Kiyoshi Hasegawa

Person

Miyagi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Blood flow measurement device
- Patent number 12,127,824
- Issue date Oct 29, 2024
- NEU CORPORATION
- Takeshi Hoshino
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
System, method, and non-transitory computer readable medium for cal...
- Patent number 11,457,864
- Issue date Oct 4, 2022
- NEU CORPORATION
- Takusige Katura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Frozen fresh cream to be whipped, method for producing the frozen f...
- Patent number 9,339,046
- Issue date May 17, 2016
- Oriental Yeast Co., Ltd.
- Satoru Wakana
- A23 - FOODS OR FOODSTUFFS THEIR TREATMENT, NOT COVERED BY OTHER CLASSES
Information Patent Grant
X-ray fluorescence analyzer
- Patent number 9,188,553
- Issue date Nov 17, 2015
- Hitachi High-Tech Science Corporation
- Masahiro Sakuta
- G01 - MEASURING TESTING
Information Patent Grant
Light shielding sheet of a biological optical measuring instrument
- Patent number D723701
- Issue date Mar 3, 2015
- Hitachi, Ltd.
- Atsushi Maki
- D24 - Medical and laboratory equipment
Information Patent Grant
X-ray analyzer and mapping method for an X-ray analysis
- Patent number 8,705,698
- Issue date Apr 22, 2014
- SII NanoTechnology Inc.
- Hiroshi Matsumura
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence analyzer and X-ray fluorescence analysis method
- Patent number 8,611,493
- Issue date Dec 17, 2013
- SII NanoTechnology Inc.
- Kiyoshi Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
X-ray analysis apparatus and X-ray analysis method
- Patent number 7,587,025
- Issue date Sep 8, 2009
- SII NanoTechnology Inc.
- Takayuki Fukai
- G01 - MEASURING TESTING
Information Patent Grant
Energy dispersion type radiation detecting system and method of mea...
- Patent number 7,529,337
- Issue date May 5, 2009
- Sii Nano Technology Inc.
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and method of manufacturing the same
- Patent number 7,436,077
- Issue date Oct 14, 2008
- Oki Electric Industry Co., Ltd.
- Kiyoshi Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray analyzer for analyzing plastics
- Patent number 7,062,014
- Issue date Jun 13, 2006
- SII NanoTechnology Inc.
- Kiyoshi Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Method of forming a ball grid array package
- Patent number 6,975,039
- Issue date Dec 13, 2005
- Oki Electric Industry Co., Ltd.
- Kiyoshi Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 6,879,188
- Issue date Apr 12, 2005
- Renesas Technology Corp.
- Masayuki Miyazaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of forming a ball grid array package
- Patent number 6,677,219
- Issue date Jan 13, 2004
- Oki Electric Industry Co., Ltd.
- Kiyoshi Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor chip installing tape, semiconductor device and a meth...
- Patent number 6,624,008
- Issue date Sep 23, 2003
- Oki Electric Industry Co., Ltd.
- Kiyoshi Hasegawa
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
X-ray mapping analysis method
- Patent number 6,584,169
- Issue date Jun 24, 2003
- Seiko Instruments Inc.
- Kiyoshi Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor with plural side faces
- Patent number 6,580,152
- Issue date Jun 17, 2003
- Oki Electric Industry Co., Ltd.
- Kiyoshi Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-chip package-type semiconductor device
- Patent number 6,518,655
- Issue date Feb 11, 2003
- Oki Electric Industry Co., Ltd.
- Yuichi Morinaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device
- Patent number 6,515,519
- Issue date Feb 4, 2003
- Hitachi, Ltd.
- Masayuki Miyazaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Timing-control circuit device and clock distribution system
- Patent number 6,489,824
- Issue date Dec 3, 2002
- Hitachi, Ltd.
- Masayuki Miyazaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fluorescent x-ray method for determining x-ray alignment by lumines...
- Patent number 6,404,846
- Issue date Jun 11, 2002
- Seiko Instruments Inc.
- Kiyoshi Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor package
- Patent number 6,300,685
- Issue date Oct 9, 2001
- Oki Electric Industry Co., Ltd.
- Kiyoshi Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Timing-control circuit device and clock distribution system
- Patent number 6,300,807
- Issue date Oct 9, 2001
- Hitachi, Ltd.
- Masayuki Miyazaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Magnetic head unit, with coil winding arrangement to allow for spec...
- Patent number 6,166,887
- Issue date Dec 26, 2000
- Sony Corporation
- Kiyoshi Hasegawa
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic head device with rail formed within width of head chip and...
- Patent number 6,160,682
- Issue date Dec 12, 2000
- Sony Corporation
- Masahiko Yamazaki
- G11 - INFORMATION STORAGE
Information Patent Grant
X-ray fluorescence analyzer capable of determining the center of a...
- Patent number 6,115,450
- Issue date Sep 5, 2000
- Seiko Instruments Inc.
- Kiyoshi Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Metal film forming method
- Patent number 5,895,271
- Issue date Apr 20, 1999
- Sony Corporation
- Kiyoshi Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor device
- Patent number 5,849,631
- Issue date Dec 15, 1998
- Sony Corporation
- Natsuya Ishikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Microprocessor operating at high and low clok frequencies
- Patent number 5,774,701
- Issue date Jun 30, 1998
- Hitachi, Ltd.
- Shigezumi Matsui
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for inspecting deformation of pipe
- Patent number 5,745,232
- Issue date Apr 28, 1998
- Kansei Kogyo Co., Ltd.
- Kiyoshi Hasegawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ANTI-ADHESION COMPOSITION
