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Koki YOKOYAMA

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  • Tokyo, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Automatic analyzer
    • Patent number 12,235,280
    • Issue date Feb 25, 2025
    • HITACHI HIGH-TECH CORPORATION
    • Daisuke Kanai
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,953,508
    • Issue date Apr 9, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Sunao Funakoshi
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automatic analyzer
    • Patent number 11,906,534
    • Issue date Feb 20, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Sunao Funakoshi
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 11,300,488
    • Issue date Apr 12, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Koki Yokoyama
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    AUTOMATED ANALYSIS DEVICE
    • Publication number 20240310393
    • Publication date Sep 19, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Sunao FUNAKOSHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    METHOD OF DRYING REAGENT REFRIGERATOR
    • Publication number 20240288459
    • Publication date Aug 29, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Katsumi MIYAZAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    CONTAINER DISPOSAL UNIT, AUTOMATIC ANALYZER HAVING CONTAINER DISPOS...
    • Publication number 20240264188
    • Publication date Aug 8, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Yohei SHIOTA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analyzer
    • Publication number 20240027484
    • Publication date Jan 25, 2024
    • Hitachi High-Tech Corporation
    • Koki YOKOYAMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20230266349
    • Publication date Aug 24, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Sunao FUNAKOSHI
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20230102788
    • Publication date Mar 30, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Koki YOKOYAMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20220214369
    • Publication date Jul 7, 2022
    • Hitachi High-Tech Corporation
    • Sunao FUNAKOSHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analyzer
    • Publication number 20220187285
    • Publication date Jun 16, 2022
    • Hitachi High-Tech Corporation
    • Koki YOKOYAMA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20220057419
    • Publication date Feb 24, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Daisuke KANAI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analysis Device
    • Publication number 20210382078
    • Publication date Dec 9, 2021
    • Hitachi High-Tech Corporation
    • Sunao FUNAKOSHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20210302457
    • Publication date Sep 30, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Sunao FUNAKOSHI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20190376883
    • Publication date Dec 12, 2019
    • Hitachi High-Technologies Corporation
    • Koki YOKOYAMA
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL