Kinya YAMASHITA

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor test apparatus and semiconductor test method
- Patent number 11,624,767
- Issue date Apr 11, 2023
- Mitsubishi Electric Corporation
- Yasushi Takaki
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation apparatus including a plurality of insulating portions s...
- Patent number 10,539,607
- Issue date Jan 21, 2020
- Mitsubishi Electric Corporation
- Akira Okada
- G01 - MEASURING TESTING
Information Patent Grant
Evaluation apparatus and evaluation method
- Patent number 10,436,833
- Issue date Oct 8, 2019
- Mitsubishi Electric Corporation
- Akira Okada
- G05 - CONTROLLING REGULATING
Information Patent Grant
Semiconductor device and method for testing same
- Patent number 10,228,412
- Issue date Mar 12, 2019
- Mitsubishi Electric Corporation
- Hajime Akiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and electrical contact structure thereof
- Patent number 10,192,797
- Issue date Jan 29, 2019
- Mitsubishi Electric Corporation
- Hajime Akiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor evaluation apparatus and semiconductor evaluation method
- Patent number 9,720,014
- Issue date Aug 1, 2017
- Mitsubishi Electric Corporation
- Akira Okada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor evaluation apparatus
- Patent number 9,678,143
- Issue date Jun 13, 2017
- Mitsubishi Electric Corporation
- Akira Okada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device assessment apparatus
- Patent number 9,551,745
- Issue date Jan 24, 2017
- Mitsubishi Electric Corporation
- Hajime Akiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor testing jig and semiconductor testing method performe...
- Patent number 9,347,988
- Issue date May 24, 2016
- Mitsubishi Electric Corporation
- Hajime Akiyama
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor evaluating device and semiconductor evaluating method
- Patent number 9,335,371
- Issue date May 10, 2016
- Mitsubishi Electric Corporation
- Hajime Akiyama
- G01 - MEASURING TESTING
Information Patent Grant
Wafer suction method, wafer suction stage, and wafer suction system
- Patent number 9,312,160
- Issue date Apr 12, 2016
- Mitsubishi Electric Corporation
- Hajime Akiyama
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Semiconductor testing jig and transfer jig for the same
- Patent number 9,257,316
- Issue date Feb 9, 2016
- Mitsubishi Electric Corporation
- Akira Okada
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus
- Patent number 9,207,257
- Issue date Dec 8, 2015
- Mitsubishi Electric Corporation
- Akira Okada
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus
- Patent number 9,188,624
- Issue date Nov 17, 2015
- Mitsubishi Electric Corporation
- Akira Okada
- G01 - MEASURING TESTING
Information Patent Grant
Probe card
- Patent number 9,157,931
- Issue date Oct 13, 2015
- Mitsubishi Electric Corporation
- Akira Okada
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing semiconductor device
- Patent number 9,117,880
- Issue date Aug 25, 2015
- Mitsubishi Electric Corporation
- Hajime Akiyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test apparatus and test method
- Patent number 8,980,655
- Issue date Mar 17, 2015
- Mitsubishi Electric Corporation
- Akira Okada
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 8,981,805
- Issue date Mar 17, 2015
- Mitsubishi Electric Corporation
- Akira Okada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR MANUFACTURING APPARATUS
- Publication number 20240355664
- Publication date Oct 24, 2024
- Mitsubishi Electric Corporation
- Kinya YAMASHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR MANUFACTURING SEMICONDUCTOR DEVICE AND METHOD OF MANU...
- Publication number 20240178048
- Publication date May 30, 2024
- Mitsubishi Electric Corporation
- Yasushi TAKAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR MANUFACTURING APPARATUS
- Publication number 20230197476
- Publication date Jun 22, 2023
- Mitsubishi Electric Corporation
- Masaki UENO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR TEST APPARATUS AND SEMICONDUCTOR TEST METHOD
- Publication number 20220128616
- Publication date Apr 28, 2022
- Mitsubishi Electric Corporation
- Yasushi TAKAKI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR PICK-UP APPARATUS
- Publication number 20190109026
- Publication date Apr 11, 2019
- Mitsubishi Electric Corporation
- Kinya YAMASHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EVALUATION APPARATUS AND EVALUATION METHOD
- Publication number 20180180660
- Publication date Jun 28, 2018
- Mitsubishi Electric Corporation
- Akira OKADA
- G05 - CONTROLLING REGULATING
Information Patent Application
EVALUATION APPARATUS AND SEMICONDUCTOR DEVICE EVALUATION METHOD
- Publication number 20180088170
- Publication date Mar 29, 2018
- Mitsubishi Electric Corporation
- Akira OKADA
- G01 - MEASURING TESTING
Information Patent Application
CONTACT-PROBE TYPE TEMPERATURE DETECTOR, SEMICONDUCTOR DEVICE EVALU...
- Publication number 20160377486
- Publication date Dec 29, 2016
- Mitsubishi Electric Corporation
- Kinya YAMASHITA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20160343627
- Publication date Nov 24, 2016
- Mitsubishi Electric Corporation
- Hajime AKIYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR TESTING SAME
- Publication number 20160334458
- Publication date Nov 17, 2016
- Mitsubishi Electric Corporation
- Hajime AKIYAMA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR EVALUATION APPARATUS AND SEMICONDUCTOR EVALUATION METHOD
- Publication number 20160116501
- Publication date Apr 28, 2016
- Mitsubishi Electric Corporation
- Akira OKADA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR EVALUATION APPARATUS
- Publication number 20150115989
- Publication date Apr 30, 2015
- Mitsubishi Electric Corporation
- Akira OKADA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TESTING JIG AND TRANSFER JIG FOR THE SAME
- Publication number 20150091599
- Publication date Apr 2, 2015
- Mitsubishi Electric Corporation
- Akira OKADA
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20150044788
- Publication date Feb 12, 2015
- Mitsubishi Electric Corporation
- Akira OKADA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE ASSESSMENT APPARATUS
- Publication number 20140347081
- Publication date Nov 27, 2014
- Mitsubishi Electric Corporation
- Hajime AKIYAMA
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20140342544
- Publication date Nov 20, 2014
- Mitsubishi Electric Corporation
- Hajime AKIYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR EVALUATING DEVICE AND SEMICONDUCTOR EVALUATING METHOD
- Publication number 20140210500
- Publication date Jul 31, 2014
- Mitsubishi Electric Corporation
- Hajime AKIYAMA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS
- Publication number 20140015554
- Publication date Jan 16, 2014
- Mitsubishi Electric Corporation
- Akira OKADA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TESTING JIG AND SEMICONDUCTOR TESTING METHOD PERFORME...
- Publication number 20140009183
- Publication date Jan 9, 2014
- Mitsubishi Electric Corporation
- Hajime AKIYAMA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20130321015
- Publication date Dec 5, 2013
- Mitsubishi Electric Corporation
- Akira OKADA
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD
- Publication number 20130321019
- Publication date Dec 5, 2013
- Mitsubishi Electric Corporation
- Akira OKADA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS
- Publication number 20130285684
- Publication date Oct 31, 2013
- Akira OKADA
- G01 - MEASURING TESTING
Information Patent Application
WAFER SUCTION METHOD, WAFER SUCTION STAGE, AND WAFER SUCTION SYSTEM
- Publication number 20130256964
- Publication date Oct 3, 2013
- Mitsubishi Electric Corporation
- Hajime AKIYAMA
- H01 - BASIC ELECTRIC ELEMENTS

