Kinya Kobayashi

Person

Hitachi-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Calculation method of switching waveform of the inverter and circui...
- Patent number 10,318,679
- Issue date Jun 11, 2019
- Hitachi, Ltd.
- Kazutami Tago
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electron beam irradiation method and scanning electronic microscope
- Patent number 9,257,259
- Issue date Feb 9, 2016
- Hitachi High-Technologies Corporation
- Kinya Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetic gear mechanism including a plurality of rotors or stators
- Patent number 9,143,025
- Issue date Sep 22, 2015
- Hitachi, Ltd.
- Norihisa Iwasaki
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Totally enclosed motor
- Patent number 8,502,425
- Issue date Aug 6, 2013
- Hitachi, Ltd.
- Hironori Matsumoto
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Mass spectrometer system
- Patent number 7,932,486
- Issue date Apr 26, 2011
- Hitachi High-Technologies Corporation
- Akihiro Sano
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometric method, mass spectrometric system, diagnosis sys...
- Patent number 7,595,484
- Issue date Sep 29, 2009
- Hitachi High-Technologies Corp.
- Toshiyuki Yokosuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tandem type mass analysis system and method
- Patent number 7,544,930
- Issue date Jun 9, 2009
- Hitachi High-Technologies Corporation
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of identifying substances using mass spectrometry
- Patent number 7,538,321
- Issue date May 26, 2009
- Hitachi High-Technologies Corporation
- Masako Ishimaru
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mass analysis method and mass analysis apparatus
- Patent number 7,485,852
- Issue date Feb 3, 2009
- Hitachi High-Technologies Corporation
- Hiromichi Yamashita
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometer system
- Patent number 7,473,892
- Issue date Jan 6, 2009
- Hitachi High-Technologies Corporation
- Akihiro Sano
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometric analysis method and system using the method
- Patent number 7,435,949
- Issue date Oct 14, 2008
- Hitachi High-Technologies Corporation
- Atsushi Ohtake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometric method and mass spectrometric system
- Patent number 7,332,713
- Issue date Feb 19, 2008
- Hitachi, Ltd.
- Kiyomi Yoshinari
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometry and mass spectrometry system
- Patent number 7,180,056
- Issue date Feb 20, 2007
- Hitachi, Ltd.
- Atsushi Ohtake
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometric data analyzing method, mass spectrometric data a...
- Patent number 7,158,893
- Issue date Jan 2, 2007
- Hitachi, Ltd.
- Kiyomi Yoshinari
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mass spectrometry system
- Patent number 7,126,113
- Issue date Oct 24, 2006
- Hitachi High-Technologies Corporation
- Toshiyuki Yokosuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for analyzing compound structure
- Patent number 6,957,159
- Issue date Oct 18, 2005
- Hitachi Ltd.
- Kinya Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analysis method of film thickness distribution and design system of...
- Patent number 6,926,816
- Issue date Aug 9, 2005
- Hitachi, Ltd.
- Akihiro Sano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mass spectrum analyzing system
- Patent number 6,917,037
- Issue date Jul 12, 2005
- Hitachi High-Technologies Corporation
- Atsushi Ootake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for analyzing mass spectrometric data
- Patent number 6,914,239
- Issue date Jul 5, 2005
- Hitachi, Ltd.
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometric data analyzing method, mass spectrometric data a...
- Patent number 6,907,352
- Issue date Jun 14, 2005
- Hitachi, Ltd.
- Kiyomi Yoshinari
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for assessing surface uniformity of semiconductor...
- Patent number 6,806,098
- Issue date Oct 19, 2004
- Hitachi, Ltd.
- Atsushi Ohtake
- B24 - GRINDING POLISHING
Information Patent Grant
Mass spectrometric data analyzing method, mass spectrometric data a...
- Patent number 6,745,134
- Issue date Jun 1, 2004
- Hitachi, Ltd.
- Kinya Kobayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Plating method using an additive
- Patent number 6,511,588
- Issue date Jan 28, 2003
- Hitachi, Ltd.
- Kinya Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ELECTRICAL INSULATING MATERIAL FOR HIGH VOLTAGE EQUIPMENT
- Publication number 20190085227
- Publication date Mar 21, 2019
- Hitachi, Ltd
- Kinya KOBAYASHI
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
Calculation Method of Switching Waveform of the Inverter and Circui...
- Publication number 20160171139
- Publication date Jun 16, 2016
- Hitachi, Ltd
- Kazutami TAGO
- G01 - MEASURING TESTING
Information Patent Application
Molded Transformer
- Publication number 20150270048
- Publication date Sep 24, 2015
- Hitachi Industrial Equipment Systems Co., Ltd.
