Kevin Duesman

Person

Boise, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor devices with package-level configurability
- Patent number 11,848,323
- Issue date Dec 19, 2023
- Micron Technology, Inc.
- James E. Davis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor devices having 3-dimensional inductive structures
- Patent number 11,508,657
- Issue date Nov 22, 2022
- Micron Technology, Inc.
- James E. Davis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor devices with through silicon vias and package-level c...
- Patent number 11,056,467
- Issue date Jul 6, 2021
- Micron Technology, Inc.
- Kevin G. Duesman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor devices with package-level configurability
- Patent number 10,930,645
- Issue date Feb 23, 2021
- Micron Technology, Inc.
- James E. Davis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor devices with package-level configurability
- Patent number 10,867,991
- Issue date Dec 15, 2020
- Micron Technology, Inc.
- Kevin G. Duesman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor devices with post-probe configurability
- Patent number 10,811,372
- Issue date Oct 20, 2020
- Micron Technology, Inc.
- James E. Davis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor devices having 3-dimensional inductive structures
- Patent number 10,784,192
- Issue date Sep 22, 2020
- Micron Technology, Inc.
- James E. Davis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor devices with package-level configurability
- Patent number 10,580,767
- Issue date Mar 3, 2020
- Micron Technology, Inc.
- James E. Davis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor devices with through silicon vias and package-level c...
- Patent number 10,483,241
- Issue date Nov 19, 2019
- Micron Technology, Inc.
- Kevin G. Duesman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for reducing capacitance of input/output pins...
- Patent number 10,453,829
- Issue date Oct 22, 2019
- Intel Corporation
- Merri Lyn Carlson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor devices with post-probe configurability
- Patent number 10,403,585
- Issue date Sep 3, 2019
- Micron Technology, Inc.
- James E. Davis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor devices with package-level configurability
- Patent number 10,312,232
- Issue date Jun 4, 2019
- Micron Technology, Inc.
- James E. Davis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor devices with post-probe configurability
- Patent number 10,283,462
- Issue date May 7, 2019
- Micron Technology, Inc.
- James E. Davis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor devices with package-level configurability
- Patent number 10,128,229
- Issue date Nov 13, 2018
- Micron Technology, Inc.
- James E. Davis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Recessed access device for a memory
- Patent number 8,541,836
- Issue date Sep 24, 2013
- Micron Technology, Inc.
- Kurt D. Beigel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Random access memory device utilizing a vertically oriented select...
- Patent number 8,431,980
- Issue date Apr 30, 2013
- Micron Technology, Inc.
- Thomas W. Voshell
- G11 - INFORMATION STORAGE
Information Patent Grant
Recessed access device for a memory
- Patent number 8,319,280
- Issue date Nov 27, 2012
- Micron Technology, Inc.
- Kurt D. Beigel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Recessed access device for a memory
- Patent number 8,035,160
- Issue date Oct 11, 2011
- Micron Technology, Inc.
- Kurt D. Beigel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Random access memory device utilizing a vertically oriented select...
- Patent number 7,777,264
- Issue date Aug 17, 2010
- Micron Technology, Inc.
- Thomas W. Voshell
- G11 - INFORMATION STORAGE
Information Patent Grant
Device and method for testing integrated circuit dice in an integra...
- Patent number 7,730,372
- Issue date Jun 1, 2010
- Micron Technology, Inc.
- Warren M. Farnworth
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for automated testing of the modulation transfer function in...
- Patent number 7,646,016
- Issue date Jan 12, 2010
- Micron Technology, Inc.
- Kevin Duesman
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Recessed access device for a memory
- Patent number 7,645,671
- Issue date Jan 12, 2010
- Micron Technology, Inc.
- Kurt D. Beigel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method for testing integrated circuit dice in an integra...
- Patent number 7,519,881
- Issue date Apr 14, 2009
- Micron Technology, Inc.
- Warren M. Farnworth
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus for photolithographic processing
- Patent number 7,375,793
- Issue date May 20, 2008
- Micron Technology, Inc.
- Kevin Duesman
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Apparatus and method to reduce undesirable effects caused by a faul...
- Patent number 7,336,522
- Issue date Feb 26, 2008
- Micron Technology, Inc.
- Scott J. Derner
- G11 - INFORMATION STORAGE
Information Patent Grant
Annular gate and technique for fabricating an annular gate
- Patent number 7,276,754
- Issue date Oct 2, 2007
- Micron Technology, Inc.
- Lucien J. Bissey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for automated testing of the modulation transfer function in...
- Patent number 7,215,361
- Issue date May 8, 2007
- Micron Technology, Inc.
- Kevin Duesman
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Dynamic integrated circuit clusters, modules including same and met...
- Patent number 7,208,758
- Issue date Apr 24, 2007
- Micron Technology, Inc.
- Aron T. Lunde
- G11 - INFORMATION STORAGE
Information Patent Grant
Random access memory device utilizing a vertically oriented select...
- Patent number 7,205,598
- Issue date Apr 17, 2007
- Micron Technology, Inc.
- Thomas W. Voshell
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and method to reduce undesirable effects caused by a faul...
- Patent number 7,142,446
- Issue date Nov 28, 2006
- Micron Technology, Inc.
- Scott J. Derner
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICES WITH PACKAGE-LEVEL CONFIGURABILITY
