Kouji Matsunaga

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Transimpedance amplifier
- Patent number 7,688,134
- Issue date Mar 30, 2010
- NEC Corporation
- Masahiro Tanomura
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor device with schottky electrode having high schottky b...
- Patent number 6,492,669
- Issue date Dec 10, 2002
- NEC Corporation
- Tatsuo Nakayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device testing apparatus having a contact sheet and p...
- Patent number 6,486,688
- Issue date Nov 26, 2002
- NEC Corporation
- Toru Taura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device
- Patent number 6,465,814
- Issue date Oct 15, 2002
- NEC Corporation
- Kensuke Kasahara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of manufacturing semiconductor device with sidewall metal la...
- Patent number 6,440,822
- Issue date Aug 27, 2002
- NEC Corporation
- Nobuyuki Hayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for fabricating probe tip portion composed by coaxial cable
- Patent number 6,400,168
- Issue date Jun 4, 2002
- NEC Corporation
- Kouji Matsunaga
- G01 - MEASURING TESTING
Information Patent Grant
Longitudinal type high frequency probe for narrow pitched electrodes
- Patent number 6,310,483
- Issue date Oct 30, 2001
- NEC Corporation
- Toru Taura
- G01 - MEASURING TESTING
Information Patent Grant
Tip portion structure of high-frequency probe and method for fabric...
- Patent number 6,281,691
- Issue date Aug 28, 2001
- NEC Corporation
- Kouji Matsunaga
- G01 - MEASURING TESTING
Information Patent Grant
High-frequency probe capable of adjusting characteristic impedance...
- Patent number 6,242,930
- Issue date Jun 5, 2001
- NEC Corporation
- Kouji Matsunaga
- G01 - MEASURING TESTING
Information Patent Grant
Process for manufacturing high frequency multichip module enabling...
- Patent number 6,229,321
- Issue date May 8, 2001
- NEC Corporation
- Kouji Matsunaga
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Field Effect Transistor
- Publication number 20100155779
- Publication date Jun 24, 2010
- Yasuhiro Murase
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Field Effect Transistor
- Publication number 20090173968
- Publication date Jul 9, 2009
- NEC Corporation
- Kouji Matsunaga
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transimpedance amplifier
- Publication number 20090102563
- Publication date Apr 23, 2009
- NEC Corporation
- Masahiro Tanomura
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Method of manufacturing semiconductor device with sidewall metal la...
- Publication number 20020048889
- Publication date Apr 25, 2002
- NEC Corporation
- Nobuyuki Hayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device testing apparatus
- Publication number 20020036514
- Publication date Mar 28, 2002
- NEC Corporation
- Toru Taura
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device
- Publication number 20020017648
- Publication date Feb 14, 2002
- Kensuke Kasahara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device with schottky electrode having high schottky b...
- Publication number 20020017696
- Publication date Feb 14, 2002
- Tatsuo Nakayama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method for fabricating probe tip portion composed by coaxial cable
- Publication number 20010038294
- Publication date Nov 8, 2001
- Kouji Matsunaga
- G01 - MEASURING TESTING

Kouji Matsunaga

Person

Patents Grantslast 30 patents

Transimpedance amplifier

Semiconductor device with schottky electrode having high schottky b...

Semiconductor device testing apparatus having a contact sheet and p...

Semiconductor device

Method of manufacturing semiconductor device with sidewall metal la...

Method for fabricating probe tip portion composed by coaxial cable

Longitudinal type high frequency probe for narrow pitched electrodes

Tip portion structure of high-frequency probe and method for fabric...

High-frequency probe capable of adjusting characteristic impedance...

Process for manufacturing high frequency multichip module enabling...

Patents Applicationslast 30 patents

Field Effect Transistor

Field Effect Transistor

Transimpedance amplifier

Method of manufacturing semiconductor device with sidewall metal la...

Semiconductor device testing apparatus

Semiconductor device

Semiconductor device with schottky electrode having high schottky b...

Method for fabricating probe tip portion composed by coaxial cable