Kristie Veith

Person

Beaverton, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Test and measurement instrument using combined signals
- Patent number 10,107,649
- Issue date Oct 23, 2018
- Tektronix, Inc.
- Kenneth P. Dobyns
- G01 - MEASURING TESTING
Information Patent Grant
Variable length execution pipeline
- Patent number 9,996,345
- Issue date Jun 12, 2018
- Imagination Technologies Limited
- Kristie Veith
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Variable length execution pipeline
- Patent number 9,558,002
- Issue date Jan 31, 2017
- Imagination Techologies Limited
- Kristie Veith
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High waveform throughput with a large acquisition memory
- Patent number 8,374,811
- Issue date Feb 12, 2013
- Tektronix, Inc.
- Steven K. Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
Holdoff algorithm for no dead time acquisition
- Patent number 8,161,497
- Issue date Apr 17, 2012
- Tektronix, Inc.
- Kenneth P. Dobyns
- G01 - MEASURING TESTING
Information Patent Grant
Pre-trigger and post-trigger acquisition for no dead time acquisiti...
- Patent number 8,046,183
- Issue date Oct 25, 2011
- Tektronix, Inc.
- Kenneth P. Dobyns
- G01 - MEASURING TESTING
Information Patent Grant
Test and measurement instrument and method for providing post-acqui...
- Patent number 8,024,141
- Issue date Sep 20, 2011
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Grant
Waveform compression and display
- Patent number 7,834,780
- Issue date Nov 16, 2010
- Tektronix, Inc.
- Steven K. Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
No dead time data acquisition
- Patent number 7,652,465
- Issue date Jan 26, 2010
- Tektronix, Inc.
- Steven K. Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
Noise reduction filter for trigger circuit
- Patent number 7,610,178
- Issue date Oct 27, 2009
- Tektronix, Inc.
- Kristie Veith
- G01 - MEASURING TESTING
Information Patent Grant
Data management in long record length memory
- Patent number 7,558,936
- Issue date Jul 7, 2009
- Tektronix, Inc.
- Terrance R. Beale
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Characterizing newly acquired waveforms for identification of wavef...
- Patent number 7,359,810
- Issue date Apr 15, 2008
- Tektronix, Inc.
- Peter J. Letts
- G01 - MEASURING TESTING
Information Patent Grant
Digital trigger
- Patent number 7,352,167
- Issue date Apr 1, 2008
- Tektronix, Inc.
- Steven K. Sullivan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Variable Length Execution Pipeline
- Publication number 20170102942
- Publication date Apr 13, 2017
- Imagination Technologies Limited
- Kristie Veith
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Variable Length Execution Pipeline
- Publication number 20160092237
- Publication date Mar 31, 2016
- Imagination Technologies Limited
- Kristie Veith
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRIGGER DISPLAY
- Publication number 20140055480
- Publication date Feb 27, 2014
- Tektronix, Inc.
- Steven K. Sullivan
- G01 - MEASURING TESTING
Information Patent Application
TIME-DOMAIN DENSITY TRIGGERING IN A TEST AND MEASUREMENT INSTRUMENT
- Publication number 20130317776
- Publication date Nov 28, 2013
- Tektronix, Inc.
- Kenneth P. DOBYNS
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT INSTRUMENT AND METHOD FOR PROVIDING POST-ACQUI...
- Publication number 20130245977
- Publication date Sep 19, 2013
- Tektronix, Inc.
- Josiah A. Bartlett
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR IMPROVED EDGE TRIGGERING IN A TEST AND MEA...
- Publication number 20120001657
- Publication date Jan 5, 2012
- Tektronix, Inc.
- Stevens K. SULLIVAN
- G01 - MEASURING TESTING
Information Patent Application
High Waveform Throughput with a Large Acquisition Memory
- Publication number 20110137594
- Publication date Jun 9, 2011
- Tektronix, Inc.
- Steven K. SULLIVAN
- G01 - MEASURING TESTING
Information Patent Application
Test and Measurement Instrument Using Combined Signals
- Publication number 20110071795
- Publication date Mar 24, 2011
- Tektronix, Inc.
- Kenneth P. DOBYNS
- G01 - MEASURING TESTING
Information Patent Application
Test and Measurement Instrument and Method For Providing Post-Acqui...
- Publication number 20110060540
- Publication date Mar 10, 2011
- Tektronix, Inc.
- Josiah A. BARTLETT
- G01 - MEASURING TESTING
Information Patent Application
Test and Measurement Instrument and Method For Providing Post-Acqui...
- Publication number 20110060541
- Publication date Mar 10, 2011
- Tektronix, Inc.
- Josiah A. BARTLETT
- G01 - MEASURING TESTING
Information Patent Application
HOLDOFF ALGORITHM FOR NO DEAD TIME ACQUISITION
- Publication number 20090249363
- Publication date Oct 1, 2009
- Tektronix, Inc.
- Kenneth P. DOBYNS
- G01 - MEASURING TESTING
Information Patent Application
PRETRIGGER AND POST-TRIGGER ACQUISITION FOR NO DEAD TIME ACQUISITIO...
- Publication number 20090228226
- Publication date Sep 10, 2009
- Tektronix, Inc.
- Kenneth P. DOBYNS
- G01 - MEASURING TESTING
Information Patent Application
NOISE REDUCTION FILTER FOR TRIGGER CIRCUIT
- Publication number 20080177508
- Publication date Jul 24, 2008
- Tektronix, Inc.
- Kristie Veith
- G01 - MEASURING TESTING
Information Patent Application
No dead time data acquisition
- Publication number 20070222429
- Publication date Sep 27, 2007
- Steven K. Sullivan
- G01 - MEASURING TESTING
Information Patent Application
Digital trigger
- Publication number 20070222430
- Publication date Sep 27, 2007
- Steven K. Sullivan
- G01 - MEASURING TESTING
Information Patent Application
Waveform compression and display
- Publication number 20070217694
- Publication date Sep 20, 2007
- Steven K. Sullivan
- G01 - MEASURING TESTING
Information Patent Application
Characterizing newly acquired waveforms for identification of wavef...
- Publication number 20060212239
- Publication date Sep 21, 2006
- Peter J. Letts
- G01 - MEASURING TESTING