- Kinya KOBAYASHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Resin Composition for Electric Insulation and Its Hardened Products...
- Publication number 20150069877
- Publication date Mar 12, 2015
- Mitsubishi Hitachi Power Systems, Ltd.
- Takuya OTOWA
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
RESIN-MOLDED ROTATING MACHINE
- Publication number 20140183984
- Publication date Jul 3, 2014
- Kinya Kobayashi
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
ELECTRON BEAM IRRADIATION METHOD AND SCANNING ELECTRONIC MICROSCOPE
- Publication number 20130187045
- Publication date Jul 25, 2013
- Hitachi High-Technologies Corporation
- Kinya Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETIC GEAR MECHANISM
- Publication number 20130002076
- Publication date Jan 3, 2013
- Hitachi, Ltd
- Norihisa Iwasaki
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
TOTALLY ENCLOSED MOTOR
- Publication number 20110181138
- Publication date Jul 28, 2011
- Hironori MATSUMOTO
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
Punch die for powder compacting, powder compacting equipment equipp...
- Publication number 20110076175
- Publication date Mar 31, 2011
- Hitachi, Ltd.
- Hirooki Tokoi
- B22 - CASTING POWDER METALLURGY
Information Patent Application
MASS SPECTROMETER SYSTEM
- Publication number 20090189063
- Publication date Jul 30, 2009
- Akihiro Sano
- G01 - MEASURING TESTING
Information Patent Application
CORE ROD FOR FORMING A CYLINDRICAL GREEN COMPACT, APPARATUS FOR FOR...
- Publication number 20080267807
- Publication date Oct 30, 2008
- Kinya KOBAYASHI
- B28 - WORKING CEMENT, CLAY, OR STONE
Information Patent Application
Image display apparatus
- Publication number 20070222362
- Publication date Sep 27, 2007
- Yuichi Sawai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass analysis system
- Publication number 20070221836
- Publication date Sep 27, 2007
- Kinya Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TANDEM TYPE MASS ANALYSIS SYSTEM AND METHOD
- Publication number 20070187588
- Publication date Aug 16, 2007
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometric analysis method and system using the method
- Publication number 20060289735
- Publication date Dec 28, 2006
- Atsushi Ohtake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass analysis method and mass analysis apparatus
- Publication number 20060289736
- Publication date Dec 28, 2006
- Hitachi High-Technologies Corporation
- Hiromichi Yamashita
- G01 - MEASURING TESTING
Information Patent Application
Method of identifying substances using mass spectrometry
- Publication number 20060255263
- Publication date Nov 16, 2006
- Masako Ishimaru
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Mass spectrometric method, mass spectrometric system, diagnosis sys...
- Publication number 20060169889
- Publication date Aug 3, 2006
- Toshiyuki Yokosuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometric method and mass spectrometric system
- Publication number 20060043281
- Publication date Mar 2, 2006
- Kiyomi Yoshinari
- G01 - MEASURING TESTING
Information Patent Application
Mass spectrometry and mass spectrometry system
- Publication number 20050274884
- Publication date Dec 15, 2005
- Atsushi Otake
- G01 - MEASURING TESTING
Information Patent Application
Mass spectrometry system
- Publication number 20050184232
- Publication date Aug 25, 2005
- Toshiyuki Yokosuka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrometric data analyzing method, mass spectrometric data a...
- Publication number 20050139761
- Publication date Jun 30, 2005
- Kiyomi Yoshinari
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Mass spectrometer system
- Publication number 20050063864
- Publication date Mar 24, 2005
- Akihiro Sano
- G01 - MEASURING TESTING
Information Patent Application
System for analyzing mass spectrometric data
- Publication number 20040181347
- Publication date Sep 16, 2004
- HITACHI LTD.
- Kiyomi Yoshinari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass spectrum analyzing system
- Publication number 20040169138
- Publication date Sep 2, 2004
- Atsushi Ootake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System for analyzing compound structure
- Publication number 20040111228
- Publication date Jun 10, 2004
- Hitachi, Ltd.
- Kinya Kobayashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Valve-encased nozzle device and liquid handling device
- Publication number 20040050974
- Publication date Mar 18, 2004
- Chahn Lee
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Mass spectrometric data analyzing method, mass spectrometric data a...
- Publication number 20030236636
- Publication date Dec 25, 2003
- Kiyomi Yoshinari
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Mass spectrometric data analyzing method, mass spectrometric data a...
- Publication number 20030236634
- Publication date Dec 25, 2003
- Kiyomi Yoshinari
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and device for inspecting surface of semiconductor device
- Publication number 20030207576
- Publication date Nov 6, 2003
- Hitachi, Ltd.
- Atsushi Ohtake
- B24 - GRINDING POLISHING

