Koji Miyamoto

Person

Yokohama-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method of accelerating test of semiconductor device
- Patent number 7,485,475
- Issue date Feb 3, 2009
- Kabushiki Kaisha Toshiba
- Kenji Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device having capacitor formed in multilayer wiring s...
- Patent number 7,242,094
- Issue date Jul 10, 2007
- Kabushiki Kaisha Toshiba
- Takeshi Matsunaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of accelerating test of semiconductor device
- Patent number 7,157,368
- Issue date Jan 2, 2007
- Kabushiki Kaisha Toshiba
- Kenji Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device having multilayer wiring and manufacturing met...
- Patent number 6,960,492
- Issue date Nov 1, 2005
- Kabushiki Kaisha Toshiba
- Koji Miyamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device having multilevel interconn...
- Patent number 6,774,024
- Issue date Aug 10, 2004
- Kabushiki Kaisha Toshiba
- Koji Miyamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor integrated circuit device having multilevel interconn...
- Patent number 6,670,714
- Issue date Dec 30, 2003
- Kabushiki Kaisha Toshiba
- Koji Miyamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device with contact holes differing in depth and manu...
- Patent number 6,043,158
- Issue date Mar 28, 2000
- Kabushiki Kaisha Toshiba
- Koji Miyamoto
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20120063212
- Publication date Mar 15, 2012
- Kabushiki Kaisha Toshiba
- Masahiko Kanda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE HAVING CAPACITOR FORMED IN MULTILAYER WIRING S...
- Publication number 20070228573
- Publication date Oct 4, 2007
- Takeshi Matsunaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF ACCELERATING TEST OF SEMICONDUCTOR DEVICE
- Publication number 20070077762
- Publication date Apr 5, 2007
- Kabushiki Kaisha Toshiba
- Kenji Yoshida
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor integrated circuit device having multilevel interconn...
- Publication number 20040245645
- Publication date Dec 9, 2004
- Koji Miyamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device having capacitor formed in multilayer wiring s...
- Publication number 20040207043
- Publication date Oct 21, 2004
- Takeshi Matsunaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE HAVING MULTILEVEL INTERCONN...
- Publication number 20040104482
- Publication date Jun 3, 2004
- Koji Miyamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of accelerating test of semiconductor device
- Publication number 20040106219
- Publication date Jun 3, 2004
- Kabushiki Kaisha Toshiba
- Kenji Yoshida
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE HAVING MULTILEVEL INTERCONN...
- Publication number 20040012091
- Publication date Jan 22, 2004
- Koji Miyamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Manufacturing method of a semiconductor device
- Publication number 20020098663
- Publication date Jul 25, 2002
- Kabushiki Kaisha Toshiba
- Koji Miyamoto
- H01 - BASIC ELECTRIC ELEMENTS

Koji Miyamoto

Person

Patents Grantslast 30 patents

Method of accelerating test of semiconductor device

Semiconductor device having capacitor formed in multilayer wiring s...

Method of accelerating test of semiconductor device

Semiconductor device having multilayer wiring and manufacturing met...

Semiconductor integrated circuit device having multilevel interconn...

Semiconductor integrated circuit device having multilevel interconn...

Semiconductor device with contact holes differing in depth and manu...

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME

SEMICONDUCTOR DEVICE HAVING CAPACITOR FORMED IN MULTILAYER WIRING S...

METHOD OF ACCELERATING TEST OF SEMICONDUCTOR DEVICE

Semiconductor integrated circuit device having multilevel interconn...

Semiconductor device having capacitor formed in multilayer wiring s...

SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE HAVING MULTILEVEL INTERCONN...

Method of accelerating test of semiconductor device

SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE HAVING MULTILEVEL INTERCONN...

Manufacturing method of a semiconductor device