Kyle A. Brown

Person

San Diego, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Intent prediction by machine learning with word and sentence featur...
- Patent number 11,556,716
- Issue date Jan 17, 2023
- Intuit Inc.
- Zhewen Fan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for determining a critical dimension and overla...
- Patent number 8,502,979
- Issue date Aug 6, 2013
- KLA-Tencor Technologies Corp.
- Ady Levy
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining a critical dimension and overla...
- Patent number 8,179,530
- Issue date May 15, 2012
- KLA-Tencor Technologies Corp.
- Ady Levy
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for lithography process control
- Patent number 7,767,956
- Issue date Aug 3, 2010
- KLA-Tencor Technologies Corp.
- Suresh Lakkapragada
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining a critical dimension and overla...
- Patent number 7,751,046
- Issue date Jul 6, 2010
- KLA-Tencor Technologies Corp.
- Ady Levy
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for lithography process control
- Patent number 7,462,814
- Issue date Dec 9, 2008
- KLA-Tencor Technologies Corp.
- Suresh Lakkapragada
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining a presence of macro and micro d...
- Patent number 7,460,981
- Issue date Dec 2, 2008
- KLA-Tencor Technologies Corp.
- Gary Bultman
- G01 - MEASURING TESTING
Information Patent Grant
Runout characterization
- Patent number 7,433,047
- Issue date Oct 7, 2008
- KLA-Tencor Corporation
- David R. Peale
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining a property of a specimen prior...
- Patent number 7,349,090
- Issue date Mar 25, 2008
- KLA-Tencor Technologies Corp.
- Dan Wack
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining a thin film characteristic and...
- Patent number 7,196,782
- Issue date Mar 27, 2007
- KLA-Tencor Technologies Corp.
- John Fielden
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining a composition and a thickness o...
- Patent number 7,139,083
- Issue date Nov 21, 2006
- KLA-Tencor Technologies Corp.
- John Fielden
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining an adhesion characteristic and...
- Patent number 7,130,029
- Issue date Oct 31, 2006
- KLA-Tencor Technologies Corp.
- Dan Wack
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining a presence of defects and a thi...
- Patent number 7,106,425
- Issue date Sep 12, 2006
- KLA-Tencor Technologies Corp.
- Gary Bultman
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining overlay and flatness of a specimen
- Patent number 7,006,235
- Issue date Feb 28, 2006
- KLA-Tencor Technologies Corp.
- Ady Levy
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for lithography process control
- Patent number 6,987,572
- Issue date Jan 17, 2006
- KLA-Tencor Technologies Corp.
- Suresh Lakkapragada
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining a thickness of a structure on a...
- Patent number 6,950,196
- Issue date Sep 27, 2005
- KLA-Tencor Technologies Corp.
- John Fielden
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining a characteristic of a layer for...
- Patent number 6,946,394
- Issue date Sep 20, 2005
- KLA Tencor Technologies
- John Fielden
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining a critical dimension, a presenc...
- Patent number 6,919,957
- Issue date Jul 19, 2005
- KLA-Tencor Technologies Corp.
- Mehrdad Nikoonahad
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining flatness, a presence of defects...
- Patent number 6,917,419
- Issue date Jul 12, 2005
- KLA-Tencor Technologies Corp.
- John Fielden
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining a property of a specimen prior...
- Patent number 6,917,433
- Issue date Jul 12, 2005
- KLA-Tencor Technologies Corp.
- Ady Levy
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining a critical dimension and overla...
- Patent number 6,891,627
- Issue date May 10, 2005
- KLA-Tencor Technologies Corp.
- Ady Levy
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining an implant characteristic and a...
- Patent number 6,891,610
- Issue date May 10, 2005
- KLA-Tencor Technologies Corp.
- Mehrdad Nikoonahad
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining a presence of macro and micro d...
- Patent number 6,829,559
- Issue date Dec 7, 2004
- KLA Tencor Technologies
- Gary Bultman
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining a presence of macro defects and...
- Patent number 6,818,459
- Issue date Nov 16, 2004
- KLA-Tencor Technologies Corp.
- Dan Wack
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining a characteristic of a specimen...
- Patent number 6,812,045
- Issue date Nov 2, 2004
- KLA-Tencor, Inc.
- Mehrdad Nikoonahad
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining at least one characteristic of...
- Patent number 6,806,951
- Issue date Oct 19, 2004
- KLA-Tencor Technologies Corp.
- Dan Wack
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining a critical dimension an a prese...
- Patent number 6,782,337
- Issue date Aug 24, 2004
- KLA-Tencor Technologies Corp.
- Dan Wack
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining at least four properties of a s...
- Patent number 6,694,284
- Issue date Feb 17, 2004
- KLA-Tencor Technologies Corp.
- Mehrdad Nikoonahad
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for lithography process control
- Patent number 6,689,519
- Issue date Feb 10, 2004
- KLA-Tencor Technologies Corp.
- Kyle A. Brown
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for determining a presence of macro defects and...
- Patent number 6,673,637
- Issue date Jan 6, 2004
- KLA Tencor Technologies
- Dan Wack
