Kuan-Chun Lin

Person

Tainan City, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Termination circuit
- Patent number 11,444,615
- Issue date Sep 13, 2022
- Novatek Microelectronics Corp.
- Liang-Ting Kuo
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method for fabricating semiconductor device
- Patent number 11,139,384
- Issue date Oct 5, 2021
- United Microelectronics Corp.
- Kuo-Chih Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Flexible printed circuit and display module having flexible printed...
- Patent number 10,709,010
- Issue date Jul 7, 2020
- Himax Technologies Limited
- Peng-Chi Chen
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Buried word line structure and method of making the same
- Patent number 10,497,704
- Issue date Dec 3, 2019
- United Microelectronics Corp.
- Ger-Pin Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device and method for fabricating the same
- Patent number 10,490,643
- Issue date Nov 26, 2019
- United Microelectronics Corp.
- Kuo-Chih Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Buried word line structure and method of making the same
- Patent number 10,217,750
- Issue date Feb 26, 2019
- United Microelectronics Corp.
- Ger-Pin Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor structure and fabrication method thereof
- Patent number 9,853,123
- Issue date Dec 26, 2017
- United Microelectronics Corp.
- Kuo-Chin Hung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test structure for electron beam inspection and method for defect d...
- Patent number 9,711,326
- Issue date Jul 18, 2017
- United Microelectronics Corp.
- Kuan-Chun Lin
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
TERMINATION CIRCUIT
- Publication number 20220247402
- Publication date Aug 4, 2022
- NOVATEK MICROELECTRONICS CORP.
- Liang-Ting Kuo
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
- Publication number 20200006514
- Publication date Jan 2, 2020
- UNITED MICROELECTRONICS CORP.
- Kuo-Chih Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FABRICATING A SEMICONDUCTOR STRUCTURE
- Publication number 20190229014
- Publication date Jul 25, 2019
- UNITED MICROELECTRONICS CORP.
- Kuan-Chun Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BURIED WORD LINE STRUCTURE AND METHOD OF MAKING THE SAME
- Publication number 20190164977
- Publication date May 30, 2019
- UNITED MICROELECTRONICS CORP.
- Ger-Pin Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
BURIED WORD LINE STRUCTURE AND METHOD OF MAKING THE SAME
- Publication number 20190067293
- Publication date Feb 28, 2019
- UNITED MICROELECTRONICS CORP.
- Ger-Pin Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEST STRUCTURE FOR ELECTRON BEAM INSPECTION AND METHOD FOR DEFECT D...
- Publication number 20170207060
- Publication date Jul 20, 2017
- UNITED MICROELECTRONICS CORP.
- Kuan-Chun Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME
- Publication number 20170148891
- Publication date May 25, 2017
- UNITED MICROELECTRONICS CORP.
- Kuo-Chih Lai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR STRUCTURE AND FABRICATION METHOD THEREOF
- Publication number 20170125548
- Publication date May 4, 2017
- UNITED MICROELECTRONICS CORP.
- Kuo-Chin Hung
- H01 - BASIC ELECTRIC ELEMENTS

Kuan-Chun Lin

Person

Patents Grantslast 30 patents

Termination circuit

Method for fabricating semiconductor device

Flexible printed circuit and display module having flexible printed...

Buried word line structure and method of making the same

Semiconductor device and method for fabricating the same

Buried word line structure and method of making the same

Semiconductor structure and fabrication method thereof

Test structure for electron beam inspection and method for defect d...

Patents Applicationslast 30 patents

TERMINATION CIRCUIT

METHOD FOR FABRICATING SEMICONDUCTOR DEVICE

METHOD FOR FABRICATING A SEMICONDUCTOR STRUCTURE

BURIED WORD LINE STRUCTURE AND METHOD OF MAKING THE SAME

BURIED WORD LINE STRUCTURE AND METHOD OF MAKING THE SAME

TEST STRUCTURE FOR ELECTRON BEAM INSPECTION AND METHOD FOR DEFECT D...

SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME

SEMICONDUCTOR STRUCTURE AND FABRICATION METHOD THEREOF