Koichi Iida

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Okayama, JP

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Patents Grantslast 30 patents

Information Patent Grant
X-ray tube and a conditioning method thereof
- Patent number 10,991,539
- Issue date Apr 27, 2021
- NANO-X IMAGING LTD
- Hidenori Kenmotsu
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Electron emitting construct configured with ion bombardment resistant
- Patent number 10,741,353
- Issue date Aug 11, 2020
- NANO-X IMAGING LTD
- Hidenori Kenmotsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron emitting construct configured with ion bombardment resistant
- Patent number 10,269,527
- Issue date Apr 23, 2019
- NANOX IMAGING PLC
- Hidenori Kenmotsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Devices having an electron emitting structure
- Patent number 10,242,836
- Issue date Mar 26, 2019
- NANOX IMAGING PLC
- Koichi Iida
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ELECTRON EMITTING CONSTRUCT CONFIGURED WITH ION BOMBARDMENT RESISTANT
- Publication number 20190221398
- Publication date Jul 18, 2019
- HIDENORI KENMOTSU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICES HAVING AN ELECTRON EMITTING STRUCTURE
- Publication number 20190189383
- Publication date Jun 20, 2019
- NANOX IMAGING PLC
- Koichi Iida
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY TUBE AND A CONTROLLER THEREOF
- Publication number 20180005796
- Publication date Jan 4, 2018
- Nanox Imaging PLC
- Koichi IIDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY TUBE AND A CONDITIONING METHOD THEREOF
- Publication number 20170301505
- Publication date Oct 19, 2017
- NANOX IMAGING PLC
- Hidenori KENMOTSU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Emitting Construct Configured with Ion Bombardment Resistant
- Publication number 20170004949
- Publication date Jan 5, 2017
- NANOX IMAGING PLC
- Hidenori Kenmotsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEVICES HAVING AN ELECTRON EMITTING STRUCTURE
- Publication number 20150092923
- Publication date Apr 2, 2015
- NANOX IMAGING PLC
- Koichi Iida
- G01 - MEASURING TESTING