
- Publication number 20200229694
- Publication date Jul 23, 2020
- QD LASER, INC.
- Kenji YASUI
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SCANNING ELECTRON MICROSCOPE AND CALCULATION METHOD FOR THREE-DIMEN...
- Publication number 20200234916
- Publication date Jul 23, 2020
- Hitachi High-Technologies Corporation
- Kenji YASUI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RETINAL SCANNING TYPE EYE EXAMINATION DEVICE, RETINAL SCANNING TYPE...
- Publication number 20200085295
- Publication date Mar 19, 2020
- QD Laser, Inc.
- Hironori MIYAUCHI
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
IMAGE PROJECTION DEVICE
- Publication number 20190353897
- Publication date Nov 21, 2019
- QD LASER INC.
- Makoto SUZUKI
- G02 - OPTICS

Kenji YASUI

Person

Patents Grantslast 30 patents

Image relay device and image projection system

Memory tester and test method that uses memory tester

Visual sense examination device

Image projection device

Pattern cross-sectional shape estimation system and program

Scanning electron microscope and calculation method for three-dimen...

Retinal scanning type eye examination device, retinal scanning type...

Patents Applicationslast 30 patents

MEMORY TESTER AND TEST METHOD THAT USES MEMORY TESTER

OBSERVATION SYSTEM, OBSERVATION METHOD, AND PROGRAM

PROCESSOR SYSTEM, SEMICONDUCTOR INSPECTION SYSTEM, AND PROGRAM

IMAGE RELAY DEVICE AND IMAGE PROJECTION SYSTEM

PATTERN CROSS-SECTIONAL SHAPE ESTIMATION SYSTEM AND PROGRAM

VISUAL SENSE EXAMINATION DEVICE

SCANNING ELECTRON MICROSCOPE AND CALCULATION METHOD FOR THREE-DIMEN...

RETINAL SCANNING TYPE EYE EXAMINATION DEVICE, RETINAL SCANNING TYPE...

IMAGE PROJECTION DEVICE