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Patents Grants
last 30 patents
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Patent Grant
Test apparatus, test method and manufacturing method
Patent number
8,014,969
Issue date
Sep 6, 2011
Advantest Corporation
Hirokatsu Niijima
G11 - INFORMATION STORAGE
Information
Patent Grant
Test pattern generation apparatus and method for SDRAM
Patent number
6,094,738
Issue date
Jul 25, 2000
Advantest Corp.
Osamu Yamada
G01 - MEASURING TESTING
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Patent Grant
Pattern generation apparatus and method for SDRAM
Patent number
5,854,801
Issue date
Dec 29, 1998
Advantest Corp.
Osamu Yamada
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
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Patent Application
TEST APPARATUS, TEST METHOD AND MANUFACTURING METHOD
Publication number
20090240365
Publication date
Sep 24, 2009
Advantest Corporation
HIROKATSU NIIJIMA
G01 - MEASURING TESTING