Komal N. Shah

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Mumbal, IN

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Patents Grantslast 30 patents

Information Patent Grant
Programmable scan chain debug technique
- Patent number 11,754,624
- Issue date Sep 12, 2023
- Seagate Technology LLC
- Bharat Londhe
- G01 - MEASURING TESTING
Information Patent Grant
Circuit including efficient clocking for testing memory interface
- Patent number 10,685,730
- Issue date Jun 16, 2020
- Seagate Technology LLC
- Komal Shah
- G11 - INFORMATION STORAGE
Information Patent Grant
On-chip clock control monitoring
- Patent number 10,459,029
- Issue date Oct 29, 2019
- Seagate Technology LLC
- Paras Gangwal
- G01 - MEASURING TESTING
Information Patent Grant
At-speed scan testing of clock divider logic in a clock module of a...
- Patent number 8,898,527
- Issue date Nov 25, 2014
- LSI Corporation
- Priyesh Kumar
- G01 - MEASURING TESTING
Information Patent Grant
Efficient wrapper cell design for scan testing of integrated
- Patent number 8,738,978
- Issue date May 27, 2014
- LSI Corporation
- Ramesh C. Tekumalla
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROGRAMMABLE SCAN CHAIN DEBUG TECHNIQUE
- Publication number 20230266388
- Publication date Aug 24, 2023
- SEAGATE TECHNOLOGY LLC
- Bharat Londhe
- G01 - MEASURING TESTING
Information Patent Application
ON-CHIP CLOCK CONTROL MONITORING
- Publication number 20190212387
- Publication date Jul 11, 2019
- SEAGATE TECHNOLOGY LLC
- Paras Gangwal
- G01 - MEASURING TESTING
Information Patent Application
AT-SPEED SCAN TESTING OF CLOCK DIVIDER LOGIC IN A CLOCK MODULE OF A...
- Publication number 20140208175
- Publication date Jul 24, 2014
- LSI Corporation
- Priyesh Kumar
- G01 - MEASURING TESTING
Information Patent Application
CIRCUITS AND METHODS FOR FUNCTIONAL TESTING OF INTEGRATED CIRCUIT C...
- Publication number 20140101500
- Publication date Apr 10, 2014
- LSI Corporation
- Sachin Shivanand Bastimane
- G01 - MEASURING TESTING
Information Patent Application
EFFICIENT WRAPPER CELL DESIGN FOR SCAN TESTING OF INTEGRATED CIRCUITS
- Publication number 20130007547
- Publication date Jan 3, 2013
- Ramesh C. Tekumalla
- G01 - MEASURING TESTING