- Publication number 20210175228
- Publication date Jun 10, 2021
- Micron Technology, Inc.
- James E. Davis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES HAVING 3-DIMENSIONAL INDUCTIVE STRUCTURES
- Publication number 20200373238
- Publication date Nov 26, 2020
- Micron Technology, Inc.
- James E. Davis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES WITH PACKAGE-LEVEL CONFIGURABILITY
- Publication number 20200212032
- Publication date Jul 2, 2020
- Micron Technology, Inc.
- Kevin G. Duesman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES WITH PACKAGE-LEVEL CONFIGURABILITY
- Publication number 20200152620
- Publication date May 14, 2020
- Micron Technology, Inc.
- James E. Davis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES HAVING 3-DIMENSIONAL INDUCTIVE STRUCTURES
- Publication number 20200144182
- Publication date May 7, 2020
- Micron Technology, Inc.
- James E. Davis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES WITH THROUGH SILICON VIAS AND PACKAGE-LEVEL C...
- Publication number 20200035650
- Publication date Jan 30, 2020
- Micron Technology, Inc.
- Kevin G. Duesman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES WITH POST-PROBE CONFIGURABILITY
- Publication number 20190273052
- Publication date Sep 5, 2019
- Micron Technology, Inc.
- James E. Davis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES WITH PACKAGE-LEVEL CONFIGURABILITY
- Publication number 20190148359
- Publication date May 16, 2019
- Micron Technology, Inc.
- James E. Davis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES WITH POST-PROBE CONFIGURABILITY
- Publication number 20190148314
- Publication date May 16, 2019
- Micron Technology, Inc.
- James E. Davis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICES WITH PACKAGE-LEVEL CONFIGURABILITY
- Publication number 20190148358
- Publication date May 16, 2019
- Micron Technology, Inc.
- James E. Davis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR REDUCING CAPACITANCE OF INPUT/OUTPUT PINS...
- Publication number 20180366453
- Publication date Dec 20, 2018
- Intel Corporation
- Merri Lyn Carlson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Recessed Access Device for a Memory
- Publication number 20130062678
- Publication date Mar 14, 2013
- Micron Technology, Inc.
- Kurt D. Beigel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Recessed Access Device for a Memory
- Publication number 20120001245
- Publication date Jan 5, 2012
- Micron Technology, Inc.
- Kurt D. Beigel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RANDOM ACCESS MEMORY DEVICE UTILIZING A VERTICALLY ORIENTED SELECT...
- Publication number 20100276742
- Publication date Nov 4, 2010
- Thomas W. Voshell
- G11 - INFORMATION STORAGE
Information Patent Application
Recessed Access Device For A Memory
- Publication number 20100072532
- Publication date Mar 25, 2010
- Micron Technology, Inc.
- Kurt D. Beigel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICE AND METHOD FOR TESTING INTEGRATED CIRCUIT DICE IN AN INTEGRA...
- Publication number 20090027076
- Publication date Jan 29, 2009
- Micron Technology, Inc.
- Warren M. Farnworth
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Recessed access device for a memory
- Publication number 20080113478
- Publication date May 15, 2008
- Micron Technology, Inc.
- Kurt D. Beigel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Random access memory device utilizing a vertically oriented select...
- Publication number 20070145464
- Publication date Jun 28, 2007
- Thomas W. Voshell
- G11 - INFORMATION STORAGE
Information Patent Application
Apparatus and method to reduce undesirable effects caused by a faul...
- Publication number 20060256630
- Publication date Nov 16, 2006
- Scott J. Derner
- G11 - INFORMATION STORAGE
Information Patent Application
Device and method for testing integrated circuit dice in an integra...
- Publication number 20060244473
- Publication date Nov 2, 2006
- Warren M. Farnworth
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method for automated testing of the modulation transfer function in...
- Publication number 20060237755
- Publication date Oct 26, 2006
- Kevin Duesman
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Programmed material consolidation systems employing object release...
- Publication number 20060231025
- Publication date Oct 19, 2006
- Warren M. Farnworth
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
Processes for facilitating removel of fabricated objects from plate...
- Publication number 20060226578
- Publication date Oct 12, 2006
- Warren M. Farnworth
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
Annular gate and technique for fabricating an annular gate
- Publication number 20060118846
- Publication date Jun 8, 2006
- Micron Technology, Inc.
- Lucien J. Bissey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus and method to reduce undesirable effects caused by a faul...
- Publication number 20060023493
- Publication date Feb 2, 2006
- Scott J. Derner
- G11 - INFORMATION STORAGE
Information Patent Application
Dynamic integrated circuit clusters, modules including same and met...
- Publication number 20050056945
- Publication date Mar 17, 2005
- Aron T. Lunde
- G11 - INFORMATION STORAGE
Information Patent Application
Dynamic integrated circuit clusters, modules including same and met...
- Publication number 20050059175
- Publication date Mar 17, 2005
- Aron T. Lunde
- G11 - INFORMATION STORAGE
Information Patent Application
Processes for facilitating removal of stereolithographically fabric...
- Publication number 20050058837
- Publication date Mar 17, 2005
- Warren M. Farnworth
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
Method for automated testing of the modulation transfer function in...
- Publication number 20050057655
- Publication date Mar 17, 2005
- Kevin Duesman
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Programmable conductor random access memory and method for sensing...
- Publication number 20050018493
- Publication date Jan 27, 2005
- Stephen L. Casper
- G11 - INFORMATION STORAGE

