Kou Wada

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Cable cutting apparatus with mechanism for preventing erroneous cab...
- Patent number 5,357,830
- Issue date Oct 25, 1994
- NTT Fanet Systems Corporation
- Tadashi Mori
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Method and apparatus for evaluating the capacitance of an integrate...
- Patent number 5,097,204
- Issue date Mar 17, 1992
- Nippon Telegraph & Telephone Public Corporation
- Masahiro Yoshizawa
- G01 - MEASURING TESTING
Information Patent Grant
Charged beam radiation apparatus
- Patent number 5,006,795
- Issue date Apr 9, 1991
- Nippon Telephone and Telegraph Public Corporation
- Masahiro Yoshizawa
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for testing integrated electronic device
- Patent number 4,980,639
- Issue date Dec 25, 1990
- Nippon Telegraph and Telephone Public Corporation
- Masahiro Yoshizawa
- G01 - MEASURING TESTING
Information Patent Grant
Observing a surface using a charged particle beam
- Patent number 4,928,010
- Issue date May 22, 1990
- Nippon Telegraph and Telephone Corp.
- Kenichi Saito
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Characteristic test apparatus for electronic device and method for...
- Patent number 4,851,768
- Issue date Jul 25, 1989
- Nippon Telegraph & Telephone Corporation
- Masahiro Yoshizawa
- G01 - MEASURING TESTING