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHODS AND SYSTEMS FOR PEDICTING INTENT OF TEXT DATA TO ENHANCE US...
- Publication number 20220058342
- Publication date Feb 24, 2022
- Intuit Inc.
- Zhewen FAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and Systems for Determining a Critical Dimension and Overla...
- Publication number 20130314710
- Publication date Nov 28, 2013
- KLA-Tencor Technologies Corporation
- Ady Levy
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR DETERMINING A CRITICAL DIMENSION AND OVERLA...
- Publication number 20130039460
- Publication date Feb 14, 2013
- KLA-Tencor Technologies Corporation
- Ady Levy
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR DETERMINING A CRITICAL DIMENSION AND OVERLA...
- Publication number 20100271621
- Publication date Oct 28, 2010
- KLA-Tencor Technologies Corporation
- Ady Levy
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR LITHOGRAPHY PROCESS CONTROL
- Publication number 20090079974
- Publication date Mar 26, 2009
- KLA-Tencor Technologies Corporation
- Suresh Lakkapragada
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for lithography process control
- Publication number 20060138366
- Publication date Jun 29, 2006
- KLA-Tencor Technologies Corp.
- Suresh Lakkapragada
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for determining a presence of macro and micro d...
- Publication number 20060072807
- Publication date Apr 6, 2006
- KLA-Tencor Technologies.
- Gary Bultman
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for determining a critical dimension and overla...
- Publication number 20040235205
- Publication date Nov 25, 2004
- KLA-Tencor, Inc.
- Ady Levy
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for determining a presence of macro defects and...
- Publication number 20040115843
- Publication date Jun 17, 2004
- KLA-Tencor, Inc.
- Dan Wack
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for determining a presence of macro and micro d...
- Publication number 20040092045
- Publication date May 13, 2004
- Gary Bultman
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for determining a critical dimension and a thin...
- Publication number 20040073398
- Publication date Apr 15, 2004
- KLA-Tencor, Inc.
- Mehrdad Nikoonahad
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for lithography process control
- Publication number 20040005507
- Publication date Jan 8, 2004
- KLA-Tencor, Inc.
- Suresh Lakkapragada
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for lithography process control
- Publication number 20030148198
- Publication date Aug 7, 2003
- Suresh Lakkapragada
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for determining overlay and flatness of a specimen
- Publication number 20030011786
- Publication date Jan 16, 2003
- Ady Levy
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for determining a characteristic of micro defec...
- Publication number 20020190207
- Publication date Dec 19, 2002
- Ady Levy
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for determining a property of a specimen prior...
- Publication number 20020188417
- Publication date Dec 12, 2002
- Ady Levy
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for determining an adhesion characteristic and...
- Publication number 20020180961
- Publication date Dec 5, 2002
- Dan Wack
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for determining a presence of macro defects and...
- Publication number 20020182760
- Publication date Dec 5, 2002
- Dan Wack
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for determining a thin film characteristic and...
- Publication number 20020179864
- Publication date Dec 5, 2002
- John Fielden
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for determining a critical dimension, a presenc...
- Publication number 20020180986
- Publication date Dec 5, 2002
- Mehrdad Nikoonahad
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for determining flatness, a presence of defects...
- Publication number 20020179867
- Publication date Dec 5, 2002
- John Fielden
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for determining at least one characteristic of...
- Publication number 20020180985
- Publication date Dec 5, 2002
- Dan Wack
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for determining a critical dimension and a thin...
- Publication number 20020107660
- Publication date Aug 8, 2002
- Mehrdad Nikoonahad
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for determining a property of a specimen prior...
- Publication number 20020106848
- Publication date Aug 8, 2002
- Dan Wack
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for determining a critical dimension and a pres...
- Publication number 20020107650
- Publication date Aug 8, 2002
- Dan Wack
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for determining a composition and a thickness o...
- Publication number 20020103564
- Publication date Aug 1, 2002
- John Fielden
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for determining a characteristic of a layer for...
- Publication number 20020102749
- Publication date Aug 1, 2002
- John Fielden
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for determining a thickness of a structure on a...
- Publication number 20020097406
- Publication date Jul 25, 2002
- John Fielden
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for determining an implant characterstic and a...
- Publication number 20020093648
- Publication date Jul 18, 2002
- Mehrdad Nikoonahad
- G01 - MEASURING TESTING
Information Patent Application
Methods and systems for lithography process control
- Publication number 20020072001
- Publication date Jun 13, 2002
- Kyle A. Brown
- G01 - MEASURING TESTING

