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Koichi Karasaki
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Hadano, JP
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last 30 patents
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Patent Grant
X-ray inspection method and apparatus, prepreg inspecting method, a...
Patent number
5,754,621
Issue date
May 19, 1998
Hitachi, Ltd.
Yoko Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for detecting a circuit pattern
Patent number
5,331,407
Issue date
Jul 19, 1994
Hitachi, Ltd.
Hideaki Doi
G01 - MEASURING TESTING
Information
Patent Grant
Pattern inspection system
Patent number
4,908,871
Issue date
Mar 13, 1990
Hitachi, Ltd.
Yasuhiko Hara
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for detecting wiring patterns
Patent number
4,816,686
Issue date
Mar 28, 1989
Hitachi, Ltd.
Yasuhiko Hara
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for testing pattern of a printed circuit board
Patent number
4,700,225
Issue date
Oct 13, 1987
Hitachi, Ltd.
Yasuhiko Hara
G01 - MEASURING TESTING
Information
Patent Grant
Pattern detecting apparatus
Patent number
4,692,690
Issue date
Sep 8, 1987
Hitachi, Ltd.
Yasuhiko Hara
G01 - MEASURING TESTING
Information
Patent Grant
Component alignment method
Patent number
4,672,209
Issue date
Jun 9, 1987
Hitachi, Ltd.
Koichi Karasaki
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method and apparatus for inspecting printed wiring boards
Patent number
4,421,410
Issue date
Dec 20, 1983
Hitachi, Ltd.
Koichi Karasaki
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for inspecting printed wiring boards
Patent number
4,277,175
Issue date
Jul 7, 1981
Hitachi, Ltd.
Koichi Karasaki
G01 - MEASURING TESTING