Kimio Muramatsu

Person

Takasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Inspection data analyzing system
- Patent number 6,628,817
- Issue date Sep 30, 2003
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection data analyzing system
- Patent number 6,529,619
- Issue date Mar 4, 2003
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection data analyzing system
- Patent number 6,339,653
- Issue date Jan 15, 2002
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection data analyzing system
- Patent number 6,330,352
- Issue date Dec 11, 2001
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and method using separate processors for processi...
- Patent number 6,185,322
- Issue date Feb 6, 2001
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection data analyzing system
- Patent number 5,841,893
- Issue date Nov 24, 1998
- Hitachi, Ltd.
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Vacuum system with a secondary gas also connected to the roughing p...
- Patent number 5,062,771
- Issue date Nov 5, 1991
- Hitachi, Ltd.
- Akihiko Satou
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Vacuum pump
- Patent number 4,904,155
- Issue date Feb 27, 1990
- Hitachi, Ltd.
- Takashi Nagaoka
- F04 - POSITIVE DISPLACEMENT MACHINES FOR LIQUIDS PUMPS FOR LIQUIDS OR ELASTIC...
Information Patent Grant
Method for LPCVD of semiconductors using oil free vacuum pumps
- Patent number 4,835,114
- Issue date May 30, 1989
- Hitachi, Ltd.
- Akihiko Satou
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
Inspection data analyzing system
- Publication number 20020034326
- Publication date Mar 21, 2002
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Application
Inspection data analyzing system
- Publication number 20010038708
- Publication date Nov 8, 2001
- Seiji Ishikawa
- G01 - MEASURING TESTING
Information Patent Application
Inspection data analyzing system
- Publication number 20010001015
- Publication date May 10, 2001
- Seiji Ishikawa
- G01 - MEASURING TESTING

Kimio Muramatsu

Person

Patents Grantslast 30 patents

Inspection data analyzing system

Inspection data analyzing system

Inspection data analyzing system

Inspection data analyzing system

Inspection system and method using separate processors for processi...

Inspection data analyzing system

Vacuum system with a secondary gas also connected to the roughing p...

Vacuum pump

Method for LPCVD of semiconductors using oil free vacuum pumps

Patents Applicationslast 30 patents

Inspection data analyzing system

Inspection data analyzing system

Inspection data analyzing system