- Publication number 20250032681
- Publication date Jan 30, 2025
- MOCHIDA PHARMACEUTICAL CO., LTD.
- Taichi ITO
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
COMPOSITION FOR PREVENTING ADHESION
- Publication number 20230293782
- Publication date Sep 21, 2023
- MOCHIDA PHARMACEUTICAL CO., LTD.
- Taichi ITO
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
BLOOD FLOW MEASUREMENT DEVICE
- Publication number 20210386301
- Publication date Dec 16, 2021
- NeU Corporation
- Takeshi HOSHINO
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
ANTI-ADHESION COMPOSITION
- Publication number 20200397954
- Publication date Dec 24, 2020
- Mochida Pharmaceutical Co., Ltd.
- Taichi ITO
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SELECTION SYSTEM, SELECTION METHOD, AND NON-TRANSITORY COMPUTER REA...
- Publication number 20190261916
- Publication date Aug 29, 2019
- NeU Corporation
- Takusige KATURA
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
BIOMETRIC OPTICAL MEASUREMENT APPARATUS AND BIOMETRIC OPTICAL MEASU...
- Publication number 20190046094
- Publication date Feb 14, 2019
- NeU Corporation
- Tsukasa FUNANE
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
BIOPHOTONIC MEASUREMENT DEVICE, INFORMATION PROCESSING PROGRAM, AND...
- Publication number 20180289328
- Publication date Oct 11, 2018
- NeU Corporation
- Kiyoshi HASEGAWA
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND I...
- Publication number 20180271385
- Publication date Sep 27, 2018
- NeU Corporation
- Kiyoshi HASEGAWA
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
MEASUREMENT SYSTEM, HEAD-MOUNTED DEVICE, NON-TRANSITORY COMPUTER RE...
- Publication number 20170332965
- Publication date Nov 23, 2017
- Hitachi High-Technologies Corporation
- Kiyoshi HASEGAWA
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SENSITIVITY EVALUATION SYSTEM
- Publication number 20160005058
- Publication date Jan 7, 2016
- Hitachi, Ltd
- Kazuhiko SAGARA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-Ray Fluorescence Analyzer
- Publication number 20140286474
- Publication date Sep 25, 2014
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masahiro Sakuta
- G01 - MEASURING TESTING
Information Patent Application
FROZEN FRESH CREAM TO BE WHIPPED, METHOD FOR PRODUCING THE FROZEN F...
- Publication number 20130071540
- Publication date Mar 21, 2013
- ORIENTAL YEAST CO., LTD.
- Satoru WAKANA
- A23 - FOODS OR FOODSTUFFS THEIR TREATMENT, NOT COVERED BY OTHER CLASSES
Information Patent Application
X-RAY FLUORESCENCE ANALYZER AND X-RAY FLUORESCENCE ANALYSIS METHOD
- Publication number 20120051507
- Publication date Mar 1, 2012
- Kiyoshi Hasegawa
- G01 - MEASURING TESTING
Information Patent Application
Electronic apparatus
- Publication number 20090307632
- Publication date Dec 10, 2009
- SONY CORPORATION
- Kiyoshi Hasegawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY ANALYSIS APPARATUS AND X-RAY ANALYSIS METHOD
- Publication number 20080212739
- Publication date Sep 4, 2008
- Takayuki Fukai
- G01 - MEASURING TESTING
Information Patent Application
Energy dispersion type radiation detecting system and method of mea...
- Publication number 20080008293
- Publication date Jan 10, 2008
- Yoshiki Matoba
- G01 - MEASURING TESTING
Information Patent Application
Information processing apparatus, volume control method, recording...
- Publication number 20050276426
- Publication date Dec 15, 2005
- Kenichi Ono
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
X-ray analyzer for analyzing plastics
- Publication number 20050053193
- Publication date Mar 10, 2005
- Kiyoshi Hasegawa
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor package
- Publication number 20040094833
- Publication date May 20, 2004
- Kiyoshi Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method for manufacturing the same
- Publication number 20030207496
- Publication date Nov 6, 2003
- Oki Electric Industry Co., Ltd.
- Kiyoshi Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device and method of manufacturing the same
- Publication number 20030197291
- Publication date Oct 23, 2003
- Kiyoshi Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-ray analyzer
- Publication number 20030152192
- Publication date Aug 14, 2003
- Kiyoshi Hasegawa
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor integrated circuit device
- Publication number 20030098730
- Publication date May 29, 2003
- Masayuki Miyazaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor device and method for manufacturing the same
- Publication number 20030038343
- Publication date Feb 27, 2003
- Kiyoshi Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-ray mapping analysis method
- Publication number 20020186810
- Publication date Dec 12, 2002
- Kiyoshi Hasegawa
- G01 - MEASURING TESTING
Information Patent Application
Remote maintenance system and data processing system using electron...
- Publication number 20020147806
- Publication date Oct 10, 2002
- Yokogawa Electric Corporation
- Kiyoshi Hasegawa
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Semiconductor chip installing tape, semiconductor device and a meth...
- Publication number 20020052104
- Publication date May 2, 2002
- Kiyoshi Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multi-chip package-type semiconductor device
- Publication number 20020047214
- Publication date Apr 25, 2002
- Yuichi Morinaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Timing-control circuit device and clock distribution system
- Publication number 20020000851
- Publication date Jan 3, 2002
- Hitachi, Ltd.
- Masayuki Miyazaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor package
- Publication number 20010042924
- Publication date Nov 22, 2001
- Kiyoshi Hasegawa
- H01 - BASIC ELECTRIC ELEMENTS

