Kuniyuki Kitagawa

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Nagoya-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Temperature distribution measuring method and apparatus
- Patent number 6,817,758
- Issue date Nov 16, 2004
- Noritake Co., Limited
- Kenji Yano
- G01 - MEASURING TESTING
Information Patent Grant
Temperature distribution measuring method and apparatus
- Patent number 6,814,484
- Issue date Nov 9, 2004
- Noritake Co., Limited
- Kenji Yano
- G01 - MEASURING TESTING
Information Patent Grant
Temperature measuring method and apparatus
- Patent number 6,786,634
- Issue date Sep 7, 2004
- Noritake Co., Limited
- Miyuki Hashimoto
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Temperature measuring method and apparatus
- Publication number 20050002438
- Publication date Jan 6, 2005
- NORITAKE CO., LIMITED
- Miyuki Hashimoto
- G01 - MEASURING TESTING
Information Patent Application
Emissivity distribution measuring method and apparatus
- Publication number 20040008753
- Publication date Jan 15, 2004
- NORITAKE CO., LIMITED
- Miyuki Hashimoto
- G01 - MEASURING TESTING
Information Patent Application
Temperature distribution measuring method and apparatus
- Publication number 20040001525
- Publication date Jan 1, 2004
- NORITAKE CO., LIMITED
- Kenji Yano
- G01 - MEASURING TESTING
Information Patent Application
Temperature distribution measuring method and apparatus
- Publication number 20030107724
- Publication date Jun 12, 2003
- NORITAKE CO., LIMITED
- Miyuki Hashimoto
- G01 - MEASURING TESTING
Information Patent Application
Temperature measuring method and apparatus
- Publication number 20030067956
- Publication date Apr 10, 2003
- NORITAKE CO., LIMITED
- Miyuki Hashimoto
- G01 - MEASURING TESTING
Information Patent Application
Temperature distribution measuring method and apparatus
- Publication number 20020146056
- Publication date Oct 10, 2002
- NORITAKE CO., LIMITED
- Kenji Yano
- G01 - MEASURING TESTING