Kinya Kobayashi

Person

Patents Grantslast 30 patents

Calculation method of switching waveform of the inverter and circui...

Electron beam irradiation method and scanning electronic microscope

Magnetic gear mechanism including a plurality of rotors or stators

Totally enclosed motor

Mass spectrometer system

Mass spectrometric method, mass spectrometric system, diagnosis sys...

Tandem type mass analysis system and method

Method of identifying substances using mass spectrometry

Mass analysis method and mass analysis apparatus

Mass spectrometer system

Mass spectrometric analysis method and system using the method

Mass spectrometric method and mass spectrometric system

Mass spectrometry and mass spectrometry system

Mass spectrometric data analyzing method, mass spectrometric data a...

Mass spectrometry system

System for analyzing compound structure

Analysis method of film thickness distribution and design system of...

Mass spectrum analyzing system

System for analyzing mass spectrometric data

Mass spectrometric data analyzing method, mass spectrometric data a...

Method and device for assessing surface uniformity of semiconductor...

Mass spectrometric data analyzing method, mass spectrometric data a...

Plating method using an additive

Patents Applicationslast 30 patents

ELECTRICAL INSULATING MATERIAL FOR HIGH VOLTAGE EQUIPMENT

Calculation Method of Switching Waveform of the Inverter and Circui...

Molded Transformer

Resin Composition for Electric Insulation and Its Hardened Products...

RESIN-MOLDED ROTATING MACHINE

ELECTRON BEAM IRRADIATION METHOD AND SCANNING ELECTRONIC MICROSCOPE

MAGNETIC GEAR MECHANISM

TOTALLY ENCLOSED MOTOR

Punch die for powder compacting, powder compacting equipment equipp...

MASS SPECTROMETER SYSTEM

CORE ROD FOR FORMING A CYLINDRICAL GREEN COMPACT, APPARATUS FOR FOR...

Image display apparatus

Mass analysis system

TANDEM TYPE MASS ANALYSIS SYSTEM AND METHOD

Mass spectrometric analysis method and system using the method

Mass analysis method and mass analysis apparatus

Method of identifying substances using mass spectrometry

Mass spectrometric method, mass spectrometric system, diagnosis sys...

Mass spectrometric method and mass spectrometric system

Mass spectrometry and mass spectrometry system

Mass spectrometry system

Mass spectrometric data analyzing method, mass spectrometric data a...

Mass spectrometer system

System for analyzing mass spectrometric data

Mass spectrum analyzing system

System for analyzing compound structure

Valve-encased nozzle device and liquid handling device

Mass spectrometric data analyzing method, mass spectrometric data a...

Mass spectrometric data analyzing method, mass spectrometric data a...

Method and device for inspecting surface of semiconductor device