Kyle A. Brown

Person

Patents Grantslast 30 patents

Intent prediction by machine learning with word and sentence featur...

Methods and systems for determining a critical dimension and overla...

Methods and systems for determining a critical dimension and overla...

Methods and systems for lithography process control

Methods and systems for determining a critical dimension and overla...

Methods and systems for lithography process control

Methods and systems for determining a presence of macro and micro d...

Runout characterization

Methods and systems for determining a property of a specimen prior...

Methods and systems for determining a thin film characteristic and...

Methods and systems for determining a composition and a thickness o...

Methods and systems for determining an adhesion characteristic and...

Methods and systems for determining a presence of defects and a thi...

Methods and systems for determining overlay and flatness of a specimen

Methods and systems for lithography process control

Methods and systems for determining a thickness of a structure on a...

Methods and systems for determining a characteristic of a layer for...

Methods and systems for determining a critical dimension, a presenc...

Methods and systems for determining flatness, a presence of defects...

Methods and systems for determining a property of a specimen prior...

Methods and systems for determining a critical dimension and overla...

Methods and systems for determining an implant characteristic and a...

Methods and systems for determining a presence of macro and micro d...

Methods and systems for determining a presence of macro defects and...

Methods and systems for determining a characteristic of a specimen...

Methods and systems for determining at least one characteristic of...

Methods and systems for determining a critical dimension an a prese...

Methods and systems for determining at least four properties of a s...

Methods and systems for lithography process control

Methods and systems for determining a presence of macro defects and...

Patents Applicationslast 30 patents

METHODS AND SYSTEMS FOR PEDICTING INTENT OF TEXT DATA TO ENHANCE US...

Methods and Systems for Determining a Critical Dimension and Overla...

METHODS AND SYSTEMS FOR DETERMINING A CRITICAL DIMENSION AND OVERLA...

METHODS AND SYSTEMS FOR DETERMINING A CRITICAL DIMENSION AND OVERLA...

METHODS AND SYSTEMS FOR LITHOGRAPHY PROCESS CONTROL

Methods and systems for lithography process control

Methods and systems for determining a presence of macro and micro d...

Methods and systems for determining a critical dimension and overla...

Methods and systems for determining a presence of macro defects and...

Methods and systems for determining a presence of macro and micro d...

Methods and systems for determining a critical dimension and a thin...

Methods and systems for lithography process control

Methods and systems for lithography process control

Methods and systems for determining overlay and flatness of a specimen

Methods and systems for determining a characteristic of micro defec...

Methods and systems for determining a property of a specimen prior...

Methods and systems for determining an adhesion characteristic and...

Methods and systems for determining a presence of macro defects and...

Methods and systems for determining a thin film characteristic and...

Methods and systems for determining a critical dimension, a presenc...

Methods and systems for determining flatness, a presence of defects...

Methods and systems for determining at least one characteristic of...

Methods and systems for determining a critical dimension and a thin...

Methods and systems for determining a property of a specimen prior...

Methods and systems for determining a critical dimension and a pres...

Methods and systems for determining a composition and a thickness o...

Methods and systems for determining a characteristic of a layer for...

Methods and systems for determining a thickness of a structure on a...

Methods and systems for determining an implant characterstic and a...

Methods and systems for lithography process control