Membership
Tour
Register
Log in
Kent B. Erington
Follow
Person
Austin, TX, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Synchronized pulsed LADA for the simultaneous acquisition of timing...
Patent number
11,047,906
Issue date
Jun 29, 2021
DCG Systems, Inc.
Kent Erington
G01 - MEASURING TESTING
Information
Patent Grant
Digital tests with radiation induced upsets
Patent number
10,782,343
Issue date
Sep 22, 2020
NXP USA, INC.
Daniel Joseph Bodoh
G01 - MEASURING TESTING
Information
Patent Grant
System and method of multiplexing laser triggers and optically sele...
Patent number
10,352,995
Issue date
Jul 16, 2019
NXP USA, INC.
Kent B. Erington
G01 - MEASURING TESTING
Information
Patent Grant
Synchronized pulsed LADA for the simultaneous acquisition of timing...
Patent number
10,191,111
Issue date
Jan 29, 2019
DCG Systems, Inc.
Kent Erington
G01 - MEASURING TESTING
Information
Patent Grant
Time resolved radiation assisted device alteration
Patent number
7,973,545
Issue date
Jul 5, 2011
FREESCALE SEMICONDUCTOR, INC.
Kent B. Erington
G01 - MEASURING TESTING
Information
Patent Grant
Radiation induced fault analysis
Patent number
7,872,489
Issue date
Jan 18, 2011
FREESCALE SEMICONDUCTOR, INC.
Kristofor J. Dickson
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for testing an integrated circuit with a pulse...
Patent number
6,169,408
Issue date
Jan 2, 2001
Motorola, Inc.
Kenneth J. Kantor
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
STRUCTURE AND METHOD FOR TEST-POINT ACCESS IN A SEMICONDUCTOR
Publication number
20240047281
Publication date
Feb 8, 2024
NXP USA, Inc.
Kristofor Jason Dickson
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DIGITAL TESTS WITH RADIATION INDUCED UPSETS
Publication number
20190317146
Publication date
Oct 17, 2019
NXP USA, Inc.
DANIEL JOSEPH BODOH
G01 - MEASURING TESTING
Information
Patent Application
SYNCHRONIZED PULSED LADA FOR THE SIMULTANEOUS ACQUISITION OF TIMING...
Publication number
20190170818
Publication date
Jun 6, 2019
DCG SYSTEMS, INC.
Kent Erington
G01 - MEASURING TESTING
Information
Patent Application
SYNCHRONIZED PULSED LADA FOR THE SIMULTANEOUS ACQUISITION OF TIMING...
Publication number
20140285227
Publication date
Sep 25, 2014
FREESCALE SEMICONDUCTOR, INC.
Keith Serrels
G01 - MEASURING TESTING
Information
Patent Application
RADIATION INDUCED FAULT ANALYSIS
Publication number
20090271675
Publication date
Oct 29, 2009
FREESCALE SEMICONDUCTOR, INC.
Kristofor J. Dickson
G01 - MEASURING TESTING
Information
Patent Application
TIME RESOLVED RADIATION ASSISTED DEVICE ALTERATION
Publication number
20090261840
Publication date
Oct 22, 2009
FREESCALE SEMICONDUCTOR, INC.
Kent B. Erington
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR TESTING A SEMICONDUCTOR DEVICE AND A SEMICONDUCTOR DEVIC...
Publication number
20090147255
Publication date
Jun 11, 2009
Kent B. Erington
G01 - MEASURING TESTING