Kiyoshi Hasegawa

Person

Patents Grantslast 30 patents

Blood flow measurement device

System, method, and non-transitory computer readable medium for cal...

Frozen fresh cream to be whipped, method for producing the frozen f...

X-ray fluorescence analyzer

Light shielding sheet of a biological optical measuring instrument

X-ray analyzer and mapping method for an X-ray analysis

X-ray fluorescence analyzer and X-ray fluorescence analysis method

X-ray analysis apparatus and X-ray analysis method

Energy dispersion type radiation detecting system and method of mea...

Semiconductor device and method of manufacturing the same

X-ray analyzer for analyzing plastics

Method of forming a ball grid array package

Semiconductor integrated circuit device

Method of forming a ball grid array package

Semiconductor chip installing tape, semiconductor device and a meth...

X-ray mapping analysis method

Semiconductor with plural side faces

Multi-chip package-type semiconductor device

Semiconductor integrated circuit device

Timing-control circuit device and clock distribution system

Fluorescent x-ray method for determining x-ray alignment by lumines...

Semiconductor package

Timing-control circuit device and clock distribution system

Magnetic head unit, with coil winding arrangement to allow for spec...

Magnetic head device with rail formed within width of head chip and...

X-ray fluorescence analyzer capable of determining the center of a...

Metal film forming method

Method of manufacturing semiconductor device

Microprocessor operating at high and low clok frequencies

Apparatus for inspecting deformation of pipe

Patents Applicationslast 30 patents

ANTI-ADHESION COMPOSITION

COMPOSITION FOR PREVENTING ADHESION

BLOOD FLOW MEASUREMENT DEVICE

ANTI-ADHESION COMPOSITION

SELECTION SYSTEM, SELECTION METHOD, AND NON-TRANSITORY COMPUTER REA...

BIOMETRIC OPTICAL MEASUREMENT APPARATUS AND BIOMETRIC OPTICAL MEASU...

BIOPHOTONIC MEASUREMENT DEVICE, INFORMATION PROCESSING PROGRAM, AND...

INFORMATION PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND I...

MEASUREMENT SYSTEM, HEAD-MOUNTED DEVICE, NON-TRANSITORY COMPUTER RE...

SENSITIVITY EVALUATION SYSTEM

X-Ray Fluorescence Analyzer

FROZEN FRESH CREAM TO BE WHIPPED, METHOD FOR PRODUCING THE FROZEN F...

X-RAY FLUORESCENCE ANALYZER AND X-RAY FLUORESCENCE ANALYSIS METHOD

Electronic apparatus

X-RAY ANALYSIS APPARATUS AND X-RAY ANALYSIS METHOD

Energy dispersion type radiation detecting system and method of mea...

Information processing apparatus, volume control method, recording...

X-ray analyzer for analyzing plastics

Semiconductor package

Semiconductor device and method for manufacturing the same

Semiconductor device and method of manufacturing the same

X-ray analyzer

Semiconductor integrated circuit device

Semiconductor device and method for manufacturing the same

X-ray mapping analysis method

Remote maintenance system and data processing system using electron...

Semiconductor chip installing tape, semiconductor device and a meth...

Multi-chip package-type semiconductor device

Timing-control circuit device and clock distribution system

Semiconductor package