Membership
Tour
Register
Log in
Lakshman Withanawasam
Follow
Person
Maple Grove, MN, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Anisotropic magneto-resistance (AMR) gradiometer/magnetometer to re...
Patent number
9,104,922
Issue date
Aug 11, 2015
Honeywell International Inc.
Bharat B. Pant
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for determining in-plane magnetic field compon...
Patent number
8,975,891
Issue date
Mar 10, 2015
Honeywell International Inc.
Bharat B. Pant
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for three dimensional sensors
Patent number
8,459,112
Issue date
Jun 11, 2013
Honeywell International Inc.
Ryan W. Rieger
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for three-axis sensor chip packages
Patent number
8,316,552
Issue date
Nov 27, 2012
Honeywell International Inc.
Lakshman Withanawasam
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Integrated micro-electro-mechanical systems (MEMS) sensor device
Patent number
8,315,793
Issue date
Nov 20, 2012
Honeywell International Inc.
Lakshman Withanawasam
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Method of fabricating a vertically mountable IC package
Patent number
7,494,920
Issue date
Feb 24, 2009
Honeywell International Inc.
Daniel McCarthy
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
High resolution and low power magnetometer using magnetoresistive s...
Patent number
7,271,587
Issue date
Sep 18, 2007
Honeywell International Inc.
Lakshman S. Withanawasam
G01 - MEASURING TESTING
Information
Patent Grant
360-Degree magnetoresistive rotary position sensor
Patent number
7,208,940
Issue date
Apr 24, 2007
Honeywell International Inc.
Lakshman S. Withanawasam
G01 - MEASURING TESTING
Information
Patent Grant
Method and system for electronic compass calibration and verification
Patent number
7,154,267
Issue date
Dec 26, 2006
Honeywell International, Inc.
Lakshman S. Withanawasam
G01 - MEASURING TESTING
Information
Patent Grant
System and method for fixing a direction of magnetization of pinned...
Patent number
7,064,937
Issue date
Jun 20, 2006
Honeywell International Inc.
Hong Wan
G11 - INFORMATION STORAGE
Information
Patent Grant
Magnetic field sensor
Patent number
7,016,163
Issue date
Mar 21, 2006
Honeywell International Inc.
Hong Wan
G11 - INFORMATION STORAGE
Information
Patent Grant
Method and system for acquiring calibration data for an electronic...
Patent number
6,877,237
Issue date
Apr 12, 2005
Honeywell International Inc.
Lakshman S. Withanawasam
G01 - MEASURING TESTING
Information
Patent Grant
System and method for using magneto-resistive sensors as dual purpo...
Patent number
6,667,682
Issue date
Dec 23, 2003
Honeywell International Inc.
Hong Wan
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ANISOTROPIC MAGNETO-RESISTANCE (AMR) GRADIOMETER/MAGNETOMETER TO RE...
Publication number
20130334311
Publication date
Dec 19, 2013
Honeywell International Inc.
Bharat B. Pant
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR DETERMINING IN-PLANE MAGNETIC FIELD COMPON...
Publication number
20130116943
Publication date
May 9, 2013
Honeywell International Inc.
Bharat B. Pant
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR THREE DIMENSIONAL SENSORS
Publication number
20120313193
Publication date
Dec 13, 2012
Honeywell International Inc.
Ryan W. Rieger
G01 - MEASURING TESTING
Information
Patent Application
THREE-AXIS MAGNETIC SENSORS
Publication number
20120299587
Publication date
Nov 29, 2012
Honeywell International Inc.
Ryan W. Rieger
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR THREE-AXIS SENSOR CHIP PACKAGES
Publication number
20120279077
Publication date
Nov 8, 2012
Honeywell International Inc.
Lakshman Withanawasam
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
INTEGRATED MICRO-ELECTRO-MECHANICAL SYSTEMS (MEMS) SENSOR DEVICE
Publication number
20100312468
Publication date
Dec 9, 2010
Honeywell International Inc.
Lakshman Withanawasam
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
INTEGRATED TILT COMPENSATED COMPASS IN A SINGLE PACKAGE
Publication number
20090093981
Publication date
Apr 9, 2009
Honeywell International Inc.
Lakshman Withanawasam
G01 - MEASURING TESTING
Information
Patent Application
Method of fabricating a vertically mountable IC package
Publication number
20070090529
Publication date
Apr 26, 2007
Honeywell International Inc.
Daniel J. McCarthy
Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information
Patent Application
Method and system for electronic compass calibration and verification
Publication number
20060152217
Publication date
Jul 13, 2006
Honeywell International Inc.
Lakshman S. Withanawasam
G01 - MEASURING TESTING
Information
Patent Application
High resolution and low power magnetometer using magnetoresistive s...
Publication number
20060132125
Publication date
Jun 22, 2006
Honeywell International Inc.
Lakshman S. Withanawasam
G01 - MEASURING TESTING
Information
Patent Application
System and method for fixing a direction of magnetization of pinned...
Publication number
20060039090
Publication date
Feb 23, 2006
Honeywell International Inc.
Hong Wan
G01 - MEASURING TESTING
Information
Patent Application
System and method for fixing a direction of magnetization of pinned...
Publication number
20060039091
Publication date
Feb 23, 2006
Honeywell International Inc.
Hong Wan
G01 - MEASURING TESTING
Information
Patent Application
Magnetic field sensor
Publication number
20040165319
Publication date
Aug 26, 2004
Honeywell International Inc.
Hong Wan
G01 - MEASURING TESTING
Information
Patent Application
360-Degree magnetoresistive rotary position sensor
Publication number
20040095131
Publication date
May 20, 2004
Honeywell International Inc.
Lakshman S. Withanawasam
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR USING MAGNETO-RESISTIVE SENSORS AS DUAL PURPO...
Publication number
20030117254
Publication date
Jun 26, 2003
Hong Wan
G01 - MEASURING TESTING