Koichiro NOGUCHI

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Package and terminal arrangement for semiconductor module
- Patent number 11,069,602
- Issue date Jul 20, 2021
- Mitsubishi Electric Corporation
- Shuhei Yokoyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor module and semiconductor package
- Patent number 10,998,902
- Issue date May 4, 2021
- Mitsubishi Electric Corporation
- Kazuhiro Kawahara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Driving device for semiconductor element
- Patent number 10,812,062
- Issue date Oct 20, 2020
- Mitsubishi Electric Corporation
- Haruhiko Murakami
- G08 - SIGNALLING
Information Patent Grant
Power semiconductor device
- Patent number 10,630,279
- Issue date Apr 21, 2020
- Mitsubishi Electric Corporation
- Kazuhiro Kawahara
- G01 - MEASURING TESTING
Information Patent Grant
Power module
- Patent number 10,333,514
- Issue date Jun 25, 2019
- Mitsubishi Electric Corporation
- Koichiro Noguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device
- Patent number 10,305,468
- Issue date May 28, 2019
- Renesas Electronics Corporation
- Koichiro Noguchi
- G05 - CONTROLLING REGULATING
Information Patent Grant
Power supply device, and control method of power supply device
- Patent number 10,230,275
- Issue date Mar 12, 2019
- Renesas Electronics Corporation
- Koichiro Noguchi
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Semiconductor device
- Patent number 10,033,372
- Issue date Jul 24, 2018
- RENESAS ELECTRONICS CORPORATION
- Koichiro Noguchi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor device, semiconductor system including the same, cont...
- Patent number 9,965,418
- Issue date May 8, 2018
- Renesas Electronics Corporation
- Koichiro Noguchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Power supply circuit
- Patent number 9,906,079
- Issue date Feb 27, 2018
- Renesas Electronics Corporation
- Koichiro Noguchi
- G05 - CONTROLLING REGULATING
Information Patent Grant
Power supply device, and control method of power supply device
- Patent number 9,843,227
- Issue date Dec 12, 2017
- Renesas Electronics Corporation
- Koichiro Noguchi
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Control voltage generating circuit, constant current source circuit...
- Patent number 8,653,861
- Issue date Feb 18, 2014
- Renesas Electronics Corporation
- Koichiro Noguchi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor inspection apparatus, semiconductor wafer positioning...
- Patent number 8,570,056
- Issue date Oct 29, 2013
- NEC Corporation
- Yoshio Kameda
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor inspecting device and semiconductor inspecting method
- Patent number 8,536,890
- Issue date Sep 17, 2013
- NEC Corporation
- Yoshio Kameda
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and method of testing the same
- Patent number 8,513,970
- Issue date Aug 20, 2013
- NEC Corporation
- Yoshio Kameda
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor testing device, semiconductor device, and testing method
- Patent number 8,441,277
- Issue date May 14, 2013
- NEC Corporation
- Koichiro Noguchi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 8,399,960
- Issue date Mar 19, 2013
- NEC Corporation
- Yoshihiro Nakagawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR MODULE AND SEMICONDUCTOR PACKAGE
- Publication number 20200403612
- Publication date Dec 24, 2020
- Mitsubishi Electric Corporation
- Kazuhiro KAWAHARA
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
SEMICONDUCTOR MODULE
- Publication number 20200194353
- Publication date Jun 18, 2020
- Mitsubishi Electric Corporation
- Shuhei YOKOYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POWER SEMICONDUCTOR DEVICE
- Publication number 20190379370
- Publication date Dec 12, 2019
- Mitsubishi Electric Corporation
- Kazuhiro KAWAHARA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DRIVING DEVICE FOR SEMICONDUCTOR ELEMENT
- Publication number 20190326897
- Publication date Oct 24, 2019
- Mitsubishi Electric Corporation
- Haruhiko MURAKAMI
- G08 - SIGNALLING
Information Patent Application
POWER MODULE
- Publication number 20190089351
- Publication date Mar 21, 2019
- Mitsubishi Electric Corporation
- Koichiro NOGUCHI
- G05 - CONTROLLING REGULATING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20180323779
- Publication date Nov 8, 2018
- RENESAS ELECTRONICS CORPORATION
- Koichiro NOGUCHI
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
POWER SUPPLY DEVICE, AND CONTROL METHOD OF POWER SUPPLY DEVICE
- Publication number 20180083494
- Publication date Mar 22, 2018
- RENESAS ELECTRONICS CORPORATION
- Koichiro NOGUCHI
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
INSTRUCTION EXECUTION CONTROL SYSTEM AND INSTRUCTION EXECUTION CONT...
- Publication number 20170300329
- Publication date Oct 19, 2017
- Koichiro NOGUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR DEVICE, SEMICONDUCTOR SYSTEM INCLUDING THE SAME, CONT...
- Publication number 20160364351
- Publication date Dec 15, 2016
- RENESAS ELECTRONICS CORPORATION
- Koichiro NOGUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONNECTION RELATION DETECTING SYSTEM, INFORMATION PROCESSING APPARA...
- Publication number 20160132040
- Publication date May 12, 2016
- RENESAS ELECTRONICS CORPORATION
- Koichiro NOGUCHI
- G05 - CONTROLLING REGULATING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20160065070
- Publication date Mar 3, 2016
- RENESAS ELECTRONICS CORPORATION
- Koichiro NOGUCHI
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
POWER SUPPLY DEVICE, AND CONTROL METHOD OF POWER SUPPLY DEVICE
- Publication number 20150311706
- Publication date Oct 29, 2015
- RENESAS ELECTRONICS CORPORATION
- Koichiro NOGUCHI
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
Power Supply Circuit
- Publication number 20150180239
- Publication date Jun 25, 2015
- RENESAS ELECTRONICS CORPORATION
- Koichiro NOGUCHI
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
Control voltage generating circuit, constant current source circuit...
- Publication number 20120062301
- Publication date Mar 15, 2012
- RENESAS ELECTRONICS CORPORATION
- Koichiro Noguchi
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
ELECTRONIC CIRCUIT, CIRCUIT APPARATUS, TEST SYSTEM, CONTROL METHOD...
- Publication number 20120025790
- Publication date Feb 2, 2012
- NEC Corporation
- Koichiro Noguchi
- G05 - CONTROLLING REGULATING
Information Patent Application
SEMICONDUCTOR WAFER AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20120018726
- Publication date Jan 26, 2012
- NEC CORPORATION AND RENESAS ELECTRONICS CORPORATION
- Yoshihiro Nakagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF TESTING THE SAME
- Publication number 20110260747
- Publication date Oct 27, 2011
- Yoshio Kameda
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20110012228
- Publication date Jan 20, 2011
- NEC Corporation
- Yoshihiro Nakagawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20110006443
- Publication date Jan 13, 2011
- NEC Corporation
- Koichiro Noguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR INSPECTING DEVICE AND SEMICONDUCTOR INSPECTING METHOD
- Publication number 20100321054
- Publication date Dec 23, 2010
- Yoshio Kameda
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR TESTING DEVICE, SEMICONDUCTOR DEVICE, AND TESTING METHOD
- Publication number 20100283497
- Publication date Nov 11, 2010
- NEC Corporation
- Koichiro Noguchi
- G01 - MEASURING TESTING