Kinya YAMASHITA

Person

Patents Grantslast 30 patents

Semiconductor test apparatus and semiconductor test method

Evaluation apparatus including a plurality of insulating portions s...

Evaluation apparatus and evaluation method

Semiconductor device and method for testing same

Semiconductor device and electrical contact structure thereof

Semiconductor evaluation apparatus and semiconductor evaluation method

Semiconductor evaluation apparatus

Semiconductor device assessment apparatus

Semiconductor testing jig and semiconductor testing method performe...

Semiconductor evaluating device and semiconductor evaluating method

Wafer suction method, wafer suction stage, and wafer suction system

Semiconductor testing jig and transfer jig for the same

Inspection apparatus

Inspection apparatus

Probe card

Method for manufacturing semiconductor device

Test apparatus and test method

Inspection apparatus and inspection method

Patents Applicationslast 30 patents

SEMICONDUCTOR MANUFACTURING APPARATUS

APPARATUS FOR MANUFACTURING SEMICONDUCTOR DEVICE AND METHOD OF MANU...

SEMICONDUCTOR MANUFACTURING APPARATUS

SEMICONDUCTOR TEST APPARATUS AND SEMICONDUCTOR TEST METHOD

SEMICONDUCTOR PICK-UP APPARATUS

EVALUATION APPARATUS AND EVALUATION METHOD

EVALUATION APPARATUS AND SEMICONDUCTOR DEVICE EVALUATION METHOD

CONTACT-PROBE TYPE TEMPERATURE DETECTOR, SEMICONDUCTOR DEVICE EVALU...

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND METHOD FOR TESTING SAME

SEMICONDUCTOR EVALUATION APPARATUS AND SEMICONDUCTOR EVALUATION METHOD

SEMICONDUCTOR EVALUATION APPARATUS

SEMICONDUCTOR TESTING JIG AND TRANSFER JIG FOR THE SAME

TEST APPARATUS AND TEST METHOD

SEMICONDUCTOR DEVICE ASSESSMENT APPARATUS

METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

SEMICONDUCTOR EVALUATING DEVICE AND SEMICONDUCTOR EVALUATING METHOD

INSPECTION APPARATUS

SEMICONDUCTOR TESTING JIG AND SEMICONDUCTOR TESTING METHOD PERFORME...

INSPECTION APPARATUS AND INSPECTION METHOD

PROBE CARD

INSPECTION APPARATUS

WAFER SUCTION METHOD, WAFER SUCTION STAGE, AND WAFER SUCTION SYSTEM