Kristie Veith

Person

Patents Grantslast 30 patents

Test and measurement instrument using combined signals

Variable length execution pipeline

Variable length execution pipeline

High waveform throughput with a large acquisition memory

Holdoff algorithm for no dead time acquisition

Pre-trigger and post-trigger acquisition for no dead time acquisiti...

Test and measurement instrument and method for providing post-acqui...

Waveform compression and display

No dead time data acquisition

Noise reduction filter for trigger circuit

Data management in long record length memory

Characterizing newly acquired waveforms for identification of wavef...

Digital trigger

Patents Applicationslast 30 patents

Variable Length Execution Pipeline

Variable Length Execution Pipeline

TRIGGER DISPLAY

TIME-DOMAIN DENSITY TRIGGERING IN A TEST AND MEASUREMENT INSTRUMENT

TEST AND MEASUREMENT INSTRUMENT AND METHOD FOR PROVIDING POST-ACQUI...

APPARATUS AND METHOD FOR IMPROVED EDGE TRIGGERING IN A TEST AND MEA...

High Waveform Throughput with a Large Acquisition Memory

Test and Measurement Instrument Using Combined Signals

Test and Measurement Instrument and Method For Providing Post-Acqui...

Test and Measurement Instrument and Method For Providing Post-Acqui...

HOLDOFF ALGORITHM FOR NO DEAD TIME ACQUISITION

PRETRIGGER AND POST-TRIGGER ACQUISITION FOR NO DEAD TIME ACQUISITIO...

NOISE REDUCTION FILTER FOR TRIGGER CIRCUIT

No dead time data acquisition

Digital trigger

Waveform compression and display

Characterizing newly acquired waveforms for identification of wavef...