Kevin Duesman

Person

Patents Grantslast 30 patents

Semiconductor devices with package-level configurability

Semiconductor devices having 3-dimensional inductive structures

Semiconductor devices with through silicon vias and package-level c...

Semiconductor devices with package-level configurability

Semiconductor devices with package-level configurability

Semiconductor devices with post-probe configurability

Semiconductor devices having 3-dimensional inductive structures

Semiconductor devices with package-level configurability

Semiconductor devices with through silicon vias and package-level c...

Method and apparatus for reducing capacitance of input/output pins...

Semiconductor devices with post-probe configurability

Semiconductor devices with package-level configurability

Semiconductor devices with post-probe configurability

Semiconductor devices with package-level configurability

Recessed access device for a memory

Random access memory device utilizing a vertically oriented select...

Recessed access device for a memory

Recessed access device for a memory

Random access memory device utilizing a vertically oriented select...

Device and method for testing integrated circuit dice in an integra...

Method for automated testing of the modulation transfer function in...

Recessed access device for a memory

Device and method for testing integrated circuit dice in an integra...

Apparatus for photolithographic processing

Apparatus and method to reduce undesirable effects caused by a faul...

Annular gate and technique for fabricating an annular gate

Method for automated testing of the modulation transfer function in...

Dynamic integrated circuit clusters, modules including same and met...

Random access memory device utilizing a vertically oriented select...

Apparatus and method to reduce undesirable effects caused by a faul...

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICES WITH PACKAGE-LEVEL CONFIGURABILITY

SEMICONDUCTOR DEVICES HAVING 3-DIMENSIONAL INDUCTIVE STRUCTURES

SEMICONDUCTOR DEVICES WITH PACKAGE-LEVEL CONFIGURABILITY

SEMICONDUCTOR DEVICES WITH PACKAGE-LEVEL CONFIGURABILITY

SEMICONDUCTOR DEVICES HAVING 3-DIMENSIONAL INDUCTIVE STRUCTURES

SEMICONDUCTOR DEVICES WITH THROUGH SILICON VIAS AND PACKAGE-LEVEL C...

SEMICONDUCTOR DEVICES WITH POST-PROBE CONFIGURABILITY

SEMICONDUCTOR DEVICES WITH PACKAGE-LEVEL CONFIGURABILITY

SEMICONDUCTOR DEVICES WITH POST-PROBE CONFIGURABILITY

SEMICONDUCTOR DEVICES WITH PACKAGE-LEVEL CONFIGURABILITY

METHOD AND APPARATUS FOR REDUCING CAPACITANCE OF INPUT/OUTPUT PINS...

Recessed Access Device for a Memory

Recessed Access Device for a Memory

RANDOM ACCESS MEMORY DEVICE UTILIZING A VERTICALLY ORIENTED SELECT...

Recessed Access Device For A Memory

DEVICE AND METHOD FOR TESTING INTEGRATED CIRCUIT DICE IN AN INTEGRA...

Recessed access device for a memory

Random access memory device utilizing a vertically oriented select...

Apparatus and method to reduce undesirable effects caused by a faul...

Device and method for testing integrated circuit dice in an integra...

Method for automated testing of the modulation transfer function in...

Programmed material consolidation systems employing object release...

Processes for facilitating removel of fabricated objects from plate...

Annular gate and technique for fabricating an annular gate

Apparatus and method to reduce undesirable effects caused by a faul...

Dynamic integrated circuit clusters, modules including same and met...

Dynamic integrated circuit clusters, modules including same and met...

Processes for facilitating removal of stereolithographically fabric...

Method for automated testing of the modulation transfer function in...

Programmable conductor random access memory and method for sensing...