Kunio Kobayashi

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Contact terminal element, contact terminal device
- Patent number 6,384,470
- Issue date May 7, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Kunio Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Transporting apparatus for semiconductor device
- Patent number 6,163,145
- Issue date Dec 19, 2000
- Mitsubishi Denki Kabushiki Kaisha
- Hiromichi Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device socket
- Patent number 5,936,418
- Issue date Aug 10, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Yasushi Ideta
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Semiconductor device socket
- Patent number 5,917,240
- Issue date Jun 29, 1999
- Mitsubishi Denki Kabushiki Kaisha
- Yasushi Ideta
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Semiconductor device socket
- Patent number 5,693,982
- Issue date Dec 2, 1997
- Mitsubishi Denki Kabushiki Kaisha
- Yasushi Ideta
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method of testing semiconductor device and test apparatus for the same
- Patent number 5,578,919
- Issue date Nov 26, 1996
- Mitsubishi Denki Kabushiki Kaisha
- Shinji Semba
- G01 - MEASURING TESTING
Information Patent Grant
Process of raising a semiconductor device out of a pallet using a p...
- Patent number 5,565,008
- Issue date Oct 15, 1996
- Mitsubishi Denki Kabushiki Kaisha
- Kunihiro Shigetomo
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Tape carrier, and test apparatus for the same
- Patent number 5,517,036
- Issue date May 14, 1996
- Mitsubishi Denki Kabushiki Kaisha
- Shinji Semba
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device socket
- Patent number 5,461,258
- Issue date Oct 24, 1995
- Mitsubishi Denki Kabushiki Kaisha
- Yasushi Ideta
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Apparatus for inspecting the appearance of semiconductor devices
- Patent number 4,907,701
- Issue date Mar 13, 1990
- Mitsubishi Denki Kabushiki Kaisha
- Kunio Kobayashi
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING

Patents Applicationslast 30 patents

Information Patent Application
Contact terminal element, contact terminal device, manufacture ther...
- Publication number 20020005569
- Publication date Jan 17, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Kunio Kobayashi
- G01 - MEASURING TESTING

Kunio Kobayashi

Person

Patents Grantslast 30 patents

Contact terminal element, contact terminal device

Transporting apparatus for semiconductor device

Semiconductor device socket

Semiconductor device socket

Semiconductor device socket

Method of testing semiconductor device and test apparatus for the same

Process of raising a semiconductor device out of a pallet using a p...

Tape carrier, and test apparatus for the same

Semiconductor device socket

Apparatus for inspecting the appearance of semiconductor devices

Patents Applicationslast 30 patents

Contact terminal element, contact terminal device, manufacture ther...