Koji Urata

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Explanatory-description adding apparatus, computer program product,...
- Patent number 8,931,002
- Issue date Jan 6, 2015
- Kabushiki Kaisha Toshiba
- Tomohiro Yamasaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Device, method, and computer program product for structuring digita...
- Patent number 7,856,460
- Issue date Dec 21, 2010
- Kabushiki Kaisha Toshiba
- Tomohiro Yamasaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Information retrieval system, method, and program
- Patent number 7,818,173
- Issue date Oct 19, 2010
- Kabushiki Kaisha Toshiba
- Toshihiko Manabe
- G10 - MUSICAL INSTRUMENTS ACOUSTICS
Information Patent Grant
Semiconductor integrated circuit, method for testing semiconductor...
- Patent number 7,484,154
- Issue date Jan 27, 2009
- Kabushiki Kaisha Toshiba
- Koji Urata
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for delay fault testing of integrated circuits
- Patent number 7,120,890
- Issue date Oct 10, 2006
- Kabushiki Kaisha Toshiba
- Koji Urata
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
EXPLANATORY-DESCRIPTION ADDING APPARATUS, COMPUTER PROGRAM PRODUCT,...
- Publication number 20080240671
- Publication date Oct 2, 2008
- Tomohiro Yamasaki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Device, method, and computer program product for structuring digita...
- Publication number 20080077611
- Publication date Mar 27, 2008
- Tomohiro Yamasaki
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor integrated circuit, method for testing semiconductor...
- Publication number 20070022343
- Publication date Jan 25, 2007
- KABUSHIKI KAISHA TOSHIBA
- Koji Urata
- G01 - MEASURING TESTING
Information Patent Application
Information retrieval system, method, and program
- Publication number 20060173682
- Publication date Aug 3, 2006
- Toshihiko Manabe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus for generating test vector of semiconductor integrated ci...
- Publication number 20050010886
- Publication date Jan 13, 2005
- Koji Urata
- G01 - MEASURING TESTING