Scanning Electron Microscopy/1981/I(pp. 305-322). SEM Inc., AMF O'Hare (Chicago), Ill. 60666, U.S.A., "Electron Beam Test Techniques for Integrated Circuits". |
Scanning Electron Microscopy/1983/(pp. 65-75) SEM Inc., AMF O'Hare (Chicago), Ill. 60666 U.S.A., "Secondary Electron Analyzers for Voltage Measurements". |
J. Vac. Sci. Technol., vol. 19, No. 4, "Contactless Electrical Testing . . . " Pfeiffer et al., Nov./Dec. 1981, pp. 1014-1019. |
IBM Technical Disclosure Bulletin, vol. 17, No. 10, "Voltage Comparator System for Contactless Microcircuit Testing", DeStafeno et al., Mar. 1975, pp. 2871-2873. |