Kim M. Pierce

Person

Meridian, ID, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for checking the resistance of programmable el...
- Patent number 6,983,404
- Issue date Jan 3, 2006
- Micron Technology, Inc.
- Douglas J. Cutter
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit having compression circuitry for c...
- Patent number 6,665,827
- Issue date Dec 16, 2003
- Micron Technology, Inc.
- Roland Ochoa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit having compression circuitry for c...
- Patent number 6,546,512
- Issue date Apr 8, 2003
- Micron Technology, Inc.
- Roland Ochoa
- G01 - MEASURING TESTING
Information Patent Grant
On-chip circuit and method for testing memory devices
- Patent number 6,536,004
- Issue date Mar 18, 2003
- Micron Technology, Inc.
- Kim M. Pierce
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for storage of test results within an integrat...
- Patent number 6,365,421
- Issue date Apr 2, 2002
- Micron Technology, Inc.
- Brett Debenham
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit having compression circuitry for c...
- Patent number 6,314,538
- Issue date Nov 6, 2001
- Micron Technology, Inc.
- Roland Ochoa
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for storage of test results within an integrat...
- Patent number 6,194,738
- Issue date Feb 27, 2001
- Micron Technology, Inc.
- Brett Debenham
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for checking the resistance of programmable el...
- Patent number 6,185,705
- Issue date Feb 6, 2001
- Micron Technology, Inc.
- Douglas J. Cutter
- G11 - INFORMATION STORAGE
Information Patent Grant
On-chip circuit and method for testing memory devices
- Patent number 6,178,532
- Issue date Jan 23, 2001
- Micron Technology, Inc.
- Kim M. Pierce
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for reducing antifuse programming time
- Patent number 6,154,410
- Issue date Nov 28, 2000
- Micron Technology, Inc.
- Douglas J. Cutter
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for checking the resistance of programmable el...
- Patent number 5,982,656
- Issue date Nov 9, 1999
- Micron Technology, Inc.
- Douglas J. Cutter
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for memory array compressed data testing
- Patent number 5,935,263
- Issue date Aug 10, 1999
- Micron Technology, Inc.
- Brent Keeth
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit having compression circuitry for c...
- Patent number 5,864,565
- Issue date Jan 26, 1999
- Micron Technology, Inc.
- Roland Ochoa
- G01 - MEASURING TESTING
Information Patent Grant
Self current limiting antifuse circuit
- Patent number 5,706,238
- Issue date Jan 6, 1998
- Micron Technology, Inc.
- Douglas J. Cutter
- G11 - INFORMATION STORAGE
Information Patent Grant
Self current limiting antifuse circuit
- Patent number 5,631,862
- Issue date May 20, 1997
- Micron Technology, Inc.
- Douglas J. Cutter
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for checking the resistance of programmable el...
- Publication number 20050005208
- Publication date Jan 6, 2005
- Douglas J. Cutter
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor integrated circuit having compression circuitry for c...
- Publication number 20030110428
- Publication date Jun 12, 2003
- Roland Ochoa
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for storage of test results within an integrat...
- Publication number 20020006676
- Publication date Jan 17, 2002
- Brett Debenham
- G01 - MEASURING TESTING
Information Patent Application
On-chip circuit and method for testing memory devices
- Publication number 20010013110
- Publication date Aug 9, 2001
- Kim M. Pierce
- G11 - INFORMATION STORAGE

Kim M. Pierce

Person

Patents Grantslast 30 patents

Method and apparatus for checking the resistance of programmable el...

Semiconductor integrated circuit having compression circuitry for c...

Semiconductor integrated circuit having compression circuitry for c...

On-chip circuit and method for testing memory devices

Method and apparatus for storage of test results within an integrat...

Semiconductor integrated circuit having compression circuitry for c...

Method and apparatus for storage of test results within an integrat...

Method and apparatus for checking the resistance of programmable el...

On-chip circuit and method for testing memory devices

Method and apparatus for reducing antifuse programming time

Method and apparatus for checking the resistance of programmable el...

Method and apparatus for memory array compressed data testing

Semiconductor integrated circuit having compression circuitry for c...

Self current limiting antifuse circuit

Self current limiting antifuse circuit

Patents Applicationslast 30 patents

Method and apparatus for checking the resistance of programmable el...

Semiconductor integrated circuit having compression circuitry for c...

Method and apparatus for storage of test results within an integrat...

On-chip circuit and method for testing memory devices