Koichiro NOGUCHI

Person

Patents Grantslast 30 patents

Package and terminal arrangement for semiconductor module

Semiconductor module and semiconductor package

Driving device for semiconductor element

Power semiconductor device

Power module

Semiconductor device

Power supply device, and control method of power supply device

Semiconductor device

Semiconductor device, semiconductor system including the same, cont...

Power supply circuit

Power supply device, and control method of power supply device

Control voltage generating circuit, constant current source circuit...

Semiconductor inspection apparatus, semiconductor wafer positioning...

Semiconductor inspecting device and semiconductor inspecting method

Semiconductor device and method of testing the same

Semiconductor testing device, semiconductor device, and testing method

Semiconductor device

Patents Applicationslast 30 patents

SEMICONDUCTOR MODULE AND SEMICONDUCTOR PACKAGE

SEMICONDUCTOR MODULE

POWER SEMICONDUCTOR DEVICE

DRIVING DEVICE FOR SEMICONDUCTOR ELEMENT

POWER MODULE

SEMICONDUCTOR DEVICE

POWER SUPPLY DEVICE, AND CONTROL METHOD OF POWER SUPPLY DEVICE

INSTRUCTION EXECUTION CONTROL SYSTEM AND INSTRUCTION EXECUTION CONT...

SEMICONDUCTOR DEVICE, SEMICONDUCTOR SYSTEM INCLUDING THE SAME, CONT...

CONNECTION RELATION DETECTING SYSTEM, INFORMATION PROCESSING APPARA...

SEMICONDUCTOR DEVICE

POWER SUPPLY DEVICE, AND CONTROL METHOD OF POWER SUPPLY DEVICE

Power Supply Circuit

Control voltage generating circuit, constant current source circuit...

ELECTRONIC CIRCUIT, CIRCUIT APPARATUS, TEST SYSTEM, CONTROL METHOD...

SEMICONDUCTOR WAFER AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND METHOD OF TESTING THE SAME

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE

SEMICONDUCTOR INSPECTING DEVICE AND SEMICONDUCTOR INSPECTING METHOD

SEMICONDUCTOR TESTING DEVICE, SEMICONDUCTOR DEVICE, AND TESTING METHOD