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Kirk Bertsche
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San Jose, CA, US
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Patents Grants
last 30 patents
Information
Patent Grant
Field replaceable, disposable, and thermally optimized X-ray target...
Patent number
11,785,699
Issue date
Oct 10, 2023
Accuray Incorporated
Mark Trail
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Field replaceable, disposable, and thermally optimized X-ray target...
Patent number
11,375,601
Issue date
Jun 28, 2022
Accuray Incorporated
Mark Trail
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Bremsstrahlung target for radiation therapy system
Patent number
11,114,269
Issue date
Sep 7, 2021
Accuray Incorporated
Kirk Joseph Bertsche
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Bremsstrahlung target for radiation therapy system
Patent number
10,636,609
Issue date
Apr 28, 2020
Accuray Incorporated
Kirk Joseph Bertsche
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Method and apparatus for inspecting a substrate
Patent number
9,529,279
Issue date
Dec 27, 2016
KLA-Tencor Corporation
David Adler
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Method and apparatus for inspecting a substrate
Patent number
9,170,503
Issue date
Oct 27, 2015
KLA-Tencor Corporation
David Adler
G01 - MEASURING TESTING
Information
Patent Grant
Inline inspection of photovoltaics for electrical defects
Patent number
8,427,185
Issue date
Apr 23, 2013
KLA-Tencor Corporation
George H. Zapalac
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Inline inspection of photovoltaics for electrical defects
Patent number
7,906,972
Issue date
Mar 15, 2011
KLA-Tencor Corporation
George H. Zapalac, Jr.
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Inline inspection of photovoltaics for electrical defects
Patent number
7,649,365
Issue date
Jan 19, 2010
KLA-Tencor Corporation
George H. Zapalac, Jr.
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Method for charging substrate to a potential
Patent number
7,507,959
Issue date
Mar 24, 2009
KLA-Tencor Technologies Corporation
Kirk J. Bertsche
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Electronically-variable immersion electrostatic lens
Patent number
7,446,320
Issue date
Nov 4, 2008
KLA-Tencor Technologies Corproation
Mark A. McCord
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Large-field scanning of charged particles
Patent number
7,394,069
Issue date
Jul 1, 2008
KLA-Tencor Technologies Corporation
Kirk J. Bertsche
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron imaging beam with reduced space charge defocusing
Patent number
7,391,034
Issue date
Jun 24, 2008
KLA-Tencor Technologies Corporation
Kirk J. Bertsche
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High-speed electron beam inspection
Patent number
7,315,022
Issue date
Jan 1, 2008
KLA-Tencor Technologies Corporation
David L. Adler
G01 - MEASURING TESTING
Information
Patent Grant
Defect detection using energy spectrometer
Patent number
7,276,694
Issue date
Oct 2, 2007
KLA-Tencor Technologies Corporation
Kirk J. Bertsche
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Charge-control pre-scanning for e-beam imaging
Patent number
7,253,410
Issue date
Aug 7, 2007
KLA-Tencor Technologies Corporation
Kirk J. Bertsche
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for charging substrate to a potential
Patent number
7,176,468
Issue date
Feb 13, 2007
KLA-Tencor Technologies Corporation
Kirk J. Bertsche
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Method and apparatus for inspecting a substrate
Patent number
7,171,038
Issue date
Jan 30, 2007
KLA-Tencor Technologies Corporation
David Adler
G01 - MEASURING TESTING
Information
Patent Grant
E-beam detection of defective contacts/vias with flooding and energ...
Patent number
7,019,292
Issue date
Mar 28, 2006
KLA-Tencor Technologies Corporation
Frank Y. H. Fan
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Maskless reflection electron beam projection lithography
Patent number
6,870,172
Issue date
Mar 22, 2005
KLA-Tencor Technologies Corporation
Marian Mankos
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ribbon electron beam for inspection system
Patent number
6,822,246
Issue date
Nov 23, 2004
KLA-Tencor Technologies Corporation
Kirk J. Bertsche
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Monolithic structure with asymmetric coupling
Patent number
6,646,383
Issue date
Nov 11, 2003
Siemens Medical Solutions USA, Inc.
Kirk Joseph Bertsche
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
X-ray target assembly and radiation therapy systems and methods
Patent number
6,487,274
Issue date
Nov 26, 2002
Siemens Medical Solutions USA, Inc.
Kirk Joseph Bertsche
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Variable energy linear accelerator
Patent number
6,407,505
Issue date
Jun 18, 2002
Siemens Medical Solutions USA, Inc.
Kirk Joseph Bertsche
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Patents Applications
last 30 patents
Information
Patent Application
FIELD REPLACABLE, DISPOSABLE, AND THERMALLY OPTIMIZED X-RAY TARGET...
Publication number
20220295624
Publication date
Sep 15, 2022
ACCURAY INCORPORATED
Mark Trail
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
FIELD REPLACABLE, DISPOSABLE, AND THERMALLY OPTIMIZED X-RAY TARGET...
Publication number
20220030695
Publication date
Jan 27, 2022
ACCURAY INCORPORATED
Mark Trail
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
BREMSSTRAHLUNG TARGET FOR RADIATION THERAPY SYSTEM
Publication number
20210375575
Publication date
Dec 2, 2021
ACCURAY INCORPORATED
Kirk Joseph Bertsche
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
BREMSSTRAHLUNG TARGET FOR RADIATION THERAPY SYSTEM
Publication number
20200219694
Publication date
Jul 9, 2020
ACCURAY INCORPORATED
Kirk Joseph Bertsche
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND APPARATUS FOR INSPECTING A SUBSTRATE
Publication number
20170074810
Publication date
Mar 16, 2017
KLA-Tencor Corporation
David L. ADLER
G01 - MEASURING TESTING
Information
Patent Application
INLINE INSPECTION OF PHOTOVOLTAICS FOR ELECTRICAL DEFECTS
Publication number
20110133750
Publication date
Jun 9, 2011
KLA-Tencor Corporation
George H. Zapalac, Jr.
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
INLINE INSPECTION OF PHOTOVOLTAICS FOR ELECTRICAL DEFECTS
Publication number
20100079147
Publication date
Apr 1, 2010
KLA-Tencor Corporation
George H. Zapalac, Jr.
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
Method and apparatus for inspecting a substrate
Publication number
20070230768
Publication date
Oct 4, 2007
KLA-Tencor Corporation
David Adler
G01 - MEASURING TESTING
Information
Patent Application
Method for charging substrate to a potential
Publication number
20070158589
Publication date
Jul 12, 2007
Kirk J. Bertsche
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
Method and apparatus for inspecting a substrate
Publication number
20070025610
Publication date
Feb 1, 2007
KLA-Tencor Corporation
David Adler
G01 - MEASURING TESTING
Information
Patent Application
Method for charging substrate to a potential
Publication number
20060054815
Publication date
Mar 16, 2006
Kirk J. Bertsche
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
Ribbon electron beam for inspection system
Publication number
20030183763
Publication date
Oct 2, 2003
Kirk J. Bertsche
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Monolithic structure with asymmetric coupling
Publication number
20020158575
Publication date
Oct 31, 2002
Siemens Medical Systems, Inc.
Kirk Joseph Bertsche
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
Method and apparatus for inspecting a substrate
Publication number
20020161534
Publication date
Oct 31, 2002
KLA-Tencor Corporation
David Adler
G01 - MEASURING TESTING
Information
Patent Application
X-ray target assembly and radiation therapy systems and methods
Publication number
20020101958
Publication date
Aug 1, 2002
Siemens Medical Systems, Inc.
Kirk Joseph Bertsche
H01 - BASIC ELECTRIC ELEMENTS