Kushal D. Murthy

Person

Bangalore, IN

People

Patents Grantslast 30 patents

Information Patent Grant
Power switch reverse current protection systems
- Patent number 11,996,830
- Issue date May 28, 2024
- Texas Instruments Incorporated
- Kushal D. Murthy
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Load current sensing at low output voltage
- Patent number 11,243,235
- Issue date Feb 8, 2022
- Texas Instruments Incorporated
- Bhaskar Ramachandran
- G01 - MEASURING TESTING
Information Patent Grant
Short detect scheme for an output pin
- Patent number 10,838,016
- Issue date Nov 17, 2020
- Texas Instruments Incorporated
- Bhaskar Ramachandran
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Measuring internal signals of an integrated circuit
- Patent number 10,459,030
- Issue date Oct 29, 2019
- Texas Instruments Incorporated
- Kushal D Murthy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Single circuit one-time programmable memory and volatile memory
- Patent number 10,297,334
- Issue date May 21, 2019
- Texas Instruments Incorporated
- Anindita Borah
- G11 - INFORMATION STORAGE
Information Patent Grant
Input current extraction from inductor current in a voltage converter
- Patent number 10,177,644
- Issue date Jan 8, 2019
- Texas Instruments Incorporated
- Kushal D. Murthy
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Measuring internal signals of an integrated circuit
- Patent number 9,823,306
- Issue date Nov 21, 2017
- Texas Instruments Incorporated
- Kushal D Murthy
- H03 - BASIC ELECTRONIC CIRCUITRY

Patents Applicationslast 30 patents

Information Patent Application
Power Transistor Thermal Control via Integrated Thermoelectric Device
- Publication number 20240258999
- Publication date Aug 1, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Orlando Lazaro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TRANSISTOR WITH DISTRIBUTED THERMAL FEEDBACK
- Publication number 20240146254
- Publication date May 2, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Ankur CHAUHAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POWER SWITCH REVERSE CURRENT PROTECTION SYSTEMS
- Publication number 20220352885
- Publication date Nov 3, 2022
- TEXAS INSTRUMENTS INCORPORATED
- KUSHAL D. MURTHY
- G01 - MEASURING TESTING
Information Patent Application
LOAD CURRENT SENSING AT LOW OUTPUT VOLTAGE
- Publication number 20200011906
- Publication date Jan 9, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Bhaskar RAMACHANDRAN
- G01 - MEASURING TESTING
Information Patent Application
SHORT DETECT SCHEME FOR AN OUTPUT PIN
- Publication number 20200011917
- Publication date Jan 9, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Bhaskar RAMACHANDRAN
- G01 - MEASURING TESTING
Information Patent Application
Measuring Internal Signals of an Integrated Circuit
- Publication number 20180038913
- Publication date Feb 8, 2018
- TEXAS INSTRUMENTS INCORPORATED
- Kushal D. Murthy
- G01 - MEASURING TESTING
Information Patent Application
SINGLE CIRCUIT ONE-TIME PROGRAMMABLE MEMORY AND VOLATILE MEMORY
- Publication number 20170337985
- Publication date Nov 23, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Anindita BORAH
- G11 - INFORMATION STORAGE
Information Patent Application
Measuring Internal Signals of an Integrated Circuit
- Publication number 20170234926
- Publication date Aug 17, 2017
- TEXAS INSTRUMENTS INCORPORATED
- Kushal D. Murthy
- G01 - MEASURING TESTING

Kushal D. Murthy

Person

Patents Grantslast 30 patents

Power switch reverse current protection systems

Load current sensing at low output voltage

Short detect scheme for an output pin

Measuring internal signals of an integrated circuit

Single circuit one-time programmable memory and volatile memory

Input current extraction from inductor current in a voltage converter

Measuring internal signals of an integrated circuit

Patents Applicationslast 30 patents

Power Transistor Thermal Control via Integrated Thermoelectric Device

TRANSISTOR WITH DISTRIBUTED THERMAL FEEDBACK

POWER SWITCH REVERSE CURRENT PROTECTION SYSTEMS

LOAD CURRENT SENSING AT LOW OUTPUT VOLTAGE

SHORT DETECT SCHEME FOR AN OUTPUT PIN

Measuring Internal Signals of an Integrated Circuit

SINGLE CIRCUIT ONE-TIME PROGRAMMABLE MEMORY AND VOLATILE MEMORY

Measuring Internal Signals of an Integrated Circuit