Kuei Lin Huang

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Kaohsiung City, TW

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Patents Grantslast 30 patents

Information Patent Grant
Method for retesting semiconductor device
- Patent number 7,109,740
- Issue date Sep 19, 2006
- Advanced Semiconductor Engineering, Inc.
- Chin-Chen Chuan
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
TEST MODULE FOR WAFER
- Publication number 20070170935
- Publication date Jul 26, 2007
- Kuei-Lin Huang
- G01 - MEASURING TESTING
Information Patent Application
Method for retesting semiconductor device
- Publication number 20060022697
- Publication date Feb 2, 2006
- Advanced Semiconductor Engineering, Inc.
- Chin-Chen Chuan
- G01 - MEASURING TESTING