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Kenneth H. Wong
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Santa Rosa, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Apparatus and method for cable phase correction for vector analyzer...
Patent number
9,841,449
Issue date
Dec 12, 2017
Keysight Technologies, Inc.
Michael Mikulka
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for producing a signal with a power change determ...
Patent number
9,835,677
Issue date
Dec 5, 2017
Keysight Technologies, Inc.
Kenneth H. Wong
G01 - MEASURING TESTING
Information
Patent Grant
Determining operating characteristics of signal generator using mea...
Patent number
9,632,122
Issue date
Apr 25, 2017
Keysight Technologies, Inc.
Loren C. Betts
G01 - MEASURING TESTING
Information
Patent Grant
Self calibration apparatus and methods
Patent number
7,652,484
Issue date
Jan 26, 2010
Agilent Technologies, Inc.
Kenneth H. Wong
G01 - MEASURING TESTING
Information
Patent Grant
Vector network analyzer with independently tuned receivers characte...
Patent number
7,248,033
Issue date
Jul 24, 2007
Agilent Technologies, Inc.
Keith F. Anderson
G01 - MEASURING TESTING
Information
Patent Grant
Balanced microwave cable adaptor having a connector interface secur...
Patent number
7,221,245
Issue date
May 22, 2007
Agilent Technologies, Inc.
Hassan Tanbakuchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Microwave connector
Patent number
7,168,979
Issue date
Jan 30, 2007
Agilent Technologies, Inc.
Paul E. Cassanego
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
VNA and method for addressing transmission line effects in VNA meas...
Patent number
7,148,702
Issue date
Dec 12, 2006
Agilent Technologies, Inc.
Kenneth H. Wong
G01 - MEASURING TESTING
Information
Patent Grant
Method for implementing TRL calibration in VNA
Patent number
7,124,049
Issue date
Oct 17, 2006
Agilent Technologies, Inc.
Kenneth H. Wong
G01 - MEASURING TESTING
Information
Patent Grant
Power calibration for multi-port vector network analyzer (VNA)
Patent number
7,061,254
Issue date
Jun 13, 2006
Agilent Technologies, Inc.
Robert Edward Shoulders
G01 - MEASURING TESTING
Information
Patent Grant
Multiport calibration simplification using the “unknown thru” method
Patent number
7,019,536
Issue date
Mar 28, 2006
Agilent Technologies, Inc.
Keith F. Anderson
G01 - MEASURING TESTING
Information
Patent Grant
Obtaining calibration parameters for a three-port device under test
Patent number
7,013,229
Issue date
Mar 14, 2006
Agilent Technologies, Inc.
Kenneth H. Wong
G01 - MEASURING TESTING
Information
Patent Grant
Noise measurement system and method
Patent number
7,010,443
Issue date
Mar 7, 2006
Agilent Technologies, Inc.
Shigetsune Torin
G01 - MEASURING TESTING
Information
Patent Grant
Vector network analyzer mixer calibration using the unknown thru ca...
Patent number
6,995,571
Issue date
Feb 7, 2006
Agilent Technologies, Inc.
James C. Liu
G01 - MEASURING TESTING
Information
Patent Grant
Automated electronic calibration apparatus
Patent number
6,965,241
Issue date
Nov 15, 2005
Agilent Technologies, Inc.
James C. Liu
G01 - MEASURING TESTING
Information
Patent Grant
Balanced microwave connector and transition using a coaxial structure
Patent number
6,937,109
Issue date
Aug 30, 2005
Agilent Technologies, Inc.
Hassan Tanbakuchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electronic calibration circuit for calibrating a network analyzer
Patent number
6,914,436
Issue date
Jul 5, 2005
Agilent Technologies, Inc.
James C. Liu
G01 - MEASURING TESTING
Information
Patent Grant
System and method for determining measurement errors of a testing d...
Patent number
6,823,276
Issue date
Nov 23, 2004
Agilent Technologies, Inc.
David V. Blackham
G01 - MEASURING TESTING
Information
Patent Grant
Coaxial DC block
Patent number
6,798,310
Issue date
Sep 28, 2004
Agilent Technologies, Inc.
Kenneth H. Wong
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
APPARATUS AND METHOD FOR CABLE PHASE CORRECTION FOR VECTOR ANALYZER...
Publication number
20170153280
Publication date
Jun 1, 2017
Keysight Technologies, Inc.
Michael Mikulka
G01 - MEASURING TESTING
Information
Patent Application
DETERMINING OPERATING CHARACTERISTICS OF SIGNAL GENERATOR USING MEA...
Publication number
20150369849
Publication date
Dec 24, 2015
Keysight Technologies, Inc.
Loren C. Betts
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR PRODUCING A SIGNAL WITH A POWER CHANGE DETERM...
Publication number
20120153933
Publication date
Jun 21, 2012
AGILENT TECHNOLOGIES, INC.
Kenneth H. Wong
G01 - MEASURING TESTING
Information
Patent Application
Self Calibration Apparatus And Methods
Publication number
20080204039
Publication date
Aug 28, 2008
Kenneth H. Wong
G01 - MEASURING TESTING
Information
Patent Application
N-port signal separation apparatus with improved frequency selectiv...
Publication number
20080020726
Publication date
Jan 24, 2008
David V. Blackham
G01 - MEASURING TESTING
Information
Patent Application
VNA and method for addressing transmission line effects in VNA meas...
Publication number
20060226856
Publication date
Oct 12, 2006
Kenneth H. Wong
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR IMPLEMENTING TRL CALIBRATION IN VNA
Publication number
20060161369
Publication date
Jul 20, 2006
Kenneth H. Wong
G01 - MEASURING TESTING
Information
Patent Application
Vector network analyzer with independently tuned receivers characte...
Publication number
20060084426
Publication date
Apr 20, 2006
Keith F. Anderson
G01 - MEASURING TESTING
Information
Patent Application
Microwave connector
Publication number
20060030208
Publication date
Feb 9, 2006
Paul E. Cassanego
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Balanced microwave cable adaptor
Publication number
20050140459
Publication date
Jun 30, 2005
Hassan Tanbakuchi
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Obtaining calibration parameters for a three-port device under test
Publication number
20050107972
Publication date
May 19, 2005
Kenneth H. Wong
G01 - MEASURING TESTING
Information
Patent Application
Noise measurement system and method
Publication number
20050096859
Publication date
May 5, 2005
Shigetsune Torin
G01 - MEASURING TESTING
Information
Patent Application
System and method for determining measurement errors of a testing d...
Publication number
20040199350
Publication date
Oct 7, 2004
David V. Blackham
G01 - MEASURING TESTING
Information
Patent Application
Modeling pin depths associated with coaxial standards
Publication number
20040162713
Publication date
Aug 19, 2004
David VerNon Blackham
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Electronic calibration circuit for calibrating a network analyzer
Publication number
20040150411
Publication date
Aug 5, 2004
James C. Liu
G01 - MEASURING TESTING
Information
Patent Application
Coaxial DC block
Publication number
20040130407
Publication date
Jul 8, 2004
Kenneth H. Wong
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Balanced microwave connector and transition
Publication number
20040108914
Publication date
Jun 10, 2004
Hassan Tanbakuchi
H01 - BASIC ELECTRIC ELEMENTS