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Kenta Imai

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  • Tokyo, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    Parts Anomaly Detection System, Automatic Analyzer and Parts Anomal...
    • Publication number 20250155460
    • Publication date May 15, 2025
    • Hitachi High-Tech Corporation
    • Shunsuke SASAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZING SYSTEM AND CONVEYING METHOD
    • Publication number 20240402204
    • Publication date Dec 5, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Nobuya FUKUDA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automated Analysis Support Robot, and Automated Analysis System
    • Publication number 20240377422
    • Publication date Nov 14, 2024
    • Hitachi High-Tech Corporation
    • Hikaru TAKIZAWA
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND AUTOMATIC ANALYSIS SYSTEM
    • Publication number 20240345109
    • Publication date Oct 17, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Miwa Takeuchi
    • G01 - MEASURING TESTING
  • Information Patent Application

    Diagnostic System, Automatic Analyzer, and Diagnostic Method
    • Publication number 20240280598
    • Publication date Aug 22, 2024
    • Hitachi High-Tech Corporation
    • Shunsuke SASAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS SYSTEM
    • Publication number 20240027485
    • Publication date Jan 25, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Nobuya FUKUDA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analyzer, Recommended Action Notification System, and Rec...
    • Publication number 20230375580
    • Publication date Nov 23, 2023
    • Hitachi High-Tech Corporation
    • Aika NAKAJIMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20230341426
    • Publication date Oct 26, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Yusuke MIZUKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20230228777
    • Publication date Jul 20, 2023
    • HITACH HIGH-TECH CORPORATION
    • Shunsuke Sasaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analysis System
    • Publication number 20230123687
    • Publication date Apr 20, 2023
    • Hitachi High-Tech Corporation
    • Shigeru YANO
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analyzer
    • Publication number 20230067353
    • Publication date Mar 2, 2023
    • Hitachi High-Tech Corporation
    • Yuki YOKOTA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND CONTROL PROGRAM FOR AUTOMATIC ANALYZER
    • Publication number 20230010798
    • Publication date Jan 12, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Yuichiro OTA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20220146540
    • Publication date May 12, 2022
    • Hitachi High-Tech Corporation
    • Kazuhiro NODA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND MAINTENANCE SUPPORT METHOD
    • Publication number 20210341503
    • Publication date Nov 4, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Marina NAKAI
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    AUTOMATIC ANALYSIS SYSTEM
    • Publication number 20210270858
    • Publication date Sep 2, 2021
    • Hitachi High-Tech Corporation
    • Kenta Imai
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analyzer
    • Publication number 20210215728
    • Publication date Jul 15, 2021
    • Hitachi High-Tech Corporation
    • Hiroya UMEKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20200278367
    • Publication date Sep 3, 2020
    • Hitachi High-Technologies Corporation
    • Kenta IMAI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20200249249
    • Publication date Aug 6, 2020
    • Hitachi High-Technologies Corporation
    • Hiroya UMEKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20200241029
    • Publication date Jul 30, 2020
    • Hitachi High-Technologies Corporation
    • Kenta IMAI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND ANALYSIS METHOD
    • Publication number 20200240981
    • Publication date Jul 30, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Tatsuki TAKAKURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20190361041
    • Publication date Nov 28, 2019
    • Hitachi High-Technologies Corporation
    • Shunsuke SASAKI
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20190351419
    • Publication date Nov 21, 2019
    • Hitachi High-Technologies Corporation
    • Hiroki FUJITA
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    Automatic Analysis Device
    • Publication number 20190204346
    • Publication date Jul 4, 2019
    • Hitachi High-Technologies Corporation
    • Daisuke EBIHARA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20180246133
    • Publication date Aug 30, 2018
    • Hitachi High-Technologies Corporation
    • Kenta IMAI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automated Analyzer and Automated Analysis System
    • Publication number 20180224474
    • Publication date Aug 9, 2018
    • Hitachi High-Technologies Corporation
    • Shunsuke SASAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    DETECTION DEVICE FOR LUMINESCENCE ANALYSIS AND AUTOMATED ANALYZER
    • Publication number 20180188181
    • Publication date Jul 5, 2018
    • Hitachi High-Technologies Corporation
    • Shunichiro NOBUKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER AND LIQUID RESERVOIR
    • Publication number 20180011121
    • Publication date Jan 11, 2018
    • Hitachi High-Technologies Corporation
    • Reika KURODA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS APPARATUS
    • Publication number 20160334428
    • Publication date Nov 17, 2016
    • Hitachi High-Technologies Corporation
    • Kenta IMAI
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTRODE FOR ELECTROCHEMICAL MEASUREMENT, ELECTROLYSIS CELL FOR EL...
    • Publication number 20160077035
    • Publication date Mar 17, 2016
    • Hitachi High-Technologies Corporation
    • Hiroshi KANEMOTO
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20160061831
    • Publication date Mar 3, 2016
    • Roche Diagnostics Operations, Inc.
    • Shunichiro Nobuki
    • G01 - MEASURING TESTING