Kyubaik Chang

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Seoul, KR

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for detecting defects on substrate
- Patent number 11,587,235
- Issue date Feb 21, 2023
- Samsung Electronics Co., Ltd.
- Sunghee Lee
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF PROVIDING ARTIFICIAL INTELLIGENCE ALGORITHM, OPERATING ME...
- Publication number 20240211755
- Publication date Jun 27, 2024
- Samsung Electronics Co., Ltd.
- Sunghee LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR MEASURING STRUCTURE BASED ON SPECTRUM
- Publication number 20240028814
- Publication date Jan 25, 2024
- Samsung Electronics Co., Ltd.
- QHwan KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF GENERATING DEVICE STRUCTURE PREDICTION MODEL AND DEVICE S...
- Publication number 20230062430
- Publication date Mar 2, 2023
- Samsung Electronics Co., Ltd.
- Ami MA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING DEFECTS ON SUBSTRATE
- Publication number 20210407099
- Publication date Dec 30, 2021
- Samsung Electronics Co., Ltd.
- Sunghee Lee
- G06 - COMPUTING CALCULATING COUNTING