Kwok Ng

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Milpitas, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Based sampling and binning for yield critical defects
- Patent number 9,563,943
- Issue date Feb 7, 2017
- KLA-Tencor Corp.
- Satya Kurada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Based sampling and binning for yield critical defects
- Patent number 9,310,320
- Issue date Apr 12, 2016
- KLA-Tencor Corp.
- Satya Kurada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Design Based Sampling and Binning for Yield Critical Defects
- Publication number 20170103517
- Publication date Apr 13, 2017
- KLA-Tencor Corporation
- Satya Kurada
- G01 - MEASURING TESTING
Information Patent Application
Design Based Sampling and Binning for Yield Critical Defects
- Publication number 20160225138
- Publication date Aug 4, 2016
- KLA-Tencor Corporation
- Satya Kurada
- G01 - MEASURING TESTING
Information Patent Application
Design Based Sampling and Binning for Yield Critical Defects
- Publication number 20140307947
- Publication date Oct 16, 2014
- KLA-Tencor Corporation
- Satya Kurada
- G01 - MEASURING TESTING