Konno Takashi

Person

Takamatsu-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Vibration driven power generation element and method of manufacture...
- Patent number 9,425,709
- Issue date Aug 23, 2016
- AOI Electronics Co., Ltd.
- Hiroki Hayashi
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Particle removing method, particle removing device, atomic force mi...
- Patent number 8,657,962
- Issue date Feb 25, 2014
- AOI Electronics Co., Ltd.
- Hiroki Hayashi
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Tweezer-equipped scanning probe microscope and transfer method
- Patent number 7,987,703
- Issue date Aug 2, 2011
- AOI Electronics Co., Ltd.
- Takashi Konno
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Nanotweezer and scanning probe microscope equipped with nanotweezer
- Patent number 7,849,515
- Issue date Dec 7, 2010
- National University Corporation Kagawa University
- Gen Hashiguchi
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Nanogripper device and method for detecting that a sample is grippe...
- Patent number 7,489,143
- Issue date Feb 10, 2009
- AOI Electronics Co., Ltd.
- Takashi Konno
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Probe and small sample pick up mechanism
- Patent number 7,404,339
- Issue date Jul 29, 2008
- Sii Nano Technology Inc.
- Masanao Munekane
- G01 - MEASURING TESTING
Information Patent Grant
Nanogripper device having length measuring function and method for...
- Patent number 7,339,383
- Issue date Mar 4, 2008
- AOI Electronics Co., Ltd.
- Takashi Konno
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Vibration Driven Power Generation Element and Method of Manufacture...
- Publication number 20130229087
- Publication date Sep 5, 2013
- AOI ELECTRONICS CO., LTD.
- Hiroki HAYASHI
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
Nanotweezer And Scanning Probe Microscope Equipped With Nanotweezer
- Publication number 20090000362
- Publication date Jan 1, 2009
- National University Corporation Kagawa University
- Gen Hashiguchi
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Particle removing method, particle removing device, atomic force mi...
- Publication number 20080307866
- Publication date Dec 18, 2008
- AOI ELECTRONICS CO., LTD.
- Hayashi Hiroki
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
Tweezer-Equipped Scanning Probe Microscope and Transfer Method
- Publication number 20080295585
- Publication date Dec 4, 2008
- AOI ELECTRONICS CO., LTD.
- Takashi Konno
- G01 - MEASURING TESTING
Information Patent Application
Nanogripper device having length measuring function and method for...
- Publication number 20060220659
- Publication date Oct 5, 2006
- AOI ELECTRONICS CO., LTD.
- Takashi Konno
- G01 - MEASURING TESTING
Information Patent Application
Nanogripper device and method for detecting that a sample is grippe...
- Publication number 20060014196
- Publication date Jan 19, 2006
- AOI ELECTRONICS CO., LTD.
- Takashi Konno
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
Probe and small sample pick up mechanism
- Publication number 20060010968
- Publication date Jan 19, 2006
- Masanao Munekane
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS

Konno Takashi

Person

Patents Grantslast 30 patents

Vibration driven power generation element and method of manufacture...

Particle removing method, particle removing device, atomic force mi...

Tweezer-equipped scanning probe microscope and transfer method

Nanotweezer and scanning probe microscope equipped with nanotweezer

Nanogripper device and method for detecting that a sample is grippe...

Probe and small sample pick up mechanism

Nanogripper device having length measuring function and method for...

Patents Applicationslast 30 patents

Vibration Driven Power Generation Element and Method of Manufacture...

Nanotweezer And Scanning Probe Microscope Equipped With Nanotweezer

Particle removing method, particle removing device, atomic force mi...

Tweezer-Equipped Scanning Probe Microscope and Transfer Method

Nanogripper device having length measuring function and method for...

Nanogripper device and method for detecting that a sample is grippe...

Probe and small